| A comparative analysis of behavioral models for RF power amplifiers M Isaksson, D Wisell, D Ronnow IEEE transactions on microwave theory and techniques 54 (1), 348-359, 2006 | 491 | 2006 |
| Recent advances in electrochromics for smart windows applications CG Granqvist, A Azens, A Hjelm, L Kullman, GA Niklasson, D Rönnow, ... Solar energy 63 (4), 199-216, 1998 | 413 | 1998 |
| Wide-band dynamic modeling of power amplifiers using radial-basis function neural networks M Isaksson, D Wisell, D Ronnow IEEE Transactions on Microwave Theory and Techniques 53 (11), 3422-3428, 2005 | 197 | 2005 |
| Towards the smart window: progress in electrochromics CG Granqvist, A Azens, J Isidorsson, M Kharrazi, L Kullman, T Lindström, ... Journal of non-crystalline solids 218, 273-279, 1997 | 151 | 1997 |
| Behavioral modeling and linearization of crosstalk and memory effects in RF MIMO transmitters S Amin, PN Landin, P Händel, D Rönnow IEEE transactions on microwave theory and techniques 62 (4), 810-823, 2014 | 122 | 2014 |
| Single-beam integrating sphere spectrophotometer for reflectance and transmittance measurements versus angle of incidence in the solar wavelength range on diffuse and specular … P Nostell, A Roos, D Rönnow Review of scientific instruments 70 (5), 2481-2494, 1999 | 80 | 1999 |
| Measuring Volterra kernels of analog-to-digital converters using a stepped three-tone scan N Bjorsell, P Suchánek, P Handel, D Ronnow IEEE Transactions on Instrumentation and measurement 57 (4), 666-671, 2008 | 58 | 2008 |
| A technique to extend the bandwidth of an RF power amplifier test bed D Wisell, D Ronnow, P Handel IEEE Transactions on Instrumentation and Measurement 56 (4), 1488-1494, 2007 | 56 | 2007 |
| A parameter‐reduced Volterra model for dynamic RF power amplifier modeling based on orthonormal basis functions M Isaksson, D Rönnow International Journal of RF and Microwave Computer‐Aided Engineering: Co …, 2007 | 49 | 2007 |
| Design review of an instrument for spectroscopic total integrated light scattering measurements in the visible wavelength region D Rönnow, E Veszelei Review of scientific instruments 65 (2), 327-334, 1994 | 42 | 1994 |
| A Kautz-Volterra behavioral model for RF power amplifiers M Isaksson, D Ronnow 2006 IEEE MTT-S International Microwave Symposium Digest, 485-488, 2006 | 41 | 2006 |
| Nonlinear behavioral modeling of power amplifiers using radial-basis function neural networks M Isaksson, D Wisell, D Ronnow IEEE MTT-S International Microwave Symposium Digest, 2005., 1967-1970, 2005 | 41 | 2005 |
| Diffuse reflectance and transmittance spectra of an interference layer: 1. Model formulation and properties A Roos, D Rönnow Applied optics 33 (34), 7908-7917, 1994 | 37 | 1994 |
| Three-tone characterization of nonlinear memory effects in radio-frequency power amplifiers D Ronnow, D Wisell, M Isaksson IEEE Transactions on Instrumentation and Measurement 56 (6), 2646-2657, 2007 | 36 | 2007 |
| Characterization of memory effects in power amplifiers using digital two-tone measurements DH Wisell, BÖ Rudlund, D Ronnow IEEE Transactions on Instrumentation and Measurement 56 (6), 2757-2766, 2007 | 36 | 2007 |
| Optical anisotropy of (001)-GaAs surface quantum wells LF Lastras-Martinez, D Rönnow, PV Santos, M Cardona, K Eberl Physical Review B 64 (24), 245303, 2001 | 34 | 2001 |
| Application of reflectance spectrophotometry to the study of copper (I) oxides (Cu2O and Cu3O2) on metallic substrate B Lefez, K Kartouni, M Lenglet, D Rönnow, CG Ribbing Surface and interface analysis 22 (1‐12), 451-455, 1994 | 34 | 1994 |
| Digital predistortion of radio frequency power amplifiers using Kautz-Volterra model D Rönnow, M Isaksson Electronics Letters 42 (13), 1, 2006 | 33 | 2006 |
| Surface roughness of sputtered films studied by atomic force microscopy and spectroscopic light scattering D Rönnow, J Isidorsson, GA Niklasson Physical Review E 54 (4), 4021, 1996 | 33 | 1996 |
| Characterization of concurrent dual-band power amplifiers using a dual two-tone excitation signal S Amin, W Van Moer, P Händel, D Rönnow IEEE Transactions on Instrumentation and Measurement 64 (10), 2781-2791, 2015 | 30 | 2015 |
Magnus IsakssonProfessor of electronics, University of Gävle在 hig.se 的电子邮件经过验证
