| Degradation assessment and precursor identification for SiC MOSFETs under high temp cycling E Ugur, F Yang, S Pu, S Zhao, B Akin IEEE Transactions on Industry Applications 55 (3), 2858-2867, 2019 | 120 | 2019 |
| A new complete condition monitoring method for SiC power MOSFETs E Ugur, C Xu, F Yang, S Pu, B Akin IEEE Transactions on Industrial Electronics 68 (2), 1654-1664, 2020 | 76 | 2020 |
| Turn-on Delay Based Real-Time Junction Temperature Measurement for SiC MOSFETs With Aging Compensation F Yang, S Pu, C Xu, B Akin IEEE Transactions on Power Electronics 36 (2), 1280-1294, 2020 | 66 | 2020 |
| In situ Degradation Monitoring of SiC MOSFET Based on Switching Transient Measurement S Pu, E Ugur, F Yang, B Akin IEEE Transactions on Industrial Electronics 67 (6), 5092-5100, 2019 | 63 | 2019 |
| Aging mechanisms and accelerated lifetime tests for SiC MOSFETs: An overview S Pu, F Yang, BT Vankayalapati, B Akin IEEE Journal of Emerging and Selected Topics in Power Electronics 10 (1 …, 2021 | 61 | 2021 |
| A practical on-board SiC MOSFET condition monitoring technique for aging detection S Pu, F Yang, BT Vankayalapati, E Ugur, C Xu, B Akin IEEE Transactions on Industry Applications 56 (3), 2828-2839, 2020 | 47 | 2020 |
| Temperature-independent gate-oxide degradation monitoring of SiC MOSFETs based on junction capacitances M Farhadi, F Yang, S Pu, BT Vankayalapati, B Akin IEEE Transactions on Power Electronics 36 (7), 8308-8324, 2021 | 45 | 2021 |
| Design of a fast dynamic on-resistance measurement circuit for GaN power HEMTs F Yang, C Xu, E Ugur, S Pu, B Akin 2018 IEEE Transportation Electrification Conference and Expo (ITEC), 359-365, 2018 | 36 | 2018 |
| Performance degradation of GaN HEMTs under accelerated power cycling tests C Xu, F Yang, E Ugur, S Pu, B Akin CPSS Transactions on power electronics and applications 3 (4), 269-277, 2018 | 35 | 2018 |
| SiC MOSFET aging detection based on Miller plateau voltage sensing S Pu, F Yang, E Ugur, C Xu, B Akin 2019 IEEE Transportation Electrification Conference and Expo (ITEC), 1-6, 2019 | 32 | 2019 |
| Real-time degradation monitoring of SiC-MOSFETs through readily available system microcontroller S Pu, E Ugur, B Akin 2017 IEEE 5th Workshop on wide bandgap power devices and applications (WiPDA …, 2017 | 25 | 2017 |
| A highly scalable, modular test bench architecture for large-scale DC power cycling of SiC MOSFETs: Towards data enabled reliability BT Vankayalapati, F Yang, S Pu, M Farhadi, B Akin IEEE Power Electronics Magazine 8 (1), 39-48, 2021 | 23 | 2021 |
| Investigation of aging’s effect on the conduction and switching loss in SiC MOSFETs F Yang, E Ugur, S Pu, B Akin, M Das 2019 IEEE Energy Conversion Congress and Exposition (ECCE), 6166-6173, 2019 | 16 | 2019 |
| Design of a high-performance DC power cycling test setup for SiC MOSFETs F Yang, E Ugur, S Pu, B Akin 2019 IEEE Applied Power Electronics Conference and Exposition (APEC), 1390-1396, 2019 | 16 | 2019 |
| Investigation of performance degradation in enhancement-mode GaN HEMTs under accelerated aging C Xu, E Ugur, F Yang, S Pu, B Akin 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2018 | 15 | 2018 |
| A comparative study on reliability and ruggedness of Kelvin and non-Kelvin packaged SiC MOSFETs S Pu, F Yang, N Zhang, BT Vankayalapati, B Akin IEEE Transactions on Industry Applications 58 (3), 3863-3874, 2022 | 11 | 2022 |
| On-board SiC MOSFET degradation monitoring through readily available inverter current/voltage sensors S Pu, F Yang, E Ugur, BT Vankayalapati, C Xu, B Akin 2019 IEEE Transportation Electrification Conference and Expo (ITEC), 1-5, 2019 | 11 | 2019 |
| Investigation and on-board detection of gate-open failure in SiC MOSFETs BT Vankayalapati, S Pu, F Yang, M Farhadi, V Gurusamy, B Akin IEEE Transactions on Power Electronics 37 (4), 4658-4671, 2021 | 10 | 2021 |
| Thermally triggered SiC MOSFET aging effect on conducted EMI S Pu, E Ugur, F Yang, C Xu, B Akin 2018 IEEE 6th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2018 | 10 | 2018 |
| Investigation of EM radiation changes in SiC based converters throughout device aging S Pu, E Ugur, B Akin, H Akca 2017 IEEE 5th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2017 | 9 | 2017 |
Bilal AkinProfessor, University of Texas at Dallas在 utdallas.edu 的电子邮件经过验证
