Dark-field X-ray microscopy for multiscale structural characterization H Simons, A King, W Ludwig, C Detlefs, W Pantleon, S Schmidt, F Stöhr, ... Nature communications 6 (1), 6098, 2015 | 262 | 2015 |
Electric-field-induced strain mechanisms in lead-free 94%(Bi1/2Na1/2) TiO3–6% BaTiO3 H Simons, J Daniels, W Jo, R Dittmer, A Studer, M Avdeev, J Rödel, ... Applied Physics Letters 98 (8), 2011 | 168 | 2011 |
A High‐Temperature‐Capacitor Dielectric Based on K0.5Na0.5NbO3‐Modified Bi1/2Na1/2TiO3–Bi1/2K1/2TiO3 R Dittmer, EM Anton, W Jo, H Simons, JE Daniels, M Hoffman, J Pokorny, ... Journal of the American Ceramic Society 95 (11), 3519-3524, 2012 | 139 | 2012 |
Long-range symmetry breaking in embedded ferroelectrics H Simons, AB Haugen, AC Jakobsen, S Schmidt, F Stöhr, M Majkut, ... Nature materials 17 (9), 814-819, 2018 | 103 | 2018 |
Dislocation-toughened ceramics L Porz, AJ Klomp, X Fang, N Li, C Yildirim, C Detlefs, E Bruder, M Höfling, ... Materials Horizons 8 (5), 1528-1537, 2021 | 83 | 2021 |
Origin of large recoverable strain in 0.94 (Bi0. 5Na0. 5) TiO3-0.06 BaTiO3 near the ferroelectric-relaxor transition H Simons, JE Daniels, J Glaum, AJ Studer, JL Jones, M Hoffman Applied Physics Letters 102 (6), 2013 | 79 | 2013 |
Dual strain mechanisms in a lead-free morphotropic phase boundary ferroelectric J Walker, H Simons, DO Alikin, AP Turygin, VY Shur, AL Kholkin, H Ursic, ... Scientific reports 6 (1), 19630, 2016 | 70 | 2016 |
X-ray diffraction microscopy based on refractive optics HF Poulsen, AC Jakobsen, H Simons, SR Ahl, PK Cook, C Detlefs Journal of Applied Crystallography 50 (5), 1441-1456, 2017 | 64 | 2017 |
The ESRF dark-field x-ray microscope at ID06 M Kutsal, P Bernard, G Berruyer, PK Cook, R Hino, AC Jakobsen, ... IOP conference series: Materials science and engineering 580 (1), 012007, 2019 | 61 | 2019 |
Tailoring the Piezoelectric and Relaxor Properties of (Bi1/2Na1/2)TiO3–BaTiO3 via Zirconium Doping J Glaum, H Simons, M Acosta, M Hoffman Journal of the American Ceramic Society 96 (9), 2881-2886, 2013 | 57 | 2013 |
Multiscale 3D characterization with dark-field x-ray microscopy H Simons, AC Jakobsen, SR Ahl, C Detlefs, HF Poulsen Mrs Bulletin 41 (6), 454-459, 2016 | 56 | 2016 |
Conceptual framework for dislocation-modified conductivity in oxide ceramics deconvoluting mesoscopic structure, core, and space charge exemplified for SrTiO3 L Porz, T Frömling, A Nakamura, N Li, R Maruyama, K Matsunaga, ... ACS nano 15 (6), 9355-9367, 2020 | 54 | 2020 |
Mapping of individual dislocations with dark-field X-ray microscopy AC Jakobsen, H Simons, W Ludwig, C Yildirim, H Leemreize, L Porz, ... Journal of Applied Crystallography 52 (1), 122-132, 2019 | 54 | 2019 |
Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics S Gorfman, H Simons, T Iamsasri, S Prasertpalichat, DP Cann, H Choe, ... Scientific reports 6 (1), 20829, 2016 | 48 | 2016 |
Temperature dependent piezoelectric response and strain–electric-field hysteresis of rare-earth modified bismuth ferrite ceramics J Walker, H Ursic, A Bencan, B Malic, H Simons, I Reaney, G Viola, ... Journal of Materials Chemistry C 4 (33), 7859-7868, 2016 | 47 | 2016 |
Domain fragmentation during cyclic fatigue in 94%(Bi1/2Na1/2) TiO3-6% BaTiO3 H Simons, J Glaum, JE Daniels, AJ Studer, A Liess, J Rödel, M Hoffman Journal of applied physics 112 (4), 2012 | 45 | 2012 |
Multilayer Laue lenses at high X-ray energies: performance and applications KT Murray, AF Pedersen, I Mohacsi, C Detlefs, AJ Morgan, M Prasciolu, ... Optics express 27 (5), 7120-7138, 2019 | 40 | 2019 |
Ultra-low-angle boundary networks within recrystallizing grains SR Ahl, H Simons, YB Zhang, C Detlefs, F Stöhr, AC Jakobsen, ... Scripta Materialia 139, 87-91, 2017 | 38 | 2017 |
In situ visualization of long-range defect interactions at the edge of melting LE Dresselhaus-Marais, G Winther, M Howard, A Gonzalez, SR Breckling, ... Science Advances 7 (29), eabe8311, 2021 | 35 | 2021 |
Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes C Chen, T Zhou, DL Danilov, L Gao, S Benning, N Schön, S Tardif, ... Nature communications 11 (1), 3283, 2020 | 34 | 2020 |