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Yifu Huang
Yifu Huang
Senior Engineer at Analog Devices Inc. | Ph.D at The University of Texas at Austin
在 analog.com 的电子邮件经过验证
标题
引用次数
引用次数
年份
Transparent arrays of bilayer-nanomesh microelectrodes for simultaneous electrophysiology and two-photon imaging in the brain
Y Qiang, P Artoni, KJ Seo, S Culaclii, V Hogan, X Zhao, Y Zhong, X Han, ...
Science advances 4 (9), eaat0626, 2018
1422018
Template-free construction of tin oxide porous hollow microspheres for room-temperature gas sensors
L Zhou, Z Hu, HY Li, J Liu, Y Zeng, J Wang, Y Huang, L Miao, G Zhang, ...
ACS Applied Materials & Interfaces 13 (21), 25111-25120, 2021
402021
Electron irradiation-induced defects for reliability improvement in monolayer MoS2-based conductive-point memory devices
X Wu, Y Gu, R Ge, MI Serna, Y Huang, JC Lee, D Akinwande
npj 2D Materials and Applications 6 (1), 31, 2022
292022
Sulfurization Engineering of One‐Step Low‐Temperature MoS2 and WS2 Thin Films for Memristor Device Applications
Y Gu, MI Serna, S Mohan, A Londoño‐Calderon, T Ahmed, Y Huang, ...
Advanced Electronic Materials, 2100515, 2021
242021
Reliability Improvement and Effective Switching Layer Model of Thin‐Film MoS2 Memristors
Y Huang, Y Gu, S Mohan, A Dolocan, ND Ignacio, S Kutagulla, ...
Advanced Functional Materials 34 (15), 2214250, 2024
212024
ReSe2-Based RRAM and Circuit-Level Model for Neuromorphic Computing
Y Huang, Y Gu, X Wu, R Ge, YF Chang, X Wang, J Zhang, D Akinwande, ...
Frontiers in Nanotechnology 3, 782836, 2021
132021
Resistance state evolution under constant electric stress on a MoS 2 non-volatile resistive switching device
X Wu, R Ge, Y Huang, D Akinwande, JC Lee
RSC advances 10 (69), 42249-42255, 2020
112020
Embedded emerging memory technologies for neuromorphic computing: Temperature instability and reliability
YF Chang, I Karpov, R Hopkins, D Janosky, J Medeiros, B Sherrill, ...
2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021
72021
“Cut-and-paste” method for the rapid prototyping of soft electronics
XX Yang, YF Huang, ZH Dai, J Barber, PL Wang, NS Lu
Science China Technological Sciences 62, 199-208, 2019
62019
Effect of temperature on analog memristor in neuromorphic computing
Y Huang, R Hopkins, D Janosky, YC Chen, YF Chang, JC Lee
IEEE Transactions on Electron Devices 69 (11), 6102-6105, 2022
42022
On the stochastic nature of conductive points formation and their effects on reliability of MoS2 RRAM: Experimental characterization and Monte Carlo simulation
Y Huang, X Wu, Y Gu, R Ge, D Akinwande, JC Lee
Microelectronics Reliability 126, 114274, 2021
42021
Understanding the resistive switching mechanism of 2-D RRAM: Monte Carlo modeling and a proposed application for reliability research
Y Huang, Y Gu, YF Chang, YC Chen, D Akinwande, JC Lee
IEEE Transactions on Electron Devices 70 (4), 1676-1681, 2023
32023
Nano Helical-Shaped Dual-Functional Resistive Memory for Low-Power Crossbar Array Application
YC Chen, S Sarkar, JG Gibbs, Y Huang, JC Lee, CC Lin, CH Lin
ACS Applied Engineering Materials 1 (1), 252-257, 2022
22022
Direct-Grown Helical-Shaped Tungsten-Oxide-Based Devices with Reconfigurable Selectivity for Memory Applications
YC Chen, Y Huang, S Sarkar, J Gibbs, J Lee
Journal of Low Power Electronics and Applications 12 (4), 55, 2022
12022
2D RRAM and Verilog-A model for Neuromorphic Computing
Y Huang, X Wu, Y Gu, R Ge, J Zhang, YF Chang, D Akinwande, JC Lee
2021 IEEE 16th Nanotechnology Materials and Devices Conference (NMDC), 1-4, 2021
12021
Programmable Retention Characteristics in MoS2-Based Atomristors for Neuromorphic and Reservoir Computing Systems
Y Lee, Y Huang, YF Chang, SJ Yang, ND Ignacio, S Kutagulla, S Mohan, ...
ACS nano, 2024
2024
Enhancing simulation feasibility for multi-layer 2D MoS 2 RRAM devices: reliability performance learnings from a passive network model
S Lee, Y Huang, YF Chang, S Baik, JC Lee, M Koo
Physical Chemistry Chemical Physics 26 (31), 20962-20970, 2024
2024
Self-Selective Dielectric-Fuse Effect with Ambient Factors in Oxide-Based Memory
YC Chen, Y Huang, JC Lee, JB Stouffer
ECS Journal of Solid State Science and Technology 12 (6), 065003, 2023
2023
2D memristor reliability and modeling for neuromorphic computing
Y Huang
2023
Understanding of the Interaction between Electrical and Thermal Properties on Bifunctional Memristors and Reprogrammable Memory
J Stouffer, YC Chen, YF Chang, Y Huang
APS March Meeting Abstracts 2023, Q34. 003, 2023
2023
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