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Dawei Tang
Dawei Tang
Centre for Precision Technologies, University of Huddersfield
在 hud.ac.uk 的电子邮件经过验证 - 首页
标题
引用次数
引用次数
年份
On-line surface inspection using cylindrical lens–based spectral domain low-coherence interferometry
D Tang, F Gao, X Jiang
Applied optics 53 (24), 5510-5516, 2014
292014
Fringe projection profilometry method with high efficiency, precision, and convenience: theoretical analysis and development
S Lv, D Tang, X Zhang, D Yang, W Deng, Q Kemao
Optics Express 30 (19), 33515-33537, 2022
252022
Application of clustering filter for noise and outlier suppression in optical measurement of structured surfaces
S Lou, D Tang, W Zeng, T Zhang, F Gao, H Muhamedsalih, X Jiang, ...
IEEE Transactions on Instrumentation and Measurement 69 (9), 6509-6517, 2020
222020
High-accuracy simultaneous measurement of surface profile and film thickness using line-field white-light dispersive interferometer
T Guo, G Zhao, D Tang, C Sun, F Gao, X Jiang
Optics and Lasers in Engineering 137, 106388, 2021
172021
A Robust Moving Total Least-Squares Fitting Method for Measurement Data
T Gu, Y Tu, D Tang, T Luo
IEEE Transactions on Instrumentation and Measurement 69 (10), 7566-7573, 2020
152020
Robust incident angle calibration of angle-resolved ellipsometry for thin film measurement
L Peng, D Tang, J Wang, R Chen, F Gao, L Zhou
Applied Optics 60 (13), 3971-3976, 2021
132021
A trimmed moving total least-squares method for curve and surface fitting
T Gu, Y Tu, D Tang, S Lin, B Fang
Measurement Science and Technology 31 (4), 045003, 2020
132020
Curve and surface reconstruction based on MTLS algorithm combined with k-means clustering
T Gu, H Lin, D Tang, S Lin, T Luo
Measurement 182, 109737, 2021
122021
Investigation of line-scan dispersive interferometry for in-line surface metrology
D Tang
University of Huddersfield, 2016
82016
An ultra-compact metasurface-based chromatic confocal sensor
JHT Chan, D Tang, J Williamson, H Martin, AJ Henning, X Jiang
CIRP Annals 72 (1), 465-468, 2023
72023
Simultaneous film thickness and refractive index measurement using a constrained fitting method in a white light spectral interferometer
L Yuan, T Guo, D Tang, H Liu, X Guo
Optics Express 30 (1), 349-363, 2021
72021
Analysis of the synchronous phase-shifting method in a white-light spectral interferometer
T Guo, L Yuan, D Tang, Z Chen, F Gao, X Jiang
Applied optics 59 (10), 2983-2991, 2020
62020
In-situ defect detection systems for R2R flexible PV barrier films
F Gao, H Muhamedsalih, D Tang, M Elrawemi, L Blunt, X Jiang, S Edge, ...
2015 International Conference on Optical Instruments and Technology …, 2015
52015
Polarized angle-resolved spectral reflectometry for real-time ultra-thin film measurement
J Wang, L Peng, F Zhai, D Tang, F Gao, X Zhang, R Chen, L Zhou, ...
Optics Express 31 (4), 6552-6565, 2023
42023
Phase retrieval algorithm for line-scan dispersive interferometry
D Tang, P Kumar, F Gao, X Jiang
Sixth International Conference on Optical and Photonic Engineering (icOPEN …, 2018
42018
Defocus Effect Correction for Back Focal Plane Ellipsometry for Antivibration Measurement of Thin Films
J Wang, J Yang, L Peng, D Tang, F Gao, R Chen, L Zhou
Applied Sciences 13 (3), 1738, 2023
32023
Accuracy improvement of a white-light spectral interferometer using a line-by-line spectral calibration method
T Guo, G Zhao, D Tang, Q Weng, F Gao, X Jiang
Surface Topography: Metrology and Properties 8 (2), 025028, 2020
32020
In-Situ Surface Inspection Using White Light Channelled Spectrum Interferometer
X Jiang, D Tang, F Gao
15th International Conference on Metrology and Properties of Engineering …, 2015
32015
Metasurface Confocal–Enabling a Shift in Optical Instrumentation
DJ Townend, J Williamson, D Tang, N Sharma, AJ Henning, H Martin, ...
The European Conference on Lasers and Electro-Optics, ch_7_2, 2023
22023
Robust moving total least squares: A technique for the reconstruction of measurement data in the presence of multiple outliers
T Gu, H Lin, D Tang, S Lin, T Luo
Mechanical Systems and Signal Processing 167, 108542, 2022
22022
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