Detecting malicious modifications of data in third-party intellectual property cores J Rajendran, V Vedula, R Karri Proceedings of the 52nd Annual Design Automation Conference, 1-6, 2015 | 141 | 2015 |
Formal security verification of third party intellectual property cores for information leakage J Rajendran, AM Dhandayuthapany, V Vedula, R Karri 2016 29th International conference on VLSI design and 2016 15th …, 2016 | 80 | 2016 |
FACTOR: A hierarchical methodology for functional test generation and testability analysis VM Vedula, JA Abraham Proceedings 2002 Design, Automation and Test in Europe Conference and …, 2002 | 43 | 2002 |
Verifying properties using sequential ATPG [IC design] JA Abraham, VM Vedula Proceedings. International Test Conference, 194-202, 2002 | 41 | 2002 |
Native mode functional self-test generation for systems-on-chip K Jayaraman, VM Vedula, JA Abraham Proceedings International Symposium on Quality Electronic Design, 280-285, 2002 | 40 | 2002 |
A hierarchical test generation approach using program slicing techniques on hardware description languages VM Vedula, JA Abraham, J Bhadra, R Tupuri Journal of Electronic Testing 19, 149-160, 2003 | 37 | 2003 |
Power virus generation using behavioral models of circuits K Najeeb, V Vardhan, R Konda, S Kumar, S Hari, V Kamakoti, VM Vedula 25th IEEE VLSI Test Symposium (VTS'07), 35-42, 2007 | 30 | 2007 |
Program slicing for hierarchical test generation VM Vedula, JA Abraham, J Bhadra Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 237-243, 2002 | 29 | 2002 |
Formal verification using bounded model checking: SAT versus sequential ATPG engines DG Saab, JA Abraham, VM Vedula 16th International Conference on VLSI Design, 2003. Proceedings., 243-248, 2003 | 28 | 2003 |
Automatic constraint based test generation for behavioral HDL models SKS Hari, VVR Konda, V Kamakoti, VM Vedula, KS Maneperambil IEEE Transactions on Very Large Scale Integration (VLSI) Systems 16 (4), 408-421, 2008 | 20 | 2008 |
Program slicing for ATPG-based property checking VM Vedula, WJ Townsend, JA Abraham 17th International Conference on VLSI Design. Proceedings., 591-596, 2004 | 20 | 2004 |
A novel methodology for hierarchical test generation using functional constraint composition VM Vedula, JA Abraham Proceedings IEEE International High-Level Design Validation and Test …, 2000 | 17 | 2000 |
System, method and computer-accessible medium for security verification of third party intellectual property cores V Vedula, J Rajendran, A Dhandayuthapany, R Karri US Patent 10,083,303, 2018 | 16 | 2018 |
System, method and computer-accessible medium for security verification of third party intellectual property cores V Vedula, J Rajendran, A Dhandayuthapany, R Karri US Patent App. 14/874,794, 2016 | 10 | 2016 |
Controllability-driven power virus generation for digital circuits K Najeeb, K Gururaj, V Kamakoti, VM Vedula 20th International Conference on VLSI Design held jointly with 6th …, 2007 | 10 | 2007 |
Circuit modeling apparatus, systems, and methods J Abraham, V Vedula US Patent App. 11/017,378, 2005 | 9 | 2005 |
A scalable symbolic simulator for Verilog RTL S Sunkari, S Chakraborty, V Vedula, K Maneparambil 2007 Eighth International Workshop on Microprocessor Test and Verification …, 2007 | 8 | 2007 |
A unified formal framework for analyzing functional and speed-path properties O Olivo, S Ray, J Bhadra, V Vedula 2011 12th International Workshop on Microprocessor Test and Verification, 44-45, 2011 | 3 | 2011 |
A novel unified framework for functional verification of processors using constraint solvers D Prasad, R Archana, V Karthik, VK Senthilkumar, SM Kailasnath, ... Proc. VLSI Des. Test Symp.(VDAT), 418-426, 2006 | 3 | 2006 |
Security verification of 3rd party intellectual property cores for information leakage V Vedula, J Rajendran, A Murugadhandayuthapany, R Karri Proceedings of the GOMACTECH, 2015 | 2 | 2015 |