| STEMsalabim: A high-performance computing cluster friendly code for scanning transmission electron microscopy image simulations of thin specimens JO Oelerich, L Duschek, J Belz, A Beyer, SD Baranovskii, K Volz Ultramicroscopy 177, 91-96, 2017 | 62 | 2017 |
| Attenuated total reflection terahertz time-domain spectroscopy: uncertainty analysis and reduction scheme A Soltani, D Jahn, L Duschek, E Castro-Camus, M Koch, ... IEEE Transactions on Terahertz Science and Technology 6 (1), 32-39, 2016 | 39 | 2016 |
| Crystallization Caught in the Act with Terahertz Spectroscopy: Non‐Classical Pathway for l‐(+)‐Tartaric Acid A Soltani, D Gebauer, L Duschek, BM Fischer, H Cölfen, M Koch Chemistry–A European Journal 23 (57), 14128-14132, 2017 | 32 | 2017 |
| Efficient nitrogen incorporation in GaAs using novel metal organic As–N precursor di-tertiary-butyl-arsano-amine (DTBAA) E Sterzer, A Beyer, L Duschek, L Nattermann, B Ringler, B Leube, ... Journal of Crystal Growth 439, 19-27, 2016 | 25 | 2016 |
| Interface morphology and composition of Ga (NAsP) quantum well structures for monolithically integrated LASERs on silicon substrates T Wegele, A Beyer, P Ludewig, P Rosenow, L Duschek, K Jandieri, ... Journal of Physics D: Applied Physics 49 (7), 075108, 2016 | 23 | 2016 |
| Composition determination of semiconductor alloys towards atomic accuracy by HAADF-STEM L Duschek, P Kükelhan, A Beyer, S Firoozabadi, JO Oelerich, C Fuchs, ... Ultramicroscopy 200, 84-96, 2019 | 19 | 2019 |
| Influence of surface relaxation of strained layers on atomic resolution ADF imaging A Beyer, L Duschek, J Belz, JO Oelerich, K Jandieri, K Volz Ultramicroscopy 181, 8-16, 2017 | 18 | 2017 |
| Segregation at interfaces in (GaIn) As/Ga (AsSb)/(GaIn) As-quantum well heterostructures explored by atomic resolution STEM P Kükelhan, S Firoozabadi, A Beyer, L Duschek, C Fuchs, JO Oelerich, ... Journal of Crystal Growth 524, 125180, 2019 | 13 | 2019 |
| Surface relaxation of strained Ga (P, As)/GaP heterostructures investigated by HAADF STEM A Beyer, L Duschek, J Belz, JO Oelerich, K Jandieri, K Volz Journal of Microscopy 268 (3), 239-247, 2017 | 12 | 2017 |
| Quantitative characterization of the interface roughness of (GaIn) As quantum wells by high resolution STEM H Han, A Beyer, K Jandieri, KI Gries, L Duschek, W Stolz, K Volz Micron 79, 1-7, 2015 | 11 | 2015 |
| Inline monitoring of paper thickness in an industrial setting SF Busch, T Probst, L Duschek, R Wilk, M Voitsch, F Fender, S Lübbecke, ... 2013 38th International Conference on Infrared, Millimeter, and Terahertz …, 2013 | 7 | 2013 |
| Composition determination of multinary III/V semiconductors via STEM HAADF multislice simulations L Duschek, A Beyer, JO Oelerich, K Volz Ultramicroscopy 185, 15-20, 2018 | 5 | 2018 |
| A novel accurate method for attenuated total reflection spectroscopy A Soltani, L Duschek, SF Busch, T Probst, E Castro-Camus, M Koch 2014 39th International Conference on Infrared, Millimeter, and Terahertz …, 2014 | 5 | 2014 |
| Methods and challenges in STEM composition determination of III/V semiconductors via complementary multislice simulations L Duschek Philipps-Universität Marburg, 2019 | | 2019 |
| In situ Observation of Annealing Effects in Ga (NAsP) Multi Quantum Well Structures R Straubinger, A Beyer, L Duschek, T Wegele, W Stolz, K Volz Microscopy and Microanalysis 21 (S3), 957-958, 2015 | | 2015 |
| Composition determination for quaternary III-V semiconductors by aberration-corrected STEM L Duschek, A Beyer, JO Oelerich, K Volz Philipps-Universität Marburg, 0 | | |
| MINI SPECIAL ISSUE ON THE 26TH INTERNATIONAL SYMPOSIUM ON SPACE TERAHERTZ TECHNOLOGY (ISSTT-2015) E Hérault, F Garet, JL Coutaz, K Maussang, A Brewer, J Palomo, ... | | |
