| Imaging spectroscopic ellipsometry of MoS2 S Funke, B Miller, E Parzinger, P Thiesen, AW Holleitner, U Wurstbauer Journal of Physics: Condensed Matter 28 (38), 385301, 2016 | 118 | 2016 |
| Fast, noncontact, wafer-scale, atomic layer resolved imaging of two-dimensional materials by ellipsometric contrast micrography P Braeuninger-Weimer, S Funke, R Wang, P Thiesen, D Tasche, W Viöl, ... ACS nano 12 (8), 8555-8563, 2018 | 43 | 2018 |
| Selective gas permeation in graphene oxide–polymer self-assembled multilayers D Pierleoni, M Minelli, S Ligi, M Christian, S Funke, N Reineking, ... ACS applied materials & interfaces 10 (13), 11242-11250, 2018 | 40 | 2018 |
| Spectroscopic imaging ellipsometry for automated search of flakes of mono-and n-layers of 2D-materials S Funke, U Wurstbauer, B Miller, A Matković, A Green, A Diebold, ... Applied Surface Science 421, 435-439, 2017 | 40 | 2017 |
| Determining the dielectric tensor of microtextured organic thin films by imaging Mueller matrix ellipsometry S Funke, M Duwe, F Balzer, PH Thiesen, K Hingerl, M Schiek The Journal of Physical Chemistry Letters 12 (12), 3053-3058, 2021 | 19 | 2021 |
| Manifold coupling mechanisms of transition metal dichalcogenides to plasmonic gold nanoparticle arrays S Diefenbach, E Parzinger, J Kiemle, J Wierzbowski, S Funke, B Miller, ... The Journal of Physical Chemistry C 122 (17), 9663-9670, 2018 | 16 | 2018 |
| The role of the dielectric environment in surface‐enhanced Raman scattering on the detection of a 4‐nitrothiophenol monolayer S Funke, H Wackerbarth Journal of Raman Spectroscopy 44 (7), 1010-1013, 2013 | 13 | 2013 |
| Imaging ellipsometry determination of the refractive index contrast and dispersion of channel waveguides inscribed by fs‐laser induced ion‐migration P Moreno‐Zarate, A Gonzalez, S Funke, A Días, B Sotillo, J del Hoyo, ... physica status solidi (a) 215 (19), 1800258, 2018 | 12 | 2018 |
| Chemical Vapor Deposition of MoS2 for Energy Harvesting: Evolution of the Interfacial Oxide Layer T Verhagen, A Rodriguez, M Vondracek, J Honolka, S Funke, ... ACS Applied Nano Materials 3 (7), 6563-6573, 2020 | 8 | 2020 |
| SERS spectroscopic evidence for the integrity of surface-deposited self-assembled coordination cages M Frank, S Funke, H Wackerbarth, GH Clever Physical Chemistry Chemical Physics 16 (40), 21930-21935, 2014 | 6 | 2014 |
| Electron beam induced changes in optical properties of glassy As35S65 chalcogenide thin films studied by imaging ellipsometry P Janicek, S Funke, PH Thiesen, S Slang, K Palka, J Mistrik, M Grinco, ... Thin Solid Films 660, 759-765, 2018 | 5 | 2018 |
| Surface enhanced vibrational spectroscopy for the detection of explosives F Büttner, J Hagemann, M Wellhausen, S Funke, C Lenth, F Rotter, ... Electro-Optical and Infrared Systems: Technology and Applications X 8896, 50-61, 2013 | 5 | 2013 |
| Spectroscopic imaging ellipsometry of self-assembled SiGe/Si nanostructures MI Alonso, S Funke, A González, M Garriga, PO Vaccaro, AR Goni, A Ruiz, ... Applied Surface Science 421, 547-552, 2017 | 2 | 2017 |
| The Dielectric Tensor of Micro-Textured Organic Thin Films Obtained by Imaging Mueller Matrix Ellipsometry F Balzer, S Funke, M Duwe, PH Thiesen, K Hingerl, M Schiek The 9th International Conference on Spectroscopic Ellipsometry, 2022 | | 2022 |
| Dielectric Tensor of Micro-Textured Organic Thin Films obtained by Imaging Mueller Matrix Ellipsometry M Schiek, S Funke, M Duwe, PH Thiesen, F Balzer, K Hingerl Female Physicists Conference 2021, 2021 | | 2021 |
| Imaging Mueller Matrix Ellipsometry of a Microtextured Squaraine Thin Film F Balzer, S Funke, M Duwe, PH Thiesen, K Hingerl, M Schiek 11th Workshop Ellipsometry, 2021 | | 2021 |
| The Dielectric Tensor of Microtextured Squaraine Thin Film obtained by Imaging Mueller Matrix Ellipsometry M Schiek, S Funke, M Duwe, PH Thiesen, K Hingerl, F Balzer Annual Meeting of DPG and DPG-Tagung (DPG Meeting) of the Condensed Matter …, 2021 | | 2021 |
| Determination of Biaxial Dielectric Tensor from Textured, Pleochroic Organic Thin Films by Imaging Mueller Matrix Ellipsometry M Schiek, F Balzer, S Funke, M Duwe, K Hingerl, PH Thiesen EMRS 2020 Spring Meeting, 2020 | | 2020 |
| Refractive Index Contrast and Wavelength Dispersion of Channel Waveguides Inscribed by fs-Laser Induced Ion-migration Revealed by Imaging Ellipsometry P Moreno-Zarate, A Gonzalez, S Funke, A Días-Ponte, B Sotillo, J Hoyo, ... CSIC-Instituto de Ciencia de Materiales de Barcelona (ICMAB), 2019 | | 2019 |
| Electron beam induced changes in optical properties of glassy As35S65 chalcogenide thin films studied by imaging ellipsometry P Janíček, S Funke, PH Thiesen, S Šlang, K Pálka, J Mistrík, M Grinco, ... Thin Solid Films, volume 660, issue: August, 2018 | | 2018 |
