关注
He Niu
He Niu
General Motors Company
在 wisc.edu 的电子邮件经过验证
标题
引用次数
引用次数
年份
Evaluating different implementations of online junction temperature sensing for switching power semiconductors
H Niu, RD Lorenz
IEEE Transactions on Industry Applications 53 (1), 391-401, 2016
792016
Sensing power MOSFET junction temperature using gate drive turn-on current transient properties
H Niu, RD Lorenz
IEEE Transactions on Industry Applications 52 (2), 1677-1687, 2015
762015
Real-time junction temperature sensing for silicon carbide MOSFET with different gate drive topologies and different operating conditions
H Niu, RD Lorenz
IEEE Transactions on Power Electronics 33 (4), 3424-3440, 2017
612017
A review of power cycle driven fatigue, aging, and failure modes for semiconductor power modules
H Niu
2017 IEEE International Electric Machines and Drives Conference (IEMDC), 1-8, 2017
392017
Sensing Power MOSFET Junction Temperature Using Circuit Output Current Ringing Decay
H Niu, RD Lorenz
Energy Conversion Congress and Exposition (ECCE), 2013 IEEE, 4270 - 4277, 2013
372013
Sensing IGBT junction temperature using gate drive output transient properties
H Niu, RD Lorenz
2015 IEEE Applied Power Electronics Conference and Exposition (APEC), 2492-2499, 2015
362015
The effect of gate drive topology on online silicon carbide MOSFET junction temperature sensing
H Niu, RD Lorenz
2015 IEEE Energy Conversion Congress and Exposition (ECCE), 7015-7022, 2015
232015
The effect of load properties on the reliability of machine drives—The temperature and stress analysis of power module bond wires
H Niu
2017 IEEE Energy Conversion Congress and Exposition (ECCE), 2533-2539, 2017
222017
Sensing Gallium Nitride HEMT junction temperature using gate drive output transient properties
H Niu, RD Lorenz
2016 IEEE Applied Power Electronics Conference and Exposition (APEC), 2055-2062, 2016
182016
A Comparative Study of Over‐Current Sensing for Traction Inverters
H Niu
Active and Passive Electronic Components 2021 (1), 6678234, 2021
12021
LMI 方法在大时滞网络拥塞控制器中的应用
牛訸, 侯辉
电子技术应用, 111-113, 2010
2010
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