| Nano-ridge engineering of GaSb for the integration of InAs/GaSb heterostructures on 300 mm (001) Si M Baryshnikova, Y Mols, Y Ishii, R Alcotte, H Han, T Hantschel, O Richard, ... Crystals 10 (4), 330, 2020 | 41 | 2020 |
| Low dark current and high responsivity 1020nm InGaAs/GaAs nano-ridge waveguide photodetector monolithically integrated on a 300-mm Si wafer CI Ozdemir, Y De Koninck, D Yudistira, N Kuznetsova, M Baryshnikova, ... Journal of Lightwave Technology 39 (16), 5263-5269, 2021 | 32 | 2021 |
| First demonstration of III-V HBTs on 300 mm Si substrates using nano-ridge engineering A Vais, L Witters, Y Mols, AS Hernandez, A Walke, H Yu, M Baryshnikova, ... 2019 IEEE International Electron Devices Meeting (IEDM), 9.1. 1-9.1. 4, 2019 | 25 | 2019 |
| Nano-ridge laser monolithically grown on (001) Si D Van Thourhout, Y Shi, M Baryshnikova, Y Mols, N Kuznetsova, ... Semiconductors and Semimetals 101, 283-304, 2019 | 25 | 2019 |
| Unique design approach to realize an O-band laser monolithically integrated on 300 mm Si substrate by nano-ridge engineering D Colucci, M Baryshnikova, Y Shi, Y Mols, M Muneeb, YD Koninck, ... Optics Express 30 (8), 13510-13521, 2022 | 20 | 2022 |
| Application of an sb surfactant in InGaAs nano-ridge engineering on 300 mm silicon substrates B Kunert, R Alcotte, Y Mols, M Baryshnikova, N Waldron, N Collaert, ... Crystal Growth & Design 21 (3), 1657-1665, 2021 | 13 | 2021 |
| GaAs nano-ridge laser diodes fully fabricated in a 300 mm CMOS pilot line Y De Koninck, C Caer, D Yudistira, M Baryshnikova, H Sar, PY Hsieh, ... arXiv preprint arXiv:2309.04473, 2023 | 12 | 2023 |
| Loss-coupled DFB nano-ridge laser monolithically grown on a standard 300-mm Si wafer Y Shi, M Pantouvaki, J Van Campenhout, D Colucci, M Baryshnikova, ... Optics Express 29 (10), 14649-14657, 2021 | 12 | 2021 |
| Time-resolved photoluminescence characterization of InGaAs/GaAs nano-ridges monolithically grown on 300 mm Si substrates Y Shi, LC Kreuzer, NC Gerhardt, M Pantouvaki, J Van Campenhout, ... Journal of Applied Physics 127 (10), 2020 | 11 | 2020 |
| Sequential infiltration synthesis for line edge roughness mitigation of EUV resist M Baryshnikova, D De Simone, W Knaepen, K Kachel, C BT, S Paolillo, ... Journal of Photopolymer Science and Technology 30 (6), 667-670, 2017 | 10 | 2017 |
| Application of electron channeling contrast imaging to 3D semiconductor structures through proper detector configurations H Han, T Hantschel, L Strakos, T Vystavel, M Baryshnikova, Y Mols, ... Ultramicroscopy 210, 112928, 2020 | 9 | 2020 |
| Monolithic integration of nano-ridge engineered InGaP/GaAs HBTs on 300 mm Si substrate Y Mols, A Vais, S Yadav, L Witters, K Vondkar, R Alcotte, M Baryshnikova, ... Materials 14 (19), 5682, 2021 | 7 | 2021 |
| Advanced transistors for high frequency applications B Parvais, U Peralagu, A Vais, AR Alian, L Witters, Y Mols, A Walke, ... ECS Transactions 97 (5), 27, 2020 | 6 | 2020 |
| Wafer-level aging of InGaAs/GaAs nano-ridge pin diodes monolithically integrated on silicon PY Hsieh, A Tsiara, B O’Sullivan, D Yudistira, M Baryshnikova, ... 2022 IEEE International Reliability Physics Symposium (IRPS), 9A. 3-1-9A. 3-9, 2022 | 4 | 2022 |
| 0.3 pA Dark current and 0.65 A/W responsivity 1020nm InGaAs/GaAs nano-ridge waveguide photodetector monolithically integrated on a 300-mm si wafer CI Ozdemir, Y De Koninck, D Yudistira, N Kuznetsova, M Baryshnikova, ... 2020 European Conference on Optical Communications (ECOC), 1-4, 2020 | 4 | 2020 |
| InGaAs/GaAs multi-quantum well nano-ridge waveguide photodetector epitaxially grown on a 300-mm si wafer CI Ozdemir, Y De Koninck, N Kuznetsova, M Baryshnikova, ... 2020 IEEE Photonics Conference (IPC), 1-2, 2020 | 4 | 2020 |
| GaAs nano-ridge laser diodes fully fabricated in a 300 mm CMOS pilot line Y De Koninck, C Caer, D Yudistira, M Baryshnikova, H Sar, S Patra, ... | 2 | 2023 |
| Monolithic GaAs/Si V-groove depletion-type optical phase shifters integrated in a 300 mm Si photonics platform Y Kim, D Yudistira, B Kunert, M Baryshnikova, R Alcotte, CI Ozdemir, ... Photonics Research 10 (6), 1509-1516, 2022 | 2 | 2022 |
| Application and optimization of automated ECCI mapping to the analysis of lowly defective epitaxial films on blanket or patterned wafers H Han, T Hantschel, P Lagrain, C Porret, R Loo, M Baryshnikova, ... International Symposium for Testing and Failure Analysis 84215, 211-216, 2021 | 2 | 2021 |
| First demonstration of III-V HBTs on 300mm Si substrates using nanoridge technology A Vais, L Witters, Y Mols, A Sibaja-Hernandez, A Walke, H Yu, ... | 2 | 2019 |
