| Arctan differentiated digital demodulator for FM/FSK digital receivers HM Eissa, K Sharaf, H Ragaie The 2002 45th Midwest Symposium on Circuits and Systems, 2002. MWSCAS-2002 …, 2002 | 19 | 2002 |
| Analog, digital and mixed-signal design flows HG Bakeer, O Shaheen, HM Eissa, M Dessouky 2007 2nd International Design and Test Workshop, 247-252, 2007 | 16 | 2007 |
| Parameter matching hotspot detection RF Salem, HMAEH Eissa, MAIM Selim US Patent 8,935,643, 2015 | 12 | 2015 |
| Parametric dfm solution for analog circuits: electrical-driven hotspot detection, analysis, and correction flow H Eissa, RF Salem, A Arafa, S Hany, A El-Mously, M Dessouky, D Nairn, ... IEEE transactions on very large scale integration (VLSI) systems 21 (5), 807-820, 2012 | 10 | 2012 |
| Electrical hotspot detection, analysis and correction RF Salem, HM Eissa, A Arafa, SH Mousa, A ElMously, WF Mohamed, ... US Patent 8,914,760, 2014 | 8 | 2014 |
| Physical aware design methodology for analog & mixed signal integrated circuits HM Eissa 2009 4th International Design and Test Workshop (IDT), 1-5, 2009 | 8 | 2009 |
| An automated design methodology for stress avoidance in analog & mixed signal designs R Sameer, AN Mohieldin, HM Eissa 2010 5th International Design and Test Workshop, 3-7, 2010 | 6 | 2010 |
| Layout stress and proximity aware analog design methodology A Zein, A Tarek, M Bahr, M Dessouky, H Eissa, A Ramadan, A Tosson 2012 19th IEEE International Conference on Electronics, Circuits, and …, 2012 | 3 | 2012 |
| A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow RF Salem, A Arafa, S Hany, A ElMously, H Eissa, M Dessouky, D Nairn, ... 2011 IEEE International SOC Conference, 231-236, 2011 | 3 | 2011 |
| Implementing a methodology for process variation awareness of design context and its impact on circuit analysis RF Salem, HM AbdelGhany, HM Eissa, MH Anis 2009 4th International Design and Test Workshop (IDT), 1-5, 2009 | 3 | 2009 |
| A DFM tool for analyzing lithography and stress effects on standard cells and critical path performance in 45nm digital designs RF Salem, AR ElMously, H Eissa, M Dessouky, MH Anis 2010 5th International Design and Test Workshop, 13-17, 2010 | 2 | 2010 |
| High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique RF Salem, M Al-Imam, A ElMously, H Eissa, A Arafa, MH Anis Thirteenth International Symposium on Quality Electronic Design (ISQED), 223-227, 2012 | | 2012 |
| An electrical-aware parametric DFM solution for analog circuits R Fathy, A Arafa, S Hany, A ElMously, H Eissa, M Dessouky, D Nairn, ... 2011 IEEE 6th International Design and Test Workshop (IDT), 68-73, 2011 | | 2011 |
| 1.2-mW Online Learning Mixed-Mode Intelligent Inference Engine for Low-Power Real-Time Object Recognition S Karmakar, JA Chandy, FC Jain, H Eissa, RF Salem, A Arafa, S Hany, ... | | |
