| Scaled, Ferroelectric Memristive Synapse for Back‐End‐of‐Line Integration with Neuromorphic Hardware L Bégon‐Lours, M Halter, FM Puglisi, L Benatti, DF Falcone, Y Popoff, ... Advanced Electronic Materials 8 (6), 2101395, 2022 | 25 | 2022 |
| Effect of cycling on ultra-thin HfZrO4, ferroelectric synaptic weights L Bégon-Lours, M Halter, M Sousa, Y Popoff, DD Pineda, DF Falcone, ... Neuromorphic Computing and Engineering 2 (2), 024001, 2022 | 14 | 2022 |
| A hybrid cmos-memristor spiking neural network supporting multiple learning rules D Florini, D Gandolfi, J Mapelli, L Benatti, P Pavan, FM Puglisi IEEE Transactions on Neural Networks and Learning Systems 35 (4), 5117-5129, 2022 | 11 | 2022 |
| Combining experiments and a novel small signal model to investigate the degradation mechanisms in ferroelectric tunnel junctions L Benatti, P Pavan, FM Puglisi 2022 IEEE International Reliability Physics Symposium (IRPS), P6-1-P6-5, 2022 | 4 | 2022 |
| Understanding the reliability of ferroelectric tunnel junction operations using an advanced small-signal model L Benatti, FM Puglisi 2021 IEEE International Integrated Reliability Workshop (IIRW), 1-6, 2021 | 4 | 2021 |
| Impedance investigation of MIFM ferroelectric tunnel junction using a comprehensive small-signal model L Benatti, FM Puglisi IEEE Transactions on Device and Materials Reliability 22 (3), 332-339, 2022 | 3 | 2022 |
| Ultra-low power logic in memory with commercial grade memristors and FPGA-based smart-IMPLY architecture L Benatti, T Zanotti, P Pavan, FM Puglisi Microelectronic Engineering 280, 112062, 2023 | 2 | 2023 |
| Biologically plausible information propagation in a complementary metal-oxide semiconductor integrate-and-fire artificial neuron circuit with memristive synapses L Benatti, T Zanotti, D Gandolfi, J Mapelli, FM Puglisi Nano Futures 7 (2), 025003, 2023 | 2 | 2023 |
| The role of defects and interface degradation on ferroelectric HZO capacitors aging L Benatti, S Vecchi, M Pesic, FM Puglisi 2023 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2023 | 2 | 2023 |
| Impedance spectroscopy of ferroelectric capacitors and ferroelectric tunnel junctions L Benatti, S Vecchi, FM Puglisi 2022 IEEE International Integrated Reliability Workshop (IIRW), 1-6, 2022 | 2 | 2022 |
| Linking the intrinsic electrical response of ferroelectric devices to material properties by means of impedance spectroscopy L Benatti, S Vecchi, FM Puglisi IEEE Transactions on Device and Materials Reliability 23 (3), 309-316, 2023 | 1 | 2023 |
| Information Transfer in Neuronal Circuits: From Biological Neurons to Neuromorphic Electronics D Gandolfi, L Benatti, T Zanotti, GM Boiani, A Bigiani, FM Puglisi, ... Intelligent Computing 3, 0059, 2024 | | 2024 |
| 2023 Index IEEE Transactions on Device and Materials Reliability Vol. 23 A Amin, T An, S Ananiev, YE Aras, G Arutchelvan, RN Asli, Y Avenas, ... IEEE Transactions on Device and Materials Reliability 23 (4), 2023 | | 2023 |
| Biologically Plausible Information Propagation in a CMOS Integrate-and-Fire Artificial Neuron Circuit with Memristive Synapses L Benatti, T Zanotti, D Gandolfi, J Mapelli, FM Puglisi NANO FUTURES 7 (2), 1-8, 2023 | | 2023 |
| 2022 Index IEEE Transactions on Device and Materials Reliability Vol. 22 B Arunachalam, RN Asli, L Atzeni, T Aytug, H Aziza, N Bagga, Y Ban, ... IEEE Transactions on Device and Materials Reliability 22 (4), 2022 | | 2022 |
| COMMERCIAL-GRADE PACKAGED RESISTIVE MEMORIES FOR ULTRA-LOW POWER LOGIC: CHARACTERIZATION AND PERFORMANCE EVALUATION L BENATTI | | 2020 |
| SPECIAL SECTION ON IIRW L Benatti, S Vecchi, FM Puglisi | | |
| Optimization of the injection beam line at the Cooler Synchrotron COSY using Bayesian Optimization L Benatti, T Zanotti, D Gandolfi | | |
| SPECIAL SECTION ON IIRW FV Sharov, SJ Moxim, GS Haase, DR Hughart, CG McKay, PM Lenahan, ... | | |
