| InAs0. 85Sb0. 15 infrared photodiodes grown on GaAs and GaAs‐coated Si by molecular beam epitaxy W Dobbelaere, J De Boeck, P Heremans, R Mertens, G Borghs, W Luyten, ... Applied Physics Letters 60 (26), 3256-3258, 1992 | 56 | 1992 |
| InAsSb light emitting diodes and their applications to infra-red gas sensors W Dobbelaere, J De Boeck, C Bruynserede, R Mertens, G Borghs Electronics Letters 10 (29), 890-891, 1993 | 52 | 1993 |
| Growth and optical characterization of InAs1−xSbx(0≤x≤1) on GaAs and on GaAs‐coated Si by molecular beam epitaxy W Dobbelaere, J De Boeck, G Borghs Applied physics letters 55 (18), 1856-1858, 1989 | 50 | 1989 |
| AlGaAs/GaAs multiple quantum well reflection modulators grown on Si substrates W Dobbelaere, D Huang, MS Ünlü, H Morkoc Applied physics letters 53 (2), 94-96, 1988 | 45 | 1988 |
| Optical transitions involving unconfined energy states in As/GaAs multiple quantum wells G Ji, W Dobbelaere, D Huang, H Morkoc Physical Review B 39 (5), 3216, 1989 | 42 | 1989 |
| InAs p‐n diodes grown on GaAs and GaAs‐coated Si by molecular beam epitaxy W Dobbelaere, J De Boeck, P Heremans, R Mertens, G Borghs, W Luyten, ... Applied physics letters 60 (7), 868-870, 1992 | 35 | 1992 |
| Effective DC fault models and testing approach for open defects in analog circuits B Esen, A Coyette, G Gielen, W Dobbelaere, R Vanhooren 2016 IEEE International Test Conference (ITC), 1-9, 2016 | 31 | 2016 |
| Analog fault coverage improvement using final-test dynamic part average testing W Dobbelaere, R Vanhooren, W De Man, K Matthijs, A Coyette, B Esen, ... 2016 IEEE International Test Conference (ITC), 1-9, 2016 | 26 | 2016 |
| GaInAs/GaAs strained layer MQW electroabsorption optical modulator and self-electro-optic effect device W Dobbelaere, S Kalem, D Huang, MS Ünlü, H Morkoc Electronics Letters 24 (5), 295-297, 1988 | 25 | 1988 |
| Design and test of analog circuits towards sub-ppm level G Gielen, W Dobbelaere, R Vanhooren, A Coyette, B Esen 2014 International Test Conference, 1-2, 2014 | 24 | 2014 |
| Automated testing of mixed-signal integrated circuits by topology modification A Coyette, B Esen, R Vanhooren, W Dobbelaere, G Gielen 2015 IEEE 33rd VLSI Test Symposium (VTS), 1-6, 2015 | 22 | 2015 |
| Optimization of analog fault coverage by exploiting defect-specific masking A Coyette, G Gielen, R Vanhooren, W Dobbelaere 2014 19th IEEE European Test Symposium (ETS), 1-6, 2014 | 21 | 2014 |
| Optical characterization of Si‐doped InAs1− xSbx grown on GaAs and GaAs‐coated Si by molecular‐beam epitaxy W Dobbelaere, J De Boeck, P Van Mieghem, R Mertens, G Borghs Journal of applied physics 69 (4), 2536-2542, 1991 | 21 | 1991 |
| Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs W Dobbelaere, F Colle, A Coyette, R Vanhooren, N Xama, J Gomez, ... 2019 IEEE International Test Conference (ITC), 1-4, 2019 | 18 | 2019 |
| Monolithic integration of InAs photodiode and GaAs MESFET W Dobbelaere, W De Raedt, J De Boeck, R Mertens, G Borghs Electronics Letters 28 (4), 372-374, 1992 | 18 | 1992 |
| Growth and structural characterization of embedded InAsSb on GaAs‐coated patterned silicon by molecular beam epitaxy J De Boeck, W Dobbelaere, J Vanhellemont, R Mertens, G Borghs Applied physics letters 58 (9), 928-930, 1991 | 18 | 1991 |
| Automatic generation of test infrastructures for analog integrated circuits by controllability and observability co-optimization A Coyette, B Esen, W Dobbelaere, R Vanhooren, G Gielen Integration 55, 393-400, 2016 | 15 | 2016 |
| Automatic testing of analog ICs for latent defects using topology modification N Xama, A Coyette, B Esen, W Dobbelaere, R Vanhooren, G Gielen 2017 22nd IEEE European Test Symposium (ETS), 1-6, 2017 | 13 | 2017 |
| GaInAs/GaAs multiple quantum well reflection modulators W Dobbelaere, D Huang, S Kalem, H Morkoc Electronics Letters 24 (19), 1239-1241, 1988 | 12 | 1988 |
| Recent trends and perspectives on defect-oriented testing P Bernardi, R Cantoro, A Coyette, W Dobbeleare, M Fieback, A Floridia, ... 2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022 | 11 | 2022 |
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