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Varvara Brackmann
Varvara Brackmann
Group Leader at Fraunhofer IPMS-CNT
在 ipms.fraunhofer.de 的电子邮件经过验证
标题
引用次数
引用次数
年份
Elastic softening of β-type Ti–Nb alloys by indium (In) additions
M Calin, A Helth, JJG Moreno, M Bönisch, V Brackmann, L Giebeler, ...
Journal of the mechanical behavior of biomedical materials 39, 162-174, 2014
1022014
Cu(In,Ga)Se2 superstrate solar cells: prospects and limitations
MD Heinemann, V Efimova, R Klenk, B Hoepfner, M Wollgarten, T Unold, ...
Progress in Photovoltaics: Research and Applications 23 (10), 1228-1237, 2015
642015
Enhanced performance of ultra-thin Cu (In, Ga) Se2 solar cells deposited at low process temperature
G Yin, V Brackmann, V Hoffmann, M Schmid
Solar Energy Materials and Solar Cells 132, 142-147, 2015
492015
Glow discharge optical emission spectrometry for quantitative depth profiling of CIGS thin-films
T Kodalle, D Greiner, V Brackmann, K Prietzel, A Scheu, T Bertram, ...
Journal of Analytical Atomic Spectrometry 34 (6), 1233-1241, 2019
432019
A fully integrated ferroelectric thin‐film‐transistor–influence of device scaling on threshold voltage compensation in displays
D Lehninger, M Ellinger, T Ali, S Li, K Mertens, M Lederer, R Olivio, ...
Advanced Electronic Materials 7 (6), 2100082, 2021
362021
Glow discharge plasma as a surface preparation tool for microstructure investigations
V Brackmann, V Hoffmann, A Kauffmann, A Helth, J Thomas, H Wendrock, ...
Materials characterization 91, 76-88, 2014
282014
Electrical properties of the µs pulsed glow discharge in a Grimm-type source: comparison of dc and rf modes
V Efimova, V Hoffmann, J Eckert
Journal of Analytical Atomic Spectrometry 26 (4), 784-791, 2011
262011
Sputter crater formation in the case of microsecond pulsed glow discharge in a Grimm-type source. Comparison of direct current and radio frequency modes
V Efimova, V Hoffmann, J Eckert
Spectrochimica Acta Part B: Atomic Spectroscopy 76, 181-189, 2012
232012
Combined hollow cathode vs. Grimm cell: semiconductive and nonconductive samples
A Gubal, A Ganeev, V Hoffmann, M Voronov, V Brackmann, S Oswald
Journal of Analytical Atomic Spectrometry 32 (2), 354-366, 2017
212017
Examination of growth kinetics of copper rich Cu (In, Ga) Se2-films using synchrotron energy dispersive X-ray diffractometry
T Rissom, R Mainz, CA Kaufmann, R Caballero, V Efimova, V Hoffmann, ...
Solar energy materials and solar cells 95 (1), 250-253, 2011
162011
Study in analytical glow discharge spectrometry and its application in materials science
V Efimova
152011
Elemental distribution profiling of thin films for solar cells
V Hoffmann, D Klemm, V Efimova, C Venzago, AA Rockett, T Wirth, ...
Advanced Characterization Techniques for Thin Film Solar Cells, 411-448, 2011
82011
The role of the spray pyrolysed Al2O3 barrier layer in achieving high efficiency solar cells on flexible steel substrates
SE Gledhill, A Zykov, T Rissom, R Caballero, CA Kaufmann, CH Fischer, ...
Applied Physics A 104, 407-413, 2011
72011
SEM image denoising and contour image estimation using deep learning
N Chaudhary, SA Savari, V Brackmann, M Friedrich
2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC …, 2020
32020
Influence of the dose assignment and fracturing type on patterns exposed by a variable shaped e-beam writer: simulation vs experiment
V Brackmann, M Friedrich, C Browning, N Hanisch, B Uhlig
35th European Mask and Lithography Conference (EMLC 2019) 11177, 159-168, 2019
22019
Fabrication of gate electrodes for scalable quantum computing using CMOS industry compatible e-beam lithography and numerical simulation of the resulting quantum device
Proceedings Volume 12802, 38th European Mask and Lithography Conference …, 2023
1*2023
Model-Based XPS Technique for Characterization of Surface Composition on Nano-Scale SiCOH Sidewalls
A Vatsal, M Rudolph, S Oehler, V Brackmann, JW Bartha
ECS Journal of Solid State Science and Technology 12 (12), 124001, 2023
2023
Feasibility of Wafer Exchange for European Edge AI Pilot Lines
V Brackmann, B Lilienthal-Uhlig, M Jaysnkar, S Beckx, I Madarevic, ...
Industrial Artificial Intelligence Technologies and Applications, 103, 2023
2023
Novel XPS Technique for Fluorocarbon Layer Evaluation on Nano-Scale Sicoh Sidewalls
A Vatsal, S Oehler, M Rudolph, V Brackmann, J Bartha
Electrochemical Society Meeting Abstracts 240, 923-923, 2021
2021
Investigation of Fluoro-Carbon Layer on Dense Sicoh Formed during CF4 and CF4/C4F6 Based Continuous Wave Plasma Etch
A Vatsal, S Oehler, M Rudolph, V Brackmann, JW Bartha
Electrochemical Society Meeting Abstracts prime2020, 1385-1385, 2020
2020
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