Transmission electron microscopy and diffractometry of materials B Fultz, JM Howe Springer Science & Business Media, 2012 | 1781 | 2012 |
Interfaces in materials: atomic structure, thermodynamics and kinetics of solid-vapor, solid-liquid and solid-solid interfaces JM Howe (No Title), 1997 | 836 | 1997 |
Bonding, structure, and properties of metal/ceramic interfaces: Part 1 Chemical bonding, chemical reaction, and interfacial structure JM Howe International materials reviews 38 (5), 233-256, 1993 | 348 | 1993 |
Atomic-level observation of disclination dipoles in mechanically milled, nanocrystalline Fe M Murayama, JM Howe, H Hidaka, S Takaki Science 295 (5564), 2433-2435, 2002 | 321 | 2002 |
Atomic mechanisms of precipitate plate growth JM Howe, U Dahmen, R Gronsky Philosophical Magazine A 56 (1), 31-61, 1987 | 278 | 1987 |
Interphase boundary structures of intragranular proeutectoid α plates in a hypoeutectoid Ti Cr alloy T Furuhara, JM Howe, HI Aaronson Acta metallurgica et materialia 39 (11), 2873-2886, 1991 | 208 | 1991 |
Convergent-beam electron diffraction analysis of the Ω phase in an Al-4.0 Cu-0.5 Mg-0.5 Ag alloy A Garg, JM Howe Acta metallurgica et materialia 39 (8), 1939-1946, 1991 | 170 | 1991 |
The role of disconnections in phase transformations JM Howe, RC Pond, JP Hirth Progress in Materials Science 54 (6), 792-838, 2009 | 166 | 2009 |
Atomic mechanisms of precipitate plate growth in the Al Ag system—I. Conventional transmission electron microscopy JM Howe, HI Aaronson, R Gronsky Acta Metallurgica 33 (4), 639-648, 1985 | 160* | 1985 |
Precipitation of the Ω phase in an Al-4.0 Cu-0.5 Mg alloy A Garg, YC Chang, JM Howe Scripta Metallurgica et Materialia 24 (4), 677-680, 1990 | 142 | 1990 |
Structure and deformation behavior ofT 1 precipitate plates in an Al- 2Li- 1 Cu alloy JM Howe, J Lee, AK Vasudevan Metallurgical Transactions A 19, 2911-2920, 1988 | 136 | 1988 |
In situ Transmission-Electron-Microscopy Investigation of Melting <?format ?>in Submicron Al-Si Alloy Particles under Electron-Beam Irradiation T Yokota, M Murayama, JM Howe Physical review letters 91 (26), 265504, 2003 | 135 | 2003 |
Crystallographic and mechanistic aspects of growth by shear and by diffusional processes HI Aaronson, T Furuhara, JM Rigsbee, WT Reynolds, JM Howe Metallurgical Transactions A 21, 2369-2409, 1990 | 129 | 1990 |
Transmission electron microscopy investigation of interfaces in a two-phase TiAl alloy GJ Mahon, JM Howe Metallurgical Transactions A 21, 1655-1662, 1990 | 124 | 1990 |
Composition and stability of Ω phase in an Al-Cu-Mg-Ag alloy YC Chang, JM Howe Metallurgical and Materials Transactions A 24, 1461-1470, 1993 | 103 | 1993 |
High-resolution electron microscopy of γ-α2 interfaces in titanium aluminide SR Singh, JM Howe Philosophical Magazine A 66 (5), 739-771, 1992 | 91 | 1992 |
Interface controlled thermal resistances of ultra-thin chalcogenide-based phase change memory devices K Aryana, JT Gaskins, J Nag, DA Stewart, Z Bai, S Mukhopadhyay, ... Nature communications 12 (1), 774, 2021 | 86 | 2021 |
In-situ electron microscopy: Applications in physics, chemistry and materials science G Dehm, JM Howe, J Zweck John Wiley & Sons, 2012 | 84 | 2012 |
Bonding, structure, and properties of metal/ceramic interfaces: Part 2 Interface fracture behaviour and property measurement JM Howe International materials reviews 38 (5), 257-271, 1993 | 84 | 1993 |
In situ transmission electron microscopy studies of the solid–liquid interface JM Howe, H Saka MRS bulletin 29 (12), 951-957, 2004 | 82 | 2004 |