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Didier Chaussende
Didier Chaussende
Univ Grenoble Alpes / CNRS / SIMaP
在 grenoble-inp.fr 的电子邮件经过验证
标题
引用次数
引用次数
年份
Revealing the electronic band structure of trilayer graphene on SiC: An angle-resolved photoemission study
C Coletti, S Forti, A Principi, KV Emtsev, AA Zakharov, KM Daniels, ...
Physical Review B—Condensed Matter and Materials Physics 88 (15), 155439, 2013
1222013
Characterization and modelling of the ion-irradiation induced disorder in 6H-SiC and 3C-SiC single crystals
A Debelle, L Thomé, D Dompoint, A Boulle, F Garrido, J Jagielski, ...
Journal of Physics D: Applied Physics 43 (45), 455408, 2010
1022010
Combined experimental and computational study of the recrystallization process induced by electronic interactions of swift heavy ions with silicon carbide crystals
A Debelle, M Backman, L Thome, WJ Weber, M Toulemonde, S Mylonas, ...
Physical Review B—Condensed Matter and Materials Physics 86 (10), 100102, 2012
1012012
Large area quasi-free standing monolayer graphene on 3C-SiC (111)
C Coletti, KV Emtsev, AA Zakharov, T Ouisse, D Chaussende, U Starke
Applied Physics Letters 99 (8), 2011
892011
Coupled heat transfer and fluid dynamics modeling of high-temperature SiC solution growth
F Mercier, JM Dedulle, D Chaussende, M Pons
Journal of Crystal Growth 312 (2), 155-163, 2010
712010
A comprehensive study of SiC growth processes in a VPE reactor
T Chassagne, G Ferro, D Chaussende, F Cauwet, Y Monteil, J Bouix
Thin Solid Films 402 (1-2), 83-89, 2002
672002
High temperature solution growth and characterization of Cr2AlC single crystals
T Ouisse, E Sarigiannidou, O Chaix-Pluchery, H Roussel, B Doisneau, ...
Journal of crystal growth 384, 88-95, 2013
602013
Control of the Supersaturation in the CF− PVT Process for the Growth of Silicon Carbide Crystals: Research and Applications
D Chaussende, M Ucar, L Auvray, F Baillet, M Pons, R Madar
Crystal Growth & Design 5 (4), 1539-1544, 2005
572005
Prospects for 3C-SiC bulk crystal growth
D Chaussende, F Mercier, A Boulle, F Conchon, M Soueidan, G Ferro, ...
Journal of Crystal Growth 310 (5), 976-981, 2008
562008
Status of SiC bulk growth processes
D Chaussende, PJ Wellmann, M Pons
Journal of Physics D: Applied Physics 40 (20), 6150, 2007
552007
Raman scattering from Ti3SiC2 single crystals
F Mercier, O Chaix-Pluchery, T Ouisse, D Chaussende
Applied Physics Letters 98 (8), 2011
532011
Birefringence microscopy of unit dislocations in diamond
LTM Hoa, T Ouisse, D Chaussende, M Naamoun, A Tallaire, J Achard
Crystal growth & design 14 (11), 5761-5766, 2014
492014
Continuous feed physical vapor transport: toward high purity and long boule growth of SiC
D Chaussende, F Baillet, L Charpentier, E Pernot, M Pons, R Madar
Journal of The Electrochemical Society 150 (10), G653, 2003
492003
Synthesis of single crystals of V2AlC phase by high-temperature solution growth and slow cooling technique
L Shi, T Ouisse, E Sarigiannidou, O Chaix-Pluchery, H Roussel, ...
Acta Materialia 83, 304-309, 2015
452015
Thermodynamic and experimental investigations on the growth of thick aluminum nitride layers by high temperature CVD
A Claudel, E Blanquet, D Chaussende, M Audier, D Pique, M Pons
Journal of Crystal Growth 311 (13), 3371-3379, 2009
442009
Characterization of a 3C-SiC Single Domain Grown on 6H-SiC (0001) by a Vapor− Liquid− Solid Mechanism
M Soueidan, G Ferro, B Nsouli, M Roumie, E Polychroniadis, M Kazan, ...
Crystal growth & design 6 (11), 2598-2602, 2006
422006
Magnetotransport properties of nearly-free electrons in two-dimensional hexagonal metals and application to the phases
T Ouisse, L Shi, BA Piot, B Hackens, V Mauchamp, D Chaussende
Physical Review B 92 (4), 045133, 2015
402015
X-ray diffuse scattering from stacking faults in thick 3C-SiC single crystals
A Boulle, D Chaussende, L Latu-Romain, F Conchon, O Masson, ...
Applied Physics Letters 89 (9), 2006
372006
Modeling of the growth rate during top seeded solution growth of SiC using pure silicon as a solvent
J Lefebure, JM Dedulle, T Ouisse, D Chaussende
Crystal growth & design 12 (2), 909-913, 2012
352012
Large Area DPB free (111) β-SiC thick layer grown on (0001) α-SiC nominal surfaces by the CF-PVT method
D Chaussende, L Latu-Romain, L Auvray, M Ucar, M Pons, R Madar
Materials Science Forum 483, 225-228, 2005
352005
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