| Comparison of high efficiency flexible CdTe solar cells on different substrates at low temperature deposition A Salavei, D Menossi, F Piccinelli, A Kumar, G Mariotto, M Barbato, ... Solar energy 139, 13-18, 2016 | 49 | 2016 |
| CdTe solar cells: technology, operation and reliability M Barbato, E Artegiani, M Bertoncello, M Meneghini, N Trivellin, ... Journal of Physics D: Applied Physics 54 (33), 333002, 2021 | 45 | 2021 |
| Potential induced degradation of N-type bifacial silicon solar cells: An investigation based on electrical and optical measurements M Barbato, A Barbato, M Meneghini, G Tavernaro, M Rossetto, ... Solar Energy Materials and Solar Cells 168, 51-61, 2017 | 42 | 2017 |
| Influence of shunt resistance on the performance of an illuminated string of solar cells: theory, simulation, and experimental analysis M Barbato, M Meneghini, A Cester, G Mura, E Zanoni, G Meneghesso IEEE Transactions on Device and Materials Reliability 14 (4), 942-950, 2014 | 39 | 2014 |
| Inactivating SARS-CoV-2 using 275 nm UV-C LEDs through a spherical irradiation box: Design, characterization and validation N Trivellin, M Buffolo, F Onelia, A Pizzolato, M Barbato, VT Orlandi, ... Materials 14 (9), 2315, 2021 | 36 | 2021 |
| Demonstration of field-and power-dependent ESD failure in AlGaN/GaN RF HEMTs I Rossetto, M Meneghini, M Barbato, F Rampazzo, D Marcon, ... IEEE Transactions on Electron Devices 62 (9), 2830-2836, 2015 | 35 | 2015 |
| A physical-based equivalent circuit model for an organic/electrolyte interface N Lago, A Cester, N Wrachien, M Natali, SD Quiroga, S Bonetti, ... Organic Electronics 35, 176-185, 2016 | 32 | 2016 |
| Field-and current-driven degradation of GaN-based power HEMTs with p-GaN gate: Dependence on Mg-doping level I Rossetto, M Meneghini, E Canato, M Barbato, S Stoffels, N Posthuma, ... Microelectronics Reliability 76, 298-303, 2017 | 30 | 2017 |
| Analysis of magnesium zinc oxide layers for high efficiency CdTe devices E Artegiani, M Leoncini, M Barbato, M Meneghini, G Meneghesso, ... Thin Solid Films 672, 22-25, 2019 | 29 | 2019 |
| Local shunting in multicrystalline silicon solar cells: Distributed electrical simulations and experiments D Giaffreda, P Magnone, M Meneghini, M Barbato, G Meneghesso, ... IEEE Journal of Photovoltaics 4 (1), 40-47, 2013 | 29 | 2013 |
| Study of the actuation speed, bounces occurrences, and contact reliability of ohmic RF-MEMS switches A Tazzoli, M Barbato, F Mattiuzzo, V Ritrovato, G Meneghesso Microelectronics Reliability 50 (9-11), 1604-1608, 2010 | 26 | 2010 |
| Characterization and modeling of organic (P3HT: PCBM) solar cells as a function of bias and illumination A Rizzo, A Cester, N Wrachien, N Lago, L Torto, M Barbato, J Favaro, ... Solar Energy Materials and Solar Cells 157, 337-345, 2016 | 25 | 2016 |
| Effect of shunt resistance on the performance of mc-Silicon solar cells: A combined electro-optical and thermal investigation M Barbato, M Meneghini, V Giliberto, D Giaffreda, P Magnone, R De Rose, ... 2012 38th IEEE Photovoltaic Specialists Conference, 001241-001245, 2012 | 24 | 2012 |
| A new method for CdSexTe1-x band grading for high efficiency thin-absorber CdTe solar cells E Artegiani, A Gasparotto, P Punathil, V Kumar, M Barbato, M Meneghini, ... Solar Energy Materials and Solar Cells 226, 111081, 2021 | 22 | 2021 |
| Evolution of electrical parameters of dielectric-less ohmic RF-MEMS switches during continuous actuation stress A Tazzoli, E Autizi, M Barbato, G Meneghesso, F Solazzi, P Farinelli, ... 2009 Proceedings of the European Solid State Device Research Conference, 343-346, 2009 | 21 | 2009 |
| Distributed learning of random weights fuzzy neural networks R Fierimonte, M Barbato, A Rosato, M Panella 2016 IEEE International Conference on Fuzzy Systems (FUZZ-IEEE), 2287-2294, 2016 | 20 | 2016 |
| A combined mechanical and electrical characterization procedure for investigating the dynamic behavior of RF-MEMS switches M Barbato, V Giliberto, A Cester, G Meneghesso IEEE Transactions on Device and Materials Reliability 14 (1), 13-20, 2013 | 19 | 2013 |
| Fast System to measure the dynamic on‐resistance of on‐wafer 600 V normally off GaN HEMTs in hard‐switching application conditions A Barbato, M Barbato, M Meneghini, M Silvestri, T Detzel, O Haeberlen, ... IET Power Electronics 13 (11), 2390-2397, 2020 | 17 | 2020 |
| Temperature as an accelerating factor for lifetime estimation of RF-MEMS switches V Mulloni, L Lorenzelli, B Margesin, M Barbato, G Meneghesso Microelectronic Engineering 160, 63-67, 2016 | 16 | 2016 |
| A novel technique to alleviate the stiction phenomenon in radio frequency microelectromechanical switches M Barbato, G Meneghesso IEEE electron device letters 36 (2), 177-179, 2014 | 15 | 2014 |
Gaudenzio MeneghessoUniversity of Padova, Dept. of Information Engineering在 dei.unipd.it 的电子邮件经过验证
