| Process-variation tolerant channel-adaptive virtually zero-margin low-power wireless receiver systems S Sen, V Natarajan, S Devarakond, A Chatterjee IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014 | 30 | 2014 |
| A holistic approach to accurate tuning of RF systems for large and small multiparameter perturbations V Natarajan, S Sen, SK Devarakond, A Chatterjee 2010 28th VLSI Test Symposium (VTS), 331-336, 2010 | 30 | 2010 |
| Yield recovery of RF transceiver systems using iterative tuning-driven power-conscious performance optimization V Natarajan, A Banerjee, S Sen, S Devarakond, A Chatterjee IEEE Design & Test 32 (1), 61-69, 2014 | 28 | 2014 |
| Phase distortion to amplitude conversion-based low-cost measurement of AM-AM and AM-PM effects in RF power amplifiers S Sen, S Devarakond, A Chatterjee IEEE Transactions on Very Large Scale Integration (VLSI) Systems 20 (9 …, 2011 | 26 | 2011 |
| Real-time use-aware adaptive RF transceiver systems for energy efficiency under BER constraints D Banerjee, SK Devarakond, X Wang, S Sen, A Chatterjee IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 25 | 2015 |
| Concurrent device/specification cause–effect monitoring for yield diagnosis using alternate diagnostic signatures SK Devarakond, S Sen, S Bhattacharya, A Chatterjee IEEE Design & Test of Computers 29 (1), 48-58, 2011 | 24 | 2011 |
| BIST driven power conscious post-manufacture tuning of wireless transceiver systems using hardware-iterated gradient search V Natarajan, SK Devarakond, S Sen, A Chatterjee 2009 Asian Test Symposium, 243-248, 2009 | 24 | 2009 |
| DSP assisted low cost IQ mismatch measurement and compensation using built in power detector S Sen, SK Devarakond, A Chatterjee 2010 IEEE MTT-S International Microwave Symposium, 336-339, 2010 | 22 | 2010 |
| Real-time use-aware adaptive MIMO RF receiver systems for energy efficiency under BER constraints D Banerjee, S Devarakond, S Sen, A Chatterjee Proceedings of the 50th Annual Design Automation Conference, 1-7, 2013 | 19 | 2013 |
| Iterative built-in testing and tuning of mixed-signal/RF systems A Chatterjee, D Han, V Natarajan, S Devarakond, S Sen, H Choi, ... 2009 IEEE International Conference on Computer Design, 319-326, 2009 | 18 | 2009 |
| Low cost AM/AM and AM/PM distortion measurement using distortion-to-amplitude transformations S Sen, S Devarakond, A Chatterjee 2009 International Test Conference, 1-10, 2009 | 16 | 2009 |
| BIST-assisted power aware self healing RF circuits SK Devarakond, V Natarajan, S Sen, A Chatterjee 2009 IEEE 15th International Mixed-Signals, Sensors, and Systems Test …, 2009 | 15 | 2009 |
| Automatic test stimulus generation for accurate diagnosis of RF systems using transient response signatures A Banerjee, S Sen, SK Devarakond, A Chatterjee 29th VLSI Test Symposium, 58-63, 2011 | 14 | 2011 |
| Digitally assisted concurrent built-in tuning of rf systems using hamming distance proportional signatures S Devarakond, S Sen, V Natarajan, A Banerjee, H Choi, G Srinivasan, ... 2010 19th IEEE Asian Test Symposium, 283-288, 2010 | 14 | 2010 |
| Validation signature testing: A methodology for post-silicon validation of analog/mixed-signal circuits A Chatterjee, S Deyati, B Muldrey, S Devarakond, A Banerjee Proceedings of the International Conference on Computer-Aided Design, 553-556, 2012 | 12 | 2012 |
| Accurate signature driven power conscious tuning of RF systems using hierarchical performance models A Banerjee, S Sen, S Devarakond, A Chatterjee 2011 IEEE International Test Conference, 1-9, 2011 | 10 | 2011 |
| Optimized digital compatible pulse sequences for testing of RF front end modules A Banerjee, SK Devarakond, V Natarajan, S Sen, A Chatterjee 2010 IEEE 16th International Mixed-Signals, Sensors and Systems Test …, 2010 | 10 | 2010 |
| Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters S Devarakond, D Banerjee, A Banerjee, S Sen, A Chatterjee 2013 18th IEEE European Test Symposium (ETS), 1-6, 2013 | 6 | 2013 |
| Digitally assisted built-in tuning using Hamming distance proportional signatures in RF circuits S Devarakond, S Sen, A Banerjee, A Chatterjee IEEE Transactions on Very Large Scale Integration (VLSI) Systems 24 (9 …, 2016 | 5 | 2016 |
| Predicting die-level process variations from wafer test data for analog devices: A feasibility study S Devarakond, J McCoy, A Nahar, JM Carulli, S Bhattacharya, ... 2013 14th Latin American Test Workshop-LATW, 1-6, 2013 | 5 | 2013 |
