| Manufacturing metrology for c-Si module reliability and durability Part III: Module manufacturing EJ Schneller, RP Brooker, NS Shiradkar, MP Rodgers, NG Dhere, ... Renewable and Sustainable Energy Reviews 59, 992-1016, 2016 | 90 | 2016 |
| Silicon heterojunction system field performance DC Jordan, C Deline, S Johnston, SR Rummel, B Sekulic, P Hacke, ... IEEE Journal of Photovoltaics 8 (1), 177-182, 2017 | 75 | 2017 |
| Manufacturing metrology for c-Si module reliability and durability Part II: Cell manufacturing KO Davis, MP Rodgers, G Scardera, RP Brooker, H Seigneur, N Mohajeri, ... Renewable and Sustainable Energy Reviews 59, 225-252, 2016 | 73 | 2016 |
| Evolution of Leakage Current Paths in MC-Si PV Modules From Leading Manufacturers Undergoing High-Voltage Bias Testing NG Dhere, NS Shiradkar, E Schneller IEEE Journal of Photovoltaics 4 (2), 654 - 658, 2014 | 48 | 2014 |
| The reliability of bypass diodes in PV modules NG Dhere, N Shiradkar, E Schneller, V Gade Reliability of photovoltaic cells, modules, components, and systems VI 8825 …, 2013 | 48 | 2013 |
| Manufacturing metrology for c-Si photovoltaic module reliability and durability, Part I: Feedstock, crystallization and wafering H Seigneur, N Mohajeri, RP Brooker, KO Davis, EJ Schneller, NG Dhere, ... Renewable and Sustainable Energy Reviews 59, 84-106, 2016 | 45 | 2016 |
| Characterization of front contact degradation in monocrystalline and multicrystalline silicon photovoltaic modules following damp heat exposure N Iqbal, DJ Colvin, EJ Schneller, TS Sakthivel, R Ristau, BD Huey, XJ Ben, ... Solar Energy Materials and Solar Cells 235, 111468, 2022 | 34 | 2022 |
| Survey of potential-induced degradation in thin-film modules P Hacke, K Terwilliger, SH Glick, G Perrin, J Wohlgemuth, S Kurtz, ... Journal of Photonics for Energy 5 (1), 2015 | 34 | 2015 |
| Degradation of copper‐plated silicon solar cells with damp heat stress J Karas, L Michaelson, K Munoz, M Jobayer Hossain, E Schneller, ... Progress in Photovoltaics: Research and Applications 28 (11), 1175-1186, 2020 | 25 | 2020 |
| A comprehensive methodology to evaluate losses and process variations in silicon solar cell manufacturing MJ Hossain, G Gregory, EJ Schneller, AM Gabor, AL Blum, Z Yang, ... IEEE Journal of Photovoltaics 9 (5), 1350-1359, 2019 | 25 | 2019 |
| Crystalline silicon device loss analysis through spatially resolved quantum efficiency measurements EJ Schneller, K Öğütman, S Guo, WV Schoenfeld, KO Davis IEEE Journal of Photovoltaics 7 (4), 957-965, 2017 | 25 | 2017 |
| Quantitative analysis of crystalline silicon wafer PV modules by electroluminescence imaging S Guo, E Schneller, KO Davis, WV Schoenfeld 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC), 3688-3692, 2016 | 24 | 2016 |
| Correlation of UV fluorescence images with performance loss of field-retrieved photovoltaic modules F Li, VSP Buddha, EJ Schneller, N Iqbal, DJ Colvin, KO Davis, ... IEEE Journal of Photovoltaics 11 (4), 926-935, 2021 | 23 | 2021 |
| Evaluating Solar Cell Fracture as a Function of Module Mechanical Loading Conditions EJ Schneller, AM Gabor, JL Lincoln, R Janoch, A Anselmo, J Walters, ... IEEE 43rd Photovoltaic Specialists Conference (PVSC), 2017 | 21 | 2017 |
| Impact of interconnection failure on photovoltaic module performance DJ Colvin, EJ Schneller, KO Davis Progress in Photovoltaics: Research and Applications 29 (5), 524-532, 2021 | 20 | 2021 |
| Analytic – Method and Power Loss Modes From Outdoor Time-Series – Curves M Wang, J Liu, TJ Burleyson, EJ Schneller, KO Davis, RH French, ... IEEE Journal of Photovoltaics 10 (5), 1379-1388, 2020 | 19 | 2020 |
| Effect of diamond wire saw marks on solar cell performance H Seigneur, EJ Schneller, NS Shiradkar, WV Schoenfeld Energy Procedia 92, 386-391, 2016 | 19 | 2016 |
| Predicting thermal runaway in bypass diodes in photovoltaic modules NS Shiradkar, E Schneller, NG Dhere, V Gade 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC), 3585-3588, 2014 | 18 | 2014 |
| The impact of cracked solar cells on solar panel energy delivery AM Gabor, EJ Schneller, H Seigneur, MW Rowell, D Colvin, M Hopwood, ... 2020 47th IEEE photovoltaic specialists conference (PVSC), 0810-0813, 2020 | 17 | 2020 |
| Finite element analysis based model to study the electric field distribution and leakage current in PV modules under high voltage bias N Shiradkar, E Schneller, NG Dhere Reliability of Photovoltaic Cells, Modules, Components, and Systems VI 8825 …, 2013 | 16 | 2013 |
Kristopher O. DavisUniversity of Central Florida在 ucf.edu 的电子邮件经过验证
