| An in depth analysis of pull-up capacitance-voltage characteristic for dielectric charging assessment of MEMS capacitive switches M Koutsoureli, D Birmpiliotis, L Michalas, G Papaioannou Microelectronics Reliability 64, 688-692, 2016 | 17 | 2016 |
| On the discharge transport mechanisms through the dielectric film in MEMS capacitive switches D Birmpiliotis, G Stavrinidis, M Koutsoureli, G Konstantinidis, ... Journal of Microelectromechanical Systems 29 (2), 202-213, 2020 | 12 | 2020 |
| Electrical properties of SiNx films with embedded CNTs for MEMS capacitive switches M Koutsoureli, G Stavrinidis, D Birmpiliotis, G Konstantinidis, ... Microelectronics Reliability 76, 614-618, 2017 | 8 | 2017 |
| A study of material stoichiometry on charging properties of SiNx films for potential application in RF MEMS capacitive switches M Koutsoureli, D Birmpiliotis, G Papaioannou Microelectronics Reliability 114, 113759, 2020 | 7 | 2020 |
| Thermally activated discharging mechanisms in SiNx films with embedded CNTs for RF MEMS capacitive switches M Koutsoureli, G Stavrinidis, D Birmpiliotis, G Konstantinidis, ... Microelectronic Engineering 223, 111230, 2020 | 7 | 2020 |
| Assessment of dielectric charging in capacitive MEMS switches fabricated on Si substrate with thin oxide film D Birmpiliotis, P Czarnecki, M Koutsoureli, G Papaioannou, I De Wolf Microelectronic Engineering 159, 209-214, 2016 | 6 | 2016 |
| A study of hopping transport during discharging in SiNx films for MEMS capacitive switches D Birmpiliotis, M Koutsoureli, G Stavrinidis, G Konstantinidis, ... Microelectronics Reliability 114, 113878, 2020 | 5 | 2020 |
| Charging mechanisms in Y2O3 dielectric films for MEMS capacitive switches D Birmpiliotis, M Koutsoureli, J Kohylas, G Papaioannou, A Ziaei Microelectronics Reliability 88, 840-845, 2018 | 5 | 2018 |
| A comparative study of nanostructured Silicon-Nitride electrical properties for potential application in RF-MEMS capacitive switches D Birmpiliotis, G Stavrinidis, M Koutsoureli, G Konstantinidis, ... Microelectronics Reliability 100, 113360, 2019 | 4 | 2019 |
| A novel method for the assessment of surface charge density variance in capacitive RF-MEMS switches D Birmpiliotis, M Koutsoureli, G Papaioannou Microelectronics Reliability 126, 114294, 2021 | 3 | 2021 |
| Temperature accelerated discharging process in SiNx films with embedded CNTs for applications in MEMS switches D Birmpiliotis, G Stavrinidis, G Konstantinidis, G Papaioannou 2018 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS …, 2018 | 2 | 2018 |
| A study of field emission current in MEMS capacitors with bottom electrode covered by dielectric film J Theocharis, D Birmpiliotis, S Gardelis, G Papaioannou Microelectronics Reliability 150, 115192, 2023 | 1 | 2023 |
| The Impact of Ambient Humidity on the Surface Conductance of SiNx Films for Application in Capacitive MEMS Switches D Birmpiliotis, G Papaioannou International Symposium for Testing and Failure Analysis 84437, 337-342, 2022 | 1 | 2022 |
| Dielectric charging in MEMS capacitive switches a persisting reliability issue, available models and assessment methods M Koutsoureli, D Birbiliotis, L Michalas, G Papaioannou 2016 16th Mediterranean Microwave Symposium (MMS), 1-4, 2016 | 1 | 2016 |
| Mitigation of Dielectric Charging in MEMS Capacitive Switches with Stacked TiO2/Y2O3 Insulator Film D Birmpiliotis, M Koutsoureli, L Buhagier, G Papaioannou, A Ziaei International Symposium for Testing and Failure Analysis 81009, 324-329, 2018 | | 2018 |
| Analysis of dielectric charging assessment through up-state capacitance-voltage characteristic in MEMS capacitive switches M KOUTSOURELI, D BIRMPILIOTIS, L MICHALAS, G PAPAIOANNOU NOVEL TECHNOLOGIES FOR MICROWAVE AND MILLIMETER WAVE DEVICES AND CIRCUITS, 42, 0 | | |
