Size–strain line-broadening analysis of the ceria round-robin sample D Balzar, N Audebrand, MR Daymond, A Fitch, A Hewat, JI Langford, ... Journal of Applied Crystallography 37 (6), 911-924, 2004 | 566 | 2004 |
Voigt-function modeling in Fourier analysis of size-and strain-broadened X-ray diffraction peaks D Balzar, H Ledbetter Journal of Applied Crystallography 26 (1), 97-103, 1993 | 521 | 1993 |
Voigt-function model in diffraction line-broadening analysis D Balzar Defect and microstructure analysis by diffraction, 94-126, 1999 | 302 | 1999 |
X-ray diffraction line broadening: modeling and applications to high-Tc superconductors D Balzar Journal of research of the National Institute of Standards and Technology 98 …, 1993 | 265 | 1993 |
Profile fitting of X-ray diffraction lines and Fourier analysis of broadening D Balzar Journal of applied crystallography 25 (5), 559-570, 1992 | 184 | 1992 |
An analytical approximation for a size-broadened profile given by the lognormal and gamma distributions NC Popa, D Balzar Journal of Applied Crystallography 35 (3), 338-346, 2002 | 181 | 2002 |
Internal stress storage in shape memory polymer nanocomposites K Gall, ML Dunn, Y Liu, G Stefanic, D Balzar Applied Physics Letters 85 (2), 290-292, 2004 | 180 | 2004 |
Anomalous spin–orbit torques in magnetic single-layer films W Wang, T Wang, VP Amin, Y Wang, A Radhakrishnan, A Davidson, ... Nature nanotechnology 14 (9), 819-824, 2019 | 166 | 2019 |
Silicoboron–carbonitride ceramics: A class of high-temperature, dopable electronic materials PA Ramakrishnan, YT Wang, D Balzar, L An, C Haluschka, R Riedel, ... Applied Physics Letters 78 (20), 3076-3078, 2001 | 148 | 2001 |
Structure and electronic transport properties of Si‐(B)‐C‐N ceramics AM Hermann, YT Wang, PA Ramakrishnan, D Balzar, L An, C Haluschka, ... Journal of the American Ceramic Society 84 (10), 2260-2264, 2001 | 109 | 2001 |
Reliability of the simplified integral-breadth methods in diffraction line-broadening analysis D Balzar, S Popović Journal of applied crystallography 29 (1), 16-23, 1996 | 107 | 1996 |
Defect and microstructure analysis from diffraction D Balzar, RL Snyder International union of crystallography monographs on crystallography 10, 94, 1999 | 100 | 1999 |
Nonlinear ultrasonic parameter in quenched martensitic steels DC Hurley, D Balzar, PT Purtscher, KW Hollman Journal of Applied Physics 83 (9), 4584-4588, 1998 | 99 | 1998 |
Long-distance spin transport in a disordered magnetic insulator D Wesenberg, T Liu, D Balzar, M Wu, BL Zink Nature Physics 13 (10), 987-993, 2017 | 98 | 2017 |
Elastic strain and stress determination by Rietveld refinement: generalized treatment for textured polycrystals for all Laue classes NC Popa, D Balzar Journal of applied crystallography 34 (2), 187-195, 2001 | 98 | 2001 |
Elastic properties of mullite H Ledbetter, S Kim, D Balzar, S Crudele, W Kriven Journal of the American Ceramic Society 81 (4), 1025-1028, 1998 | 95 | 1998 |
Tuning of tungsten thin film superconducting transition temperature for fabrication of photon number resolving detectors AE Lita, D Rosenberg, S Nam, AJ Miller, D Balzar, LM Kaatz, RE Schwall IEEE transactions on applied superconductivity 15 (2), 3528-3531, 2005 | 87 | 2005 |
Size-broadening anisotropy in whole powder pattern fitting. Application to zinc oxide and interpretation of the apparent crystallites in terms of physical models NC Popa, D Balzar Journal of Applied Crystallography 41 (3), 615-627, 2008 | 82 | 2008 |
Nonlinear ultrasonic assessment of precipitation hardening in ASTM A710 steel DC Hurley, D Balzar, PT Purtscher Journal of Materials Research 15 (9), 2036-2042, 2000 | 81 | 2000 |
Accurate modeling of size and strain broadening in the Rietveld refinement: The “double-Voigt” approach D Baizar, H Ledbetter Advances in X-ray Analysis 38, 397-404, 1994 | 74 | 1994 |