Modification of Al/Si interface and Schottky barrier height with chemical treatment ZJ Horváth, M Ádám, I Szabó, M Serényi, V Van Tuyen Applied surface science 190 (1-4), 441-444, 2002 | 72 | 2002 |
Refractive index of sputtered silicon oxynitride layers for antireflection coating M Serényi, M Rácz, T Lohner Vacuum 61 (2-4), 245-249, 2001 | 59 | 2001 |
Bandwidth-limited picosecond pulse generation in an actively mode-locked GaAs laser with intracavity chirp compensation J Kuhl, M Serényi, EO Göbel Optics letters 12 (5), 334-336, 1987 | 54 | 1987 |
Intracavity photoacoustic gas detection with an external cavity diode laser Z Bozóki, J Sneider, G Szabó, A Miklós, M Serényi, G Nagy, M Fehér Applied Physics B 63, 399-401, 1996 | 41 | 1996 |
Characterization of sputtered and annealed niobium oxide films using spectroscopic ellipsometry, Rutherford backscattering spectrometry and X-ray diffraction M Serényi, T Lohner, P Petrik, Z Zolnai, ZE Horváth, NQ Khánh Thin Solid Films 516 (22), 8096-8100, 2008 | 40 | 2008 |
Comparative analysis of amorphous silicon and silicon nitride multilayer by spectroscopic ellipsometry and transmission electron microscopy M Serényi, T Lohner, P Petrik, C Frigeri Thin Solid Films 515 (7-8), 3559-3562, 2007 | 34 | 2007 |
Directly controlled deposition of antireflection coatings for semiconductor lasers M Serenyi, HU Habermeier Applied optics 26 (5), 845-849, 1987 | 34 | 1987 |
Pulse shortening of actively mode‐locked diode lasers by wavelength tuning M Serenyi, J Kuhl, EO Göbel Applied physics letters 50 (18), 1213-1215, 1987 | 28 | 1987 |
Comparison in formation, optical properties and applicability of DC magnetron and RF sputtered aluminum oxide films M Serényi, T Lohner, G Sáfrán, J Szívós Vacuum 128, 213-218, 2016 | 19 | 2016 |
Electron irradiation induced amorphous SiO2 formation at metal oxide/Si interface at room temperature; electron beam writing on interfaces S Gurbán, P Petrik, M Serényi, A Sulyok, M Menyhárd, E Baradács, ... Scientific Reports 8 (1), 2124, 2018 | 17 | 2018 |
Structural modifications induced in hydrogenated amorphous Si/Ge multilayers by heat treatments C Frigeri, M Serényi, A Csik, Z Erdélyi, DL Beke, L Nasi Journal of Materials Science: Materials in Electronics 19, 289-293, 2008 | 17 | 2008 |
Micro-combinatorial sampling of the optical properties of hydrogenated amorphous for the entire range of compositions towards a database for … B Kalas, Z Zolnai, G Sáfrán, M Serényi, E Agocs, T Lohner, A Nemeth, ... Scientific reports 10 (1), 19266, 2020 | 16 | 2020 |
AFM and TEM study of hydrogenated sputtered Si/Ge multilayers C Frigeri, L Nasi, M Serényi, A Csik, Z Erdélyi, DL Beke Superlattices and Microstructures 45 (4-5), 475-481, 2009 | 15 | 2009 |
Acceleration of cold Rb atoms by frequency modulated light pulses JS Bakos, GP Djotyan, PN Ignácz, MA Kedves, M Serényi, Z Sörlei, ... The European Physical Journal D 44, 141-149, 2007 | 14 | 2007 |
Effect of heat treatments on the properties of hydrogenated amorphous silicon for PV and PVT applications C Frigeri, M Serényi, Z Szekrényes, K Kamarás, A Csik, NQ Khánh Solar Energy 119, 225-232, 2015 | 13 | 2015 |
Interaction of frequency modulated light pulses with rubidium atoms in a magneto-optical trap JS Bakos, GP Djotyan, PN Ignácz, MÁ Kedves, M Serényi, Z Sörlei, ... The European Physical Journal D-Atomic, Molecular, Optical and Plasma …, 2006 | 13 | 2006 |
Characterization of sputtered aluminum oxide films using spectroscopic ellipsometry T Lohner, M Serényi, P Petrik International Journal of New Horizons in Physics 2 (1), 1-4, 2015 | 12 | 2015 |
On the formation of blisters in annealed hydrogenated a-Si layers M Serényi, C Frigeri, Z Szekrényes, K Kamarás, L Nasi, A Csik, NQ Khánh Nanoscale research letters 8, 1-7, 2013 | 11 | 2013 |
Refractive Index Variation of Magnetron-Sputtered a-Si1−xGex by “One-Sample Concept” Combinatory T Lohner, B Kalas, P Petrik, Z Zolnai, M Serényi, G Sáfrán Applied Sciences 8 (5), 826, 2018 | 10 | 2018 |
Relationship between structural changes, hydrogen content and annealing in stacks of ultrathin Si/Ge amorphous layers C Frigeri, M Serényi, NQ Khánh, A Csik, F Riesz, Z Erdélyi, L Nasi, ... Nanoscale research letters 6, 1-6, 2011 | 10 | 2011 |