Stelios Neophytou 个人学术档案

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Maria K MichaelElectrical and Computer Engineering Department, KIOS Center of Excellence, University of Cyprus在 ucy.ac.cy 的电子邮件经过验证
Arnór B. ElvarssonResearcher, ETH Zürich在 ibi.baug.ethz.ch 的电子邮件经过验证
Jamil HamadnehAssistant Professor at Palestine Technical University -Kadoorie在 ptuk.edu.ps 的电子邮件经过验证
Shelly EzioniPhD Candidate, Technion在 tx.technion.ac.il 的电子邮件经过验证
Yoram ShiftanTechnion在 technion.ac.il 的电子邮件经过验证
Jaka SodnikProfessor of Electrical Engineering, University of Ljubljana在 fe.uni-lj.si 的电子邮件经过验证
Amalia PolydoropoulouProfessor, Department of Shipping, Trade and Transport, University of the Aegean在 aegean.gr 的电子邮件经过验证
Domokos Esztergár-KissBME Department of Transport Technology (Közlekedéstechnológiai Tanszék)在 mail.bme.hu 的电子邮件经过验证
Ioannis TsourosUniversity of the Aegean在 aegean.gr 的电子邮件经过验证
Spyros TragoudasProfessor, Southern Illinois University Carbondale在 siu.edu 的电子邮件经过验证
Nima DadashzadehLecturer (Assistant Professor) in Huddersfield Business School在 hud.ac.uk 的电子邮件经过验证
Ioannis KyriakidesUniversity of Nicosia在 unic.ac.cy 的电子邮件经过验证
Graham ParkhurstProfessor of Sustainable Mobility, Centre for Transport and Society, University of the West of England, Bristol, UK在 uwe.ac.uk 的电子邮件经过验证
Floridea Di CiommocambiaMO|changing MObility在 cambiamo.net 的电子邮件经过验证
Constantinos EfstathiouProfessor, Dept. of Informatics and Computer Engineering, University of West Attica在 uniwa.gr 的电子邮件经过验证
Cleo SgouropoulouUniversity of West Attica在 uniwa.gr 的电子邮件经过验证
Ioannis VoyiatzisUniversity of West Attica在 uniwa.gr 的电子邮件经过验证
Dimitris GizopoulosNational and Kapodistrian University of Athens在 di.uoa.gr 的电子邮件经过验证
Marco OttaviUniversity of Rome Tor Vergata在 ing.uniroma2.it 的电子邮件经过验证
Salvatore PontarelliComputer Science - Sapienza在 uniroma1.it 的电子邮件经过验证

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Stelios Neophytou

Associate Professor at Computer Engineering, University of Nicosia

在 unic.ac.cy 的电子邮件经过验证 - 首页

VLSI Testing Binary Decision Diagrams Algorithms for Testing of Digital Integrated Circuits


标题按引用次数排序按年份排序按标题排序	引用次数引用次数	年份
Modeling cross-national differences in automated vehicle acceptance S Etzioni, J Hamadneh, AB Elvarsson, D Esztergár-Kiss, M Djukanovic, ... Sustainability 12 (22), 9765, 2020	60	2020
Who is willing to share their AV? Insights about gender differences among seven countries A Polydoropoulou, I Tsouros, N Thomopoulos, C Pronello, A Elvarsson, ... Sustainability 13 (9), 4769, 2021	53	2021
Test set generation with a large number of unspecified bits using static and dynamic techniques SN Neophytou, MK Michael IEEE Transactions on Computers 59 (3), 301-316, 2009	37	2009
Scalable parallel fault simulation for shared-memory multiprocessor systems S Hadjitheophanous, SN Neophytou, MK Michael VLSI Test Symposium (VTS), 2016 IEEE 34th, 1-6, 2016	18	2016
On the relaxation of n-detect test sets S Neophytou, MK Michael 26th IEEE VLSI Test Symposium (vts 2008), 187-192, 2008	16	2008
Identification of critical primitive path delay faults without any path enumeration K Christou, MK Michael, S Neophytou 2010 28th VLSI Test Symposium (VTS), 9-14, 2010	15	2010
Dependability threats C Bolchini, MK Michael, A Miele, S Neophytou Dependable Multicore Architectures at Nanoscale, 37-92, 2018	14*	2018
Efficient deterministic test generation for BIST schemes with LFSR reseeding S Neophytou, MK Michael, S Tragoudas 12th IEEE International On-Line Testing Symposium (IOLTS'06), 6 pp., 2006	14	2006
Generating diverse test sets for multiple fault detections based on fault cone partitioning S Neophytou, MK Michael, K Christou 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2009	10	2009
Functions for quality transition-fault tests and their applications in test-set enhancement SN Neophytou, MK Michael, S Tragoudas IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2006	10	2006
Test Pattern Generation of Relaxed-Detect Test Sets SN Neophytou, MK Michael IEEE transactions on very large scale integration (VLSI) systems 20 (3), 410-423, 2011	9	2011
Hierarchical fault compatibility identification for test generation with a small number of specified bits S Neophytou, MK Michael 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007	9	2007
Utilizing shared memory multi-cores to speed-up the ATPG process S Hadjitheophanous, SN Neophytou, MK Michael 2016 21th IEEE European Test Symposium (ETS), 1-6, 2016	7	2016
Who is willing to share their AV? Insights about gender differences among seven countries. Sustainability 13 (9), 4769 A Polydoropoulou, I Tsouros, N Thomopoulos, C Pronello, A Elvarsson, ...	5	2021
Modeling cross-national differences in automated vehicle acceptance, Sustainability 12 (22): 9765 S Etzioni, J Hamadneh, AB Elvarsson, D Esztergár-Kiss, M Djukanovic, ...	5	2020
Modeling the operating characteristics of iot for underwater sound classification CC Constantinou, E Michaelides, I Alexopoulos, T Pieri, S Neophytou, ... 2021 IEEE 11th Annual Computing and Communication Workshop and Conference …, 2021	4	2021
On the impact of fault list partitioning in parallel implementations for dynamic test compaction considering multicore systems S Neophytou, S Hadjitheophanous, MK Michael Design and Test Symposium (IDT), 2013 8th International, 1-6, 2013	4	2013
Test set embedding into accumulator-generated sequences targeting hard-to-detect faults I Voyiatzis, S Neophytou, M Michaeel, S Hadjitheophanous, ... Design and Test Symposium (IDT), 2013 8th International, 1-2, 2013	4*	2013
Two new methods for accurate test set relaxation via test set replacement S Neophytou, MK Michael 9th International Symposium on Quality Electronic Design (isqed 2008), 827-831, 2008	4	2008
Test set enhancement for quality transition faults using function-based methods S Neophytou, MK Michael, S Tragoudas Proceedings of the 15th ACM Great Lakes symposium on VLSI, 182-187, 2005	4	2005

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