| Random telegraph signal in CMOS image sensor pixels X Wang, PR Rao, A Mierop, AJP Theuwissen 2006 International Electron Devices Meeting, 1-4, 2006 | 146 | 2006 |
| A CMOS image sensor with a buried-channel source follower X Wang, MF Snoeij, PR Rao, A Mierop, AJP Theuwissen 2008 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2008 | 80 | 2008 |
| Degradation of CMOS image sensors in deep-submicron technology due to γ-irradiation PR Rao, X Wang, AJP Theuwissen Solid-State Electronics 52 (9), 1407-1413, 2008 | 59 | 2008 |
| Fixed-pattern noise induced by transmission gate in pinned 4T CMOS image sensor pixels X Wang, PR Rao, AJP Theuwissen 2006 European Solid-State Device Research Conference, 331-334, 2006 | 42 | 2006 |
| Backside illuminated hybrid FPA achieving low cross-talk combined with high QE K De Munck, PR Rao, K Minoglou, J De Vos, DS Tezcan, P De Moor IEEE Int. Image Sensor Workshop, 146-148, 2011 | 13 | 2011 |
| Degradation of spectral response and dark current of CMOS image sensors in deep-submicron technology due to γ-irradiation PR Rao, X Wang, AJP Theuwissen ESSDERC 2007-37th European Solid State Device Research Conference, 370-373, 2007 | 13 | 2007 |
| An integration time prediction based algorithm for wide dynamic range 3D-stacked image sensors A Xhakoni IISW, 2011, 130-133, 2011 | 11 | 2011 |
| Characterization of the buried channel n-MOST source followers in CMOS image sensors X Wang, PR Rao, AJP Theuwissen Proc. Int. Image Sens. Workshop, 6-10, 2007 | 9 | 2007 |
| Active pixel sensors: The sensor of choice for future space applications? J Leijtens, A Theuwissen, PR Rao, X Wang, N Xie Sensors, Systems, and Next-Generation Satellites XI 6744, 231-238, 2007 | 8 | 2007 |
| CCD structures implemented in standard 0.18 µm CMOS technology PR Rao, X Wang, AJP Theuwissen Electronics Letters 44 (8), 1, 2008 | 6 | 2008 |
| Backside illuminated CMOS image sensors for extreme ultraviolet applications PR Rao, C Laubis, S Nihtianov SENSORS, 2014 IEEE, 1660-1663, 2014 | 5 | 2014 |
| Monolithic and fully-hybrid backside illuminated CMOS imagers for smart sensing PR Rao, K Minoglou, K De Munck, DS Tezcan, C Van Hoof, P De Moor 2009 International Image Sensor Workshop, Session 2, 2009 | 5 | 2009 |
| Depth estimation in SPAD-based LIDAR sensors M Chen, PR Rao, E Venialgo Optics Express 32 (3), 3006-3030, 2024 | 4 | 2024 |
| Hybrid backside illuminated CMOS image sensors possessing low crosstalk PR Rao, K De Munck, K Minoglou, J De Vos, D Sabuncuoglu, P De Moor Sensors, systems, and next-generation satellites XV 8176, 345-356, 2011 | 4 | 2011 |
| Backside illuminated CMOS image sensors optimized by modeling and simulation K Minoglou, PR Rao, M Rahman, K De Munck, C Van Hoof, P De Moor Optical and quantum electronics 42, 691-698, 2011 | 4 | 2011 |
| On the processing aspects of high performance hybrid backside illuminated CMOS imagers J De Vos, K De Munck, K Minoglou, PR Rao, MA Erismis, P De Moor, ... Journal of Micromechanics and Microengineering 21 (7), 074006, 2011 | 4 | 2011 |
| Processing aspects to achieve high-end hybrid backside illuminated imagers J De Vos, K De Munck, MA Erismis, PR Rao, K Minoglou, W Zhang, ... International Symposium on Microelectronics 2010 (1), 000372-000377, 2010 | 2 | 2010 |
| Radiation Hardness of Deep-Submicron CMOS Technology Evaluated by Gated-Diode Measurements PR Rao, X Wang, AJP Theuwissen Sense of contact-2007, 2007 | 2 | 2007 |
| Influence of the surface oxide content of a boron capping layer on UV photodetector performance V Mohammadi, RWE Van de Kruijs, PR Rao, JM Sturm, S Nihtianov 2015 9th International Conference on Sensing Technology (ICST), 656-660, 2015 | 1 | 2015 |
| Hybrid backside illuminated CMOS imager for high-end Applications J De Vos, K De Munck, MA Erismis, K Minoglou, PR Rao, W Zhang, ... ECS Transactions 35 (30), 53, 2011 | 1 | 2011 |
Albert Theuwissen在 harvestimaging.com 的电子邮件经过验证
