| Three-dimensional-object recognition by use of single-exposure on-axis digital holography B Javidi, D Kim Optics letters 30 (3), 236-238, 2005 | 125 | 2005 |
| Single-shot, dual-wavelength digital holography based on polarizing separation DG Abdelsalam, R Magnusson, D Kim Applied Optics 50 (19), 3360-3368, 2011 | 122 | 2011 |
| Measurement of the thickness profile of a transparent thin film deposited upon a pattern structure with an acousto-optic tunable filter D Kim, S Kim, HJ Kong, Y Lee Optics letters 27 (21), 1893-1895, 2002 | 111 | 2002 |
| Two-wavelength in-line phase-shifting interferometry based on polarizing separation for accurate surface profiling DG Abdelsalam, D Kim Applied optics 50 (33), 6153-6161, 2011 | 73 | 2011 |
| Radius of curvature measurement of spherical smooth surfaces by multiple-beam interferometry in reflection DG Abdelsalam, MS Shaalan, MM Eloker, D Kim Optics and Lasers in Engineering 48 (6), 643-649, 2010 | 53 | 2010 |
| Distortion-tolerant 3-D object recognition by using single exposure on-axis digital holography D Kim, B Javidi Optics Express 12 (22), 5539-5548, 2004 | 50 | 2004 |
| Direct spectral phase function calculation for dispersive interferometric thickness profilometry D Kim, S Kim Optics express 12 (21), 5117-5124, 2004 | 35 | 2004 |
| Real-time dual-wavelength digital holographic microscopy based on polarizing separation DG Abdelsalam, D Kim Optics Communications 285 (3), 233-237, 2012 | 34 | 2012 |
| Coherent noise suppression in digital holography based on flat fielding with apodized apertures DG Abdelsalam, D Kim Optics Express 19 (19), 17951-17959, 2011 | 32 | 2011 |
| Robust snapshot interferometric spectropolarimetry D Kim, Y Seo, Y Yoon, V Dembele, JW Yoon, KJ Lee, R Magnusson Optics Letters 41 (10), 2318-2321, 2016 | 28 | 2016 |
| Complex object wave direct extraction method in off-axis digital holography D Kim, R Magnusson, M Jin, J Lee, W Chegal Optics Express 21 (3), 3658-3668, 2013 | 28 | 2013 |
| High speed volumetric thickness profile measurement based on full-field wavelength scanning interferometer JW You, S Kim, D Kim Optics Express 16 (25), 21022-21031, 2008 | 27 | 2008 |
| Efficient double-filtering with a single acoustooptic tunable filter JW You, J Ahn, S Kim, D Kim Optics express 16 (26), 21505-21511, 2008 | 26 | 2008 |
| Surface form measurement using single shot off-axis Fizeau interferometry DG Abdelsalam, BJ Baek, YJ Cho, DS Kim Journal of the Optical Society of Korea 14 (4), 409-414, 2010 | 24 | 2010 |
| White light on-axis digital holographic microscopy based on spectral phase shifting D Kim, JW You, S Kim Optics express 14 (1), 229-234, 2006 | 23 | 2006 |
| 3-D surface profile measurement using an acousto-optic tunable filter based spectral phase shifting technique DS Kim, YJ Cho Journal of the Optical Society of Korea 12 (4), 281-287, 2008 | 22 | 2008 |
| Fast thickness profile measurement using a peak detection method based on an acousto-optic tunable filter D Kim, S Kim, HJ Kong, Y Lee, YK Kwak Measurement Science and Technology 13 (7), L1, 2002 | 21 | 2002 |
| One-piece polarizing interferometer for ultrafast spectroscopic polarimetry D Kim, V Dembele Scientific Reports 9 (1), 5978, 2019 | 20 | 2019 |
| Dynamic spectroscopic ellipsometry based on a one-piece polarizing interferometric scheme V Dembele, S Choi, W Chegal, I Choi, MJ Paul, J Kim, D Kim Optics Communications 454, 124426, 2020 | 18 | 2020 |
| Interferometric snapshot spectro-ellipsometry V Dembele, M Jin, I Choi, W Chegal, D Kim Optics Express 26 (2), 1333-1341, 2018 | 18 | 2018 |
Dahi Ghareab Abdelsalam IbrahimNational Institute of Standards, Egypt在 osumc.edu 的电子邮件经过验证
