| TSV open defects in 3D integrated circuits: Characterization, test, and optimal spare allocation F Ye, K Chakrabarty Proceedings of the 49th Annual Design Automation Conference, 1024-1030, 2012 | 131 | 2012 |
| Board-level functional fault diagnosis using artificial neural networks, support-vector machines, and weighted-majority voting F Ye, Z Zhang, K Chakrabarty, X Gu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013 | 115 | 2013 |
| TSV defects and TSV-induced circuit failures: The third dimension in test and design-for-test K Chakrabarty, S Deutsch, H Thapliyal, F Ye 2012 IEEE International Reliability Physics Symposium (IRPS), 5F. 1.1-5F. 1.12, 2012 | 84 | 2012 |
| Board-level functional fault diagnosis using multikernel support vector machines and incremental learning F Ye, Z Zhang, K Chakrabarty, X Gu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014 | 78 | 2014 |
| On effective and efficient in-field TSV repair for stacked 3D ICs L Jiang, F Ye, Q Xu, K Chakrabarty, B Eklow Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013 | 53 | 2013 |
| Representative critical-path selection for aging-induced delay monitoring F Firouzi, F Ye, K Chakrabarty, MB Tahoori 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 49 | 2013 |
| Efficient board-level functional fault diagnosis with missing syndromes S Jin, F Ye, Z Zhang, K Chakrabarty, X Gu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 42 | 2015 |
| Aging-and variation-aware delay monitoring using representative critical path selection F Firouzi, F Ye, K Chakrabarty, MB Tahoori ACM Transactions on Design Automation of Electronic Systems (TODAES) 20 (3 …, 2015 | 39 | 2015 |
| LED 灯在植物补光领域的效用探究 曲溪， 叶方铭， 宋杰琼， 顾玲玲， 方圆， 陈涛， 陈大华 灯与照明 32 (2), 41-45, 2008 | 39 | 2008 |
| Adaptive board-level functional fault diagnosis using decision trees F Ye, Z Zhang, K Chakrabarty, X Gu 2012 IEEE 21st Asian Test Symposium, 202-207, 2012 | 34 | 2012 |
| On-chip droop-induced circuit delay prediction based on support-vector machines F Ye, F Firouzi, Y Yang, K Chakrabarty, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 29 | 2015 |
| On-chip voltage-droop prediction using support-vector machines F Ye, F Firouzi, Y Yang, K Chakrabarty, MB Tahoori 2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014 | 27 | 2014 |
| Board-level functional fault identification using streaming data M Liu, F Ye, X Li, K Chakrabarty, X Gu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020 | 24 | 2020 |
| Adaptive board-level functional fault diagnosis using incremental decision trees F Ye, Z Zhang, K Chakrabarty, X Gu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 24 | 2015 |
| Fine-grained adaptive testing based on quality prediction M Liu, R Pan, F Ye, X Li, K Chakrabarty, X Gu ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (5 …, 2020 | 22 | 2020 |
| Test and design-for-testability solutions for 3D integrated circuits K Chakrabarty, M Agrawal, S Deutsch, B Noia, R Wang, F Ye IPSJ Transactions on System and LSI Design Methodology 7, 56-73, 2014 | 22 | 2014 |
| Knowledge discovery and knowledge transfer in board-level functional fault diagnosis F Ye, Z Zhang, K Chakrabarty, X Gu 2014 International Test Conference, 1-10, 2014 | 21 | 2014 |
| Machine learning for IoT F Firouzi, B Farahani, F Ye, M Barzegari Intelligent Internet of Things: From Device to Fog and Cloud, 243-313, 2020 | 20 | 2020 |
| Re-using BIST for circuit aging monitoring F Firouzi, F Ye, A Vijayan, A Koneru, K Chakrabarty, MB Tahoori 2015 20th IEEE European Test Symposium (ETS), 1-2, 2015 | 16 | 2015 |
| Board-level functional fault diagnosis using learning based on incremental support-vector machines F Ye, Z Zhang, K Chakrabarty, X Gu 2012 IEEE 21st Asian Test Symposium, 208-213, 2012 | 14 | 2012 |
Krishnendu ChakrabartyFulton Professor of Microelectronics, School of Electrical and Computer and Energy Engineering在 asu.edu 的电子邮件经过验证
