| Layout dependence of total ionizing dose effects on 12-nm bulk FinFET core digital structures T Wallace, M Spear, A Privat, J Neuendank, G Irumva, D Wilson, ... IEEE Transactions on Nuclear Science 70 (4), 620-626, 2022 | 7 | 2022 |
| Single event upset and total ionizing dose response of 12LP FinFET digital circuits J Neuendank, M Spear, T Wallace, D Wilson, J Solano, G Irumva, ... 2022 IEEE Radiation Effects Data Workshop (REDW)(in conjunction with 2022 …, 2022 | 4 | 2022 |
| Non-linear coupling effects in fully depleted SOI transistors M Spear, HJ Barnaby, T Wallace, J Solano, O Forman, D Wilson, ... IEEE Transactions on Nuclear Science 70 (4), 434-441, 2023 | 3 | 2023 |
| The Effects of Threshold Voltage and Number of Fins per Transistor on the TID Response of GF 12LP Technology AI Vidana, NA Dodds, RN Nowlin, TM Wallace, PJ Oldiges, BM Dodd, ... IEEE Transactions on Nuclear Science, 2024 | 1 | 2024 |
| TID Effects on Random Telegraph Signals in Bulk 90 nm MOSFET Devices J Neuendank, F Al Mamun, H Barnaby, S Bonaldo, M Spear, T Wallace, ... 2023 IEEE International Integrated Reliability Workshop (IIRW), 1-5, 2023 | 1 | 2023 |
| Summary of Recent Total Ionizing Dose Testing on GF 12LP CMOS Technology. H Barnaby, T Wallace, MJ Marinella, J Neuendank, D Wilson, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2022 | | 2022 |
| Total Ionizing Dose Response of Commercial 22nm FD-SOI CMOS Technology J Solano, M Spear, T Wallace, D Wilson, O Forman, IS Esqueda, ... 2022 IEEE Radiation Effects Data Workshop (REDW)(in conjunction with 2022 …, 2022 | | 2022 |
| Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits. M Spear, T Wallace, D Wilson, J Solano, G Irumva, IS Esqueda, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States); Sandia …, 2022 | | 2022 |
| Layout Dependence of Total Ionizing Dose Effects on 12-nm Bulk FinFET Digital Structures. T Wallace, M Spear, A Privat, J Neuendank, G Irumva, D Wilson, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States); Sandia …, 2022 | | 2022 |
| Total ionizing dose and single event effects on 12-nm bulk FinFETs. D Wilson, M Spear, T Wallace, G Irumva, J Neuendank, I Sanchez, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2022 | | 2022 |
| Characterization of Total Ionixing Dose Effects in 12nm FinFET Technology with 60keV X-Rays. M Spear, H Barnaby, J Neuendank, T Wallace Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2022 | | 2022 |
