| An integrated analog/digital random noise source WT Holman, JA Connelly, AB Dowlatabadi IEEE Transactions on Circuits and Systems I: Fundamental Theory and …, 1997 | 253 | 1997 |
| Characterization of digital single event transient pulse-widths in 130-nm and 90-nm CMOS technologies B Narasimham, BL Bhuva, RD Schrimpf, LW Massengill, MJ Gadlage, ... IEEE Transactions on Nuclear Science 54 (6), 2506-2511, 2007 | 228 | 2007 |
| On-chip characterization of single-event transient pulsewidths B Narasimham, V Ramachandran, BL Bhuva, RD Schrimpf, AF Witulski, ... IEEE Transactions on Device and Materials Reliability 6 (4), 542-549, 2006 | 172 | 2006 |
| A compact low noise operational amplifier for a 1.2/spl mu/m digital cmos technology WT Holman, JA Connelly IEEE Journal of Solid-State Circuits 30 (6), 710-714, 1995 | 153 | 1995 |
| Layout technique for single-event transient mitigation via pulse quenching NM Atkinson, AF Witulski, WT Holman, JR Ahlbin, BL Bhuva, ... IEEE Transactions on Nuclear Science 58 (3), 885-890, 2011 | 124 | 2011 |
| Technology scaling and soft error reliability LW Massengill, BL Bhuva, WT Holman, ML Alles, TD Loveless 2012 IEEE International Reliability Physics Symposium (IRPS), 3C. 1.1-3C. 1.7, 2012 | 107 | 2012 |
| Effects of guard bands and well contacts in mitigating long SETs in advanced CMOS processes B Narasimham, BL Bhuva, RD Schrimpf, LW Massengill, MJ Gadlage, ... IEEE Transactions on Nuclear Science 55 (3), 1708-1713, 2008 | 79 | 2008 |
| A comparison of the SEU response of planar and FinFET D flip-flops at advanced technology nodes P Nsengiyumva, DR Ball, JS Kauppila, N Tam, M McCurdy, WT Holman, ... IEEE Transactions on nuclear science 63 (1), 266-272, 2016 | 74 | 2016 |
| A probabilistic analysis technique applied to a radiation-hardened-by-design voltage-controlled oscillator for mixed-signal phase-locked loops TD Loveless, LW Massengill, BL Bhuva, WT Holman, MC Casey, ... IEEE Transactions on Nuclear Science 55 (6), 3447-3455, 2008 | 67 | 2008 |
| Effect of multiple-transistor charge collection on single-event transient pulse widths JR Ahlbin, MJ Gadlage, NM Atkinson, B Narasimham, BL Bhuva, ... IEEE Transactions on Device and Materials Reliability 11 (3), 401-406, 2011 | 66 | 2011 |
| Effect of transistor density and charge sharing on single-event transients in 90-nm bulk CMOS NM Atkinson, JR Ahlbin, AF Witulski, NJ Gaspard, WT Holman, BL Bhuva, ... IEEE Transactions on Nuclear Science 58 (6), 2578-2584, 2011 | 60 | 2011 |
| On-chip measurement of single-event transients in a 45 nm silicon-on-insulator technology TD Loveless, JS Kauppila, S Jagannathan, DR Ball, JD Rowe, ... IEEE Transactions on Nuclear Science 59 (6), 2748-2755, 2012 | 59 | 2012 |
| Analysis of bulk FinFET structural effects on single-event cross sections P Nsengiyumva, LW Massengill, ML Alles, BL Bhuva, DR Ball, ... IEEE Transactions on Nuclear Science 64 (1), 441-448, 2016 | 58 | 2016 |
| IP protection for VLSI designs via watermarking of routes N Narayan, RD Newbould, JD Carothers, JJ Rodriguez, WT Holman Proceedings 14th Annual IEEE International ASIC/SOC Conference (IEEE Cat. No …, 2001 | 56 | 2001 |
| A generalized linear model for single event transient propagation in phase-locked loops TD Loveless, LW Massengill, WT Holman, BL Bhuva, D McMorrow, ... IEEE Transactions on Nuclear Science 57 (5), 2933-2947, 2010 | 55 | 2010 |
| Differential analog layout for improved ASET tolerance AT Kelly, PR Fleming, WT Holman, AF Witulski, BL Bhuva, LW Massengill IEEE Transactions on Nuclear Science 54 (6), 2053-2059, 2007 | 43 | 2007 |
| Impact of well structure on single-event well potential modulation in bulk CMOS NJ Gaspard, AF Witulski, NM Atkinson, JR Ahlbin, WT Holman, BL Bhuva, ... IEEE Transactions on Nuclear Science 58 (6), 2614-2620, 2011 | 42 | 2011 |
| Total dose and single event transients in linear voltage regulators AT Kelly, PC Adell, AF Witulski, WT Holman, RD Schrimpf, V Pouget IEEE Transactions on nuclear science 54 (4), 1327-1334, 2007 | 37 | 2007 |
| Modeling total-dose effects for a low-dropout voltage regulator V Ramachandran, B Narasimham, DM Fleetwood, RD Schrimpf, ... IEEE transactions on nuclear science 53 (6), 3223-3231, 2006 | 36 | 2006 |
| Design technique for mitigation of soft errors in differential switched-capacitor circuits PR Fleming, BD Olson, WT Holman, BL Bhuva, LW Massengill IEEE Transactions on Circuits and Systems II: Express Briefs 55 (9), 838-842, 2008 | 35 | 2008 |
