| Radiation hardness assurance through system-level testing: Risk acceptance, facility requirements, test methodology, and data exploitation A Coronetti, RG Alía, J Budroweit, T Rajkowski, IDC Lopes, K Niskanen, ... IEEE Transactions on Nuclear Science 68 (5), 958-969, 2021 | 26 | 2021 |
| Comparison of the total ionizing dose sensitivity of a system in package point of load converter using both component-and system-level test approaches T Rajkowski, F Saigné, K Niskanen, J Boch, T Maraine, P Kohler, P Dubus, ... Electronics 10 (11), 1235, 2021 | 12 | 2021 |
| Radiation Qualification by Means of the System-Level Testing: Opportunities and Limitations T Rajkowski, F Saigné, PX Wang Electronics 11 (3), 378, 2022 | 11 | 2022 |
| Analysis of SET propagation in a system in package point of load converter T Rajkowski, F Saigné, V Pouget, F Wrobel, A Touboul, J Boch, P Kohler, ... IEEE Transactions on Nuclear Science 67 (7), 1494-1502, 2020 | 10 | 2020 |
| TID level of failure dependence from operating configuration of the system–space class DC/DC converter case study T Rajkowski, J Boch, F Saigné, PX Wang, S Wronka, M Matusiak, ... IEEE Transactions on Nuclear Science, 2024 | | 2024 |
| System-Level Total Ionizing Dose Testing of Satellite Subsystems: EagleEye Microsatellite Case Study T Rajkowski, P Pustułka, M Bieda, S Ślasa, M Kazaniecki, K Myszka, ... Electronics 13 (1), 122, 2023 | | 2023 |
| Méthodologie de qualification des System-In-Package (SiP) soumis au rayonnement ionisant T Rajkowski | | 2020 |
| Heavy Ion-Induced SEE and 60Co TID effects testing on commercial logic devices P Kohler, A Bosser, T Rajkowski, F Saigné, PX Wang, A Sanchez, ... 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC), 1-5, 2020 | | 2020 |
| Design and verification of simulation tool for bit flipping in procesor system with 32-bit MicroBlaze processor T Rajkowski Instytut Systemów Elektronicznych, 2014 | | 2014 |
| A short range FMCW radar T Rajkowski Instytut Systemów Elektronicznych, 2010 | | 2010 |
