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Justin H Chow
Justin H Chow
在 gatech.edu 的电子邮件经过验证
标题
引用次数
引用次数
年份
A bio-enabled maximally mild layer-by-layer Kapton surface modification approach for the fabrication of all-inkjet-printed flexible electronic devices
Y Fang, JGD Hester, W Su, JH Chow, SK Sitaraman, MM Tentzeris
Scientific reports 6 (1), 39909, 2016
412016
Study of intermetallic growth and kinetics in fine-pitch lead-free solder bumps for next-generation flip-chip assemblies
Y Tian, J Chow, X Liu, YP Wu, SK Sitaraman
Journal of electronic materials 42, 230-239, 2013
362013
Twist Testing for Flexible Electronics
JH Chow, J Meth, SK Sitaraman
2019 IEEE 69th Electronic Components and Technology Conference (ECTC), 785-791, 2019
222019
Experimental evaluation of SnAgCu solder joint reliability in 100-μm pitch flip-chip assemblies
Y Tian, X Liu, J Chow, YP Wu, SK Sitaraman
Microelectronics Reliability 54 (5), 939-944, 2014
212014
Study of Wearables with Embedded Electronics Through Experiments and Simulations
JH Chow, SK Sitaraman, C May, J May
2018 IEEE 68th Electronic Components and Technology Conference (ECTC), 814-821, 2018
202018
Comparison of Sn-Ag-Cu solder alloy intermetallic compound growth under different thermal excursions for fine-pitch flip-chip assemblies
Y Tian, X Liu, J Chow, YP Wu, SK Sitaraman
Journal of electronic materials 42, 2724-2731, 2013
172013
Mechanical and Electrical Behavior of Printed Silver Conductor in Adaptive Curvature Flexure Test
R Chen, JH Chow, C Taylor, J Meth, SK Sitaraman
IEEE Transactions on Components, Packaging and Manufacturing Technology 10 …, 2020
162020
Cyclic Bending Effects on Resistance of Screen-Printed Silver Conductors
R Chen, JH Chow, Y Zhou, JS Meth, SK Sitaraman
IEEE Transactions on Components, Packaging and Manufacturing Technology 11 …, 2021
152021
Adaptive Curvature Flexure Test to Assess Flexible Electronic Systems
R Chen, J Chow, C Taylor, J Meth, S Sitaraman
2018 IEEE 68th Electronic Components and Technology Conference (ECTC), 236-242, 2018
142018
The size effect on intermetallic microstructure evolution of critical solder joints for flip chip assemblies
Y Tian, J Chow, X Liu, SK Sitaraman
Soldering & Surface Mount Technology 27 (4), 178-184, 2015
112015
Effect of Dissolved Nitrogen Gas on the Density of Di-2-Ethylhexyl Sebacate: Working Fluid of the NIST Oil Ultrasonic Interferometer Manometer Pressure Standard
JH Hendricks, JR Ricker, JH Chow, DA Olson
NCSLI Measure 4 (2), 52-59, 2009
92009
Electroplated Copper Nanowires as Thermal Interface Materials
J Chow, SK Sitaraman
2016 15th IEEE Intersociety Conference on Thermal and Thermomechanical …, 2016
82016
Damage Evolution of Double-Sided Copper Conductor on Multi-layer Flexible Substrate Under Bending
R Chen, J Chow, SK Sitaraman
2022 IEEE 72nd Electronic Components and Technology Conference (ECTC), 729-738, 2022
52022
Study of wearables with embedded electronics through experiments and simulations 2018 IEEE 68th Electronic Components and Technology Conf.(ECTC)
JH Chow, SK Sitaraman, C May, J May
IEEE, 2018
52018
Comparison of IMC growth in flip-chip assemblies with 100-and 200-μm-pitch SAC305 solder joints
Y Tian, X Liu, J Chow, YP Wu, SK Sitaraman
2013 IEEE 63rd Electronic Components and Technology Conference, 1005-1009, 2013
52013
Anomalous behavior of Teflon-based helium permeation leak standards
PJ Abbott, JH Chow
NCSLI Measure 2 (3), 24-32, 2007
32007
Mandrel Bend Test of Screen-Printed Silver Conductors
R Chen, J Chow, Y Zhou, SK Sitaraman
Journal of Electronic Packaging 145 (3), 031004, 2023
22023
A Monobit Built-In Test and Diagnostic System for Flexible Electronic Interconnect
JY Lei, T Moon, J Chow, SK Sitaraman, A Chatterjee
2018 IEEE 27th Asian Test Symposium (ATS), 191-196, 2018
12018
Experimental and Modeling Study of RF Performance of a Screen-Printed Coplanar Waveguide (CPW) up to 20 GHz under Monotonic Stretching
Y Zhou, JH Chow, MM Tentzeris, SK Sitaraman
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2024
2024
The Resistor Network Approach to Modeling Screen-Printed Silver Ink Under Uniaxial Stretch
JH Chow, SK Sitaraman
Journal of Electronic Packaging 145 (4), 2023
2023
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