| STEM imaging with beam-induced hole and secondary electron currents WA Hubbard, M Mecklenburg, HL Chan, BC Regan Physical Review Applied 10 (4), 044066, 2018 | 50 | 2018 |
| Imaging dielectric breakdown in valence change memory WA Hubbard, JJ Lodico, HL Chan, M Mecklenburg, BC Regan Advanced Functional Materials 32 (2), 2102313, 2022 | 25 | 2022 |
| Unfolding the band structure of non-crystalline photonic band gap materials S Tsitrin, EP Williamson, T Amoah, G Nahal, HL Chan, M Florescu, W Man Scientific Reports 5 (1), 13301, 2015 | 19 | 2015 |
| Irreversibility at macromolecular scales in the flake graphite of the lithium-ion battery anode JJ Lodico, CH Lai, M Woodall, HL Chan, E Garcia, WA Hubbard, B Dunn, ... Journal of power sources 436, 226841, 2019 | 18 | 2019 |
| Electron-transparent thermoelectric coolers demonstrated with nanoparticle and condensation thermometry WA Hubbard, M Mecklenburg, JJ Lodico, Y Chen, XY Ling, R Patil, ... ACS nano 14 (9), 11510-11517, 2020 | 16 | 2020 |
| Operando spectral imaging of the lithium ion battery’s solid-electrolyte interphase JJ Lodico, M Mecklenburg, HL Chan, Y Chen, XY Ling, BC Regan Science advances 9 (28), eadg5135, 2023 | 9 | 2023 |
| Determining the Polarization Fraction of Thin Film Ferroelectric HZO with STEM EBIC HL Chan, SS Fields, T O'Neill, Y Chen, WA Hubbard, JF Ihlefeld, ... Microscopy and Microanalysis 28 (S1), 2270-2271, 2022 | 3 | 2022 |
| Adjusting the STEM sample holder potential for improved EBIC contrast M Mecklenburg, WA Hubbard, HL Chan, BC Regan Microscopy and Microanalysis 25 (S2), 2354-2355, 2019 | 3 | 2019 |
| Secondary electron contrast in STEM Electron Beam-Induced Current (EBIC): a path towards mapping electronic structure WA Hubbard, M Mecklenburg, HL Chan, BC Regan Microscopy and Microanalysis 24 (S1), 1846-1847, 2018 | 3 | 2018 |
| In situ optical microscopy of the electrochemical intercalation of lithium into single crystal graphite JJ Lodico, M Woodall, HL Chan, WA Hubbard, BC Regan Microscopy and Microanalysis 23 (S1), 1982-1983, 2017 | 3 | 2017 |
| Nanoscale Conductivity Mapping: Live Imaging of Dielectric Breakdown with STEM EBIC WA Hubbard, JJ Lodico, HL Chan, M Mecklenburg, BC Regan 2022 IEEE International Symposium on the Physical and Failure Analysis of …, 2022 | 2 | 2022 |
| STEM of a Single Crystal Lithium Ion Battery Anode during Electrochemical Cycling JJ Lodico, M Mecklenburg, HL Chan, WA Hubbard, BC Regan Microscopy and Microanalysis 25 (S2), 2060-2061, 2019 | 2 | 2019 |
| Separation of EBIC Modes with Two-Channel STEM EBIC WA Hubbard, HL Chan, M Mecklenburg, BC Regan Microscopy and Microanalysis 28 (S1), 2508-2509, 2022 | 1 | 2022 |
| Nano-PUND and STEM EBIC Imaging for Ferroelectric Polarization Mapping HL Chan, Y Chen, T O’Neill, SS Fields, M Lenox, JF Ihlefeld, WA Hubbard, ... Microscopy and Microanalysis 30 (Supplement_1), 2024 | | 2024 |
| Understanding Ferroelectric Polarization in Hafnium Zirconium Oxide BC Regan, Y Chen, T O’Neill, SS Fields, M Lenox, JF Ihlefeld, ... Microscopy and Microanalysis 30 (Supplement_1), ozae044. 679, 2024 | | 2024 |
| Mapping Moiré Potentials with STEM EBIC Imaging T O’Neill, E Elias, Y Chen, HL Chan, Q Shi, BC Regan Microscopy and Microanalysis 30 (Supplement_1), ozae044. 774, 2024 | | 2024 |
| Mapping Ferroelectric Fields Reveals the Origins of the Coercivity Distribution HL Chan, SS Fields, Y Chen, TP O’Neill, MK Lenox, WA Hubbard, ... ACS nano, 2024 | | 2024 |
| Mapping Conductivity in the TEM with SEEBIC WA Hubbard, HL Chan, BC Regan Microscopy and Microanalysis 29 (Supplement_1), 1851-1852, 2023 | | 2023 |
| Emission-Based Temperature Mapping with STEM EBIC WA Hubbard, M Mecklenburg, HL Chan, BC Regan Microscopy and Microanalysis 29 (Supplement_1), 1608-1609, 2023 | | 2023 |
| Spectrum Imaging of a Lithium Ion Battery Anode Using Thin Fluid Cells M Mecklenburg, JJ Lodico, HL Chan, Y Chen, XY Ling, BC Regan Microscopy and Microanalysis 29 (Supplement_1), 672-673, 2023 | | 2023 |
B.C. ReganProfessor of Physics and Astronomy, University of California, Los Angeles在 physics.ucla.edu 的电子邮件经过验证
