| Influence of interface traps density and temperature variation on the NBTI effect in p-Type junctionless nanowire transistors NG Junior, FJ Costa, R Trevisoli, S Barraud, RT Doria Solid-State Electronics 186, 108097, 2021 | 6 | 2021 |
| Thermal cross-coupling effects in side-by-side UTBB-FDSOI transistors FJ Costa, R Trevisoli, RT Doria Solid-State Electronics 185, 108073, 2021 | 6 | 2021 |
| Analysis of the substrate bias effect on the thermal properties of SOI UTBB transistors FJ Costa, MA Pavanello, R Trevisoli, RT Doria 2017 32nd Symposium on Microelectronics Technology and Devices (SBMicro), 1-4, 2017 | 6 | 2017 |
| UTBB thermal coupling analysis in technological node level FJ Costa, RT Doria, RT Doria Journal of Integrated Circuits and Systems 15 (2), 1-5, 2020 | 5 | 2020 |
| Analysis of the Output Conductance Degradation With the Substrate Bias in SOI UTB and UTBB Transistors FJ Costa, R Trevisoli, RT Doria 2018 33rd Symposium on Microelectronics Technology and Devices (SBMicro), 1-4, 2018 | 4 | 2018 |
| Analysis of the substrate effect by the capacitive coupling in SOI UTBB Transistors FJ Costa, R Trevisoli, RT Doria 2019 34th Symposium on Microelectronics Technology and Devices (SBMicro), 1-4, 2019 | 3 | 2019 |
| Analysis of standard-MOS and ultra-low-power diodes composed by SOI UTBB transistors FJ Costa, R Trevisoli, RT Doria IEEE Journal of the Electron Devices Society, 2023 | 1 | 2023 |
| Experimental Characterization of Switching Properties of ReRAM Devices by the Capacitance Measurements FJ Costa, A Zeinati, R Trevisoli, D Misra, RT Doria 2023 37th Symposium on Microelectronics Technology and Devices (SBMicro), 1-4, 2023 | 1 | 2023 |
| Ultra-low-power diodes composed by SOI UTBB transistors FJ Costa, R Trevisoli, RT Doria 2022 IEEE Latin American Electron Devices Conference (LAEDC), 1-4, 2022 | 1 | 2022 |
| SOI UTBB Capacitive Cross-Coupling Effects in Ultimate Technological Nodes FJ Costa, R Trevisoli, RT Doria 2022 IEEE 13th Latin America Symposium on Circuits and System (LASCAS), 1-4, 2022 | 1 | 2022 |
| Substrate Effect Evaluation by the Analysis of Intrinsic Capacitances in SOI UTBB Transistors FJ Costa, RT Doria, RT Doria Journal of Integrated Circuits and Systems 15 (1), 1-6, 2020 | 1 | 2020 |
| Characterization of Switching Properties in ReRAM Devices by the Capacitance of the MIM Structure FJ Costa, A Zeinati, R Trevisoli, D Misra, RT Doria Journal of Integrated Circuits and Systems 19 (2), 1-6, 2024 | | 2024 |
| Standard MOS Diodes Composed by SOI UTBB Transistors FJ Costa, R Trevisoli, CE Capovilla, RT Doria 2022 36th Symposium on Microelectronics Technology (SBMICRO), 1-4, 2022 | | 2022 |
| Thermal Cross-Coupling Effects Analysis in UTBB Transistors FJ Costa, R Trevisoli, RT Doria 2020 Joint International EUROSOI Workshop and International Conference on …, 2020 | | 2020 |
| Analysis of the Thermal Properties of Self-Cascode Structures Composed by UTBB Transistors FJ Costa, R Trevisoli, M de Souza, RT Doria 2020 IEEE Latin America Electron Devices Conference (LAEDC), 1-4, 2020 | | 2020 |
| Behavior of the Output Conductance with Respect to Temperature Variation RTD F. J. Costa, R. Trevisoli Seminatec 2019 - XIV Workshop on semiconductors and micro & nano technology …, 2019 | | 2019 |
| Estudo do efeito de autoaquecimento em transistores SOI-MOSFET fabricados em tecnologia de camadas ultra finas (UTB e UTBB) FJ Costa Centro Universitário FEI, São Bernardo do Campo, 2018 | | 2018 |
| Analysis of Thermal Resistance with BOX Thinning in UTB SOI MOSFETs RTD F. J. Costa, R. Trevisoli Seminatec 2017 - XII Workshop on semiconductions and micro & nano technology, 2017 | | 2017 |
| Characterization of Switching Properties of ReRAM Devices by the Capacitance Measurements FJ Costa, A Zeinati, R Trevisoli, D Misra, RT Doria | | |
| Capacitive Couplings in SOI UTBB Transistors FJ Costa, R Trevisoli, RT Doria Proceedings of XV Workshop on Semiconductors and Micro & Nano Technology …, 0 | | |
