High-speed imaging upgrade for a standard sample scanning atomic force microscope using small cantilevers JD Adams, A Nievergelt, BW Erickson, C Yang, M Dukic, GE Fantner Review of Scientific Instruments 85 (9), 2014 | 59 | 2014 |
Charge controller with decoupled and self-compensating configurations for linear operation of piezoelectric actuators in a wide bandwidth C Yang, C Li, F Xia, Y Zhu, J Zhao, K Youcef-Toumi IEEE Transactions on Industrial Electronics 66 (7), 5392-5402, 2018 | 36 | 2018 |
Modeling and control of piezoelectric hysteresis: A polynomial-based fractional order disturbance compensation approach C Yang, N Verbeek, F Xia, Y Wang, K Youcef-Toumi IEEE Transactions on Industrial Electronics 68 (4), 3348-3358, 2020 | 34 | 2020 |
Integrated locomotion and deformation of a magnetic soft robot: Modeling, control, and experiments F Kong, Y Zhu, C Yang, H Jin, J Zhao, H Cai IEEE Transactions on Industrial Electronics 68 (6), 5078-5087, 2020 | 32 | 2020 |
Design of a high‐bandwidth tripod scanner for high speed atomic force microscopy C Yang, J Yan, M Dukic, N Hosseini, J Zhao, GE Fantner Scanning 38 (6), 889-900, 2016 | 29 | 2016 |
A nonlinear charge controller with tunable precision for highly linear operation of piezoelectric stack actuators C Yang, C Li, J Zhao IEEE Transactions on Industrial Electronics 64 (11), 8618-8625, 2017 | 28 | 2017 |
Probing the morphology and evolving dynamics of 3D printed nanostructures using high-speed atomic force microscopy C Yang, R Winkler, M Dukic, J Zhao, H Plank, GE Fantner ACS applied materials & interfaces 9 (29), 24456-24461, 2017 | 27 | 2017 |
Principle, implementation, and applications of charge control for piezo-actuated nanopositioners: A comprehensive review C Yang, K Youcef-Toumi Mechanical Systems and Signal Processing 171, 108885, 2022 | 25 | 2022 |
A modular low-cost atomic force microscope for precision mechatronics education F Xia, J Quigley, X Zhang, C Yang, Y Wang, K Youcef-Toumi Mechatronics 76, 102550, 2021 | 22 | 2021 |
Hierarchical antidisturbance control of a piezoelectric stage via combined disturbance observer and error-based ADRC C Yang, Y Wang, K Youcef-Toumi IEEE Transactions on Industrial Electronics 69 (5), 5060-5070, 2021 | 21 | 2021 |
Digitally controlled analog proportional-integral-derivative (PID) controller for high-speed scanning probe microscopy M Dukic, V Todorov, S Andany, AP Nievergelt, C Yang, N Hosseini, ... Review of Scientific Instruments 88 (12), 2017 | 20 | 2017 |
Comprehensive study of charge-based motion control for piezoelectric nanopositioners: Modeling, instrumentation and controller design C Yang, F Xia, Y Wang, K Youcef-Toumi Mechanical Systems and Signal Processing 166, 108477, 2022 | 17 | 2022 |
Lights out! nano-scale topography imaging of sample surface in opaque liquid environments with coated active cantilever probes F Xia, C Yang, Y Wang, K Youcef-Toumi, C Reuter, T Ivanov, M Holz, ... Nanomaterials 9 (7), 1013, 2019 | 14 | 2019 |
Feedback-assisted feedforward hysteresis compensation: A unified approach and applications to piezoactuated nanopositioners C Yang, Y Wang, K Youcef-Toumi IEEE Transactions on Industrial Electronics 68 (11), 11245-11254, 2020 | 13 | 2020 |
Bandwidth based repetitive controller design for a modular multi-actuated AFM scanner F Xia, C Yang, Y Wang, K Youcef-Toumi 2019 American Control Conference (ACC), 3776-3781, 2019 | 11 | 2019 |
Design and control of a multi-actuated nanopositioning stage with stacked structure C Yang, F Xia, Y Wang, S Truncale, K Youcef-Toumi 2019 American Control Conference (ACC), 3782-3788, 2019 | 10 | 2019 |
Design of a coordinated control strategy for multi-mobile-manipulator cooperative teleoperation system J Yan, J Zhao, C Yang, Y Zhu, L Ma, Z Chen 2012 IEEE International Conference on Mechatronics and Automation, 783-788, 2012 | 8 | 2012 |
High-speed atomic force microscopy in ultra-precision surface machining and measurement: challenges, solutions and opportunities C Yang, CQ Dang, WL Zhu, BF Ju Surface Science and Technology 1 (1), 7, 2023 | 7 | 2023 |
Statically stable charge sensing method for precise displacement estimation of piezoelectric stack-based nanopositioning C Yang, N Verbeek, F Xia, Y Wang, K Youcef-Toumi IEEE Transactions on Industrial Electronics 68 (9), 8550-8560, 2020 | 7 | 2020 |
Decoupled tracking and damping control of piezo-actuated nanopositioner enabled by multimode charge sensing C Yang, K Youcef-Toumi Mechanical Systems and Signal Processing 173, 109046, 2022 | 6 | 2022 |