| Experiences with a two-terminal-pair digital impedance bridge L Callegaro, V D’Elia, M Kampik, DB Kim, M Ortolano, F Pourdanesh IEEE Transactions on Instrumentation and Measurement 64 (6), 1460-1465, 2015 | 62 | 2015 |
| Mapping the conductivity of graphene with Electrical Resistance Tomography A Cultrera, D Serazio, A Zurutuza, A Centeno, O Txoperena, D Etayo, ... Scientific reports 9 (1), 10655, 2019 | 46 | 2019 |
| Atypical quantized resistances in millimeter-scale epitaxial graphene pn junctions AF Rigosi, D Patel, M Marzano, M Kruskopf, HM Hill, H Jin, J Hu, ... Carbon 154, 230-237, 2019 | 41 | 2019 |
| An international comparison of phase angle standards between the novel impedance bridges of CMI, INRIM and METAS M Ortolano, L Palafox, J Kučera, L Callegaro, V D’Elia, M Marzano, ... Metrologia 55 (4), 499, 2018 | 34 | 2018 |
| On the synthesis of quantum Hall array resistance standards M Ortolano, M Abrate, L Callegaro Metrologia 52 (1), 31, 2014 | 32 | 2014 |
| A precise two-channel digitally synthesized AC voltage source for impedance metrology J Nissilä, K Ojasalo, M Kampik, J Kaasalainen, V Maisi, M Casserly, ... 29th Conference on Precision Electromagnetic Measurements (CPEM 2014), 768-769, 2014 | 23 | 2014 |
| Noise characterization of analog to digital converters for amplitude and phase noise measurements AC Cárdenas-Olaya, E Rubiola, JM Friedt, PY Bourgeois, M Ortolano, ... Review of Scientific Instruments 88 (6), 2017 | 20 | 2017 |
| A comprehensive analysis of error sources in electronic fully digital impedance bridges M Ortolano, M Marzano, V D’Elia, NTM Tran, R Rybski, J Kaczmarek, ... IEEE Transactions on Instrumentation and Measurement 70, 1-14, 2020 | 17 | 2020 |
| Circuit models and SPICE macro-models for quantum Hall effect devices M Ortolano, L Callegaro Measurement Science and Technology 26 (8), 085018, 2015 | 17 | 2015 |
| Metrological characterization of consumer-grade equipment for wearable brain–computer interfaces and extended reality P Arpaia, L Callegaro, A Cultrera, A Esposito, M Ortolano IEEE Transactions on Instrumentation and Measurement 71, 1-9, 2021 | 16 | 2021 |
| Metrological characterization of a low-cost electroencephalograph for wearable neural interfaces in industry 4.0 applications P Arpaia, L Callegaro, A Cultrera, A Esposito, M Ortolano 2021 IEEE International Workshop on Metrology for Industry 4.0 & IoT …, 2021 | 15 | 2021 |
| A correlation noise spectrometer for flicker noise measurement in graphene samples M Marzano, A Cultrera, M Ortolano, L Callegaro Measurement Science and Technology 30 (3), 035102, 2019 | 15 | 2019 |
| A capacitance build-up method to determine LCR meter errors and capacitance transfer NTM Tran, V D’Elia, L Callegaro, M Ortolano IEEE Transactions on Instrumentation and Measurement 69 (8), 5727-5735, 2019 | 12 | 2019 |
| Error modelling of quantum Hall array resistance standards M Marzano, T Oe, M Ortolano, L Callegaro, NH Kaneko Metrologia 55 (2), 167, 2018 | 12 | 2018 |
| Digital electronics based on red pitaya platform for coherent fiber links ACC Olaya, S Micalizio, M Ortolano, CE Calosso, E Rubiola, JM Friedt 2016 European Frequency and Time Forum (EFTF), 1-4, 2016 | 12 | 2016 |
| A three-arm current comparator bridge for impedance comparisons over the complex plane L Callegaro, V D’Elia, M Ortolano, F Pourdanesh IEEE Transactions on Instrumentation and Measurement 64 (6), 1466-1471, 2015 | 12 | 2015 |
| Matrix method analysis of quantum Hall effect device connections M Ortolano, L Callegaro Metrologia 49 (1), 1, 2011 | 12 | 2011 |
| A fully digital bridge towards the realization of the farad from the quantum Hall effect M Marzano, M Ortolano, V D’Elia, A Müller, L Callegaro Metrologia 58 (1), 015002, 2020 | 11 | 2020 |
| Systematic errors in the correlation method for Johnson noise thermometry: residual correlations due to amplifiers L Callegaro, M Pisani, M Ortolano Metrologia 47 (3), 272, 2010 | 11 | 2010 |
| Realization and metrological characterization of a compact high-resolution pendulum tiltmeter M Berutto, M Ortolano, F Periale, A De Marchi IEEE Sensors Journal 5 (1), 26-31, 2005 | 11 | 2005 |
Luca CallegaroINRIM - Istituto Nazionale di Ricerca Metrologica在 inrim.it 的电子邮件经过验证
