| Saidoyoki: Evaluating side-channel leakage in pre-and post-silicon setting P Kiaei, Z Liu, RK Eren, Y Yao, P Schaumont Cryptology ePrint Archive, 2021 | 10 | 2021 |
| Gate-level side-channel leakage assessment with architecture correlation analysis P Kiaei, Y Yao, Z Liu, N Fern, CB Breunesse, J Van Woudenberg, K Gillis, ... arXiv preprint arXiv:2204.11972, 2022 | 8 | 2022 |
| Leverage the average: Averaged sampling in pre-silicon side-channel leakage assessment P Kiaei, Z Liu, P Schaumont Proceedings of the Great Lakes Symposium on VLSI 2022, 3-8, 2022 | 6 | 2022 |
| Root‐Cause Analysis of Power‐Based Side‐Channel Leakage in Lightweight Cryptography Candidates Z Liu, P Schaumont NIST 5th lightweight cryptography workshop, 2022 | 4 | 2022 |
| Gate-Level Side-Channel Leakage Ranking with Architecture Correlation Analysis P Kiaei, Y Yao, Z Liu, N Fern, CB Breunesse, J Van Woudenberg, K Gillis, ... IEEE Transactions on Emerging Topics in Computing, 2023 | 3 | 2023 |
| FaultDetective: Explainable to a Fault, from the Design Layout to the Software Z Liu, D Shanmugam, P Schaumont IACR Transactions on Cryptographic Hardware and Embedded Systems 2024 (4 …, 2024 | | 2024 |
| Root-cause Analysis of the Side Channel Leakage from ASCON Implementations Z Liu, P Schaumont | | |
