| Potku–new analysis software for heavy ion elastic recoil detection analysis K Arstila, J Julin, MI Laitinen, J Aalto, T Konu, S Kärkkäinen, S Rahkonen, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014 | 206 | 2014 |
| Aluminum oxide from trimethylaluminum and water by atomic layer deposition: The temperature dependence of residual stress, elastic modulus, hardness and adhesion OME Ylivaara, X Liu, L Kilpi, J Lyytinen, D Schneider, M Laitinen, J Julin, ... Thin Solid Films 552, 124-135, 2014 | 203 | 2014 |
| Bandgap lowering in mixed alloys of Cs 2 Ag (Sb x Bi 1− x) Br 6 double perovskite thin films Z Li, SR Kavanagh, M Napari, RG Palgrave, M Abdi-Jalebi, ... Journal of Materials Chemistry A 8 (41), 21780-21788, 2020 | 90 | 2020 |
| Time-of-flight–Energy spectrometer for elemental depth profiling–Jyväskylä design M Laitinen, M Rossi, J Julin, T Sajavaara Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2014 | 84 | 2014 |
| Aluminum oxide/titanium dioxide nanolaminates grown by atomic layer deposition: Growth and mechanical properties OME Ylivaara, L Kilpi, X Liu, S Sintonen, S Ali, M Laitinen, J Julin, E Haimi, ... Journal of Vacuum Science & Technology A 35 (1), 2017 | 49 | 2017 |
| Strong absorption and ultrafast localisation in NaBiS2 nanocrystals with slow charge-carrier recombination YT Huang, SR Kavanagh, M Righetto, M Rusu, I Levine, T Unold, ... Nature communications 13 (1), 4960, 2022 | 42 | 2022 |
| Microstructural evolution and thermal stability of AlCr(Si)N hard coatings revealed by in-situ high-temperature high-energy grazing incidence transmission X-ray diffraction N Jäger, M Meindlhumer, S Spor, H Hruby, J Julin, A Stark, F Nahif, ... Acta Materialia, 2020 | 40 | 2020 |
| Nucleation and growth of ZnO on PMMA by low-temperature atomic layer deposition M Napari, J Malm, R Lehto, J Julin, K Arstila, T Sajavaara, M Lahtinen Journal of Vacuum Science & Technology A 33 (1), 2015 | 38 | 2015 |
| Evolution of structure and residual stress of a fcc/hex-AlCrN multi-layered system upon thermal loading revealed by cross-sectional X-ray nano-diffraction N Jäger, S Klima, H Hruby, J Julin, M Burghammer, JF Keckes, C Mitterer, ... Acta Materialia 162, 55-66, 2019 | 34 | 2019 |
| Structural Properties of Al–O Monolayers in SiO2 on Silicon and the Maximization of Their Negative Fixed Charge Density D Hiller, J Göttlicher, R Steininger, T Huthwelker, J Julin, F Munnik, ... ACS applied materials & interfaces 10 (36), 30495-30505, 2018 | 32 | 2018 |
| Transition-edge sensors for particle induced X-ray emission measurements MRJ Palosaari, KM Kinnunen, J Julin, M Laitinen, M Napari, T Sajavaara, ... Journal of Low Temperature Physics 176, 285-290, 2014 | 29 | 2014 |
| Room-temperature plasma-enhanced atomic layer deposition of ZnO: Film growth dependence on the PEALD reactor configuration M Napari, M Lahtinen, A Veselov, J Julin, E Østreng, T Sajavaara Surface and Coatings Technology 326, 281-290, 2017 | 25 | 2017 |
| Broadband ultrahigh-resolution spectroscopy of particle-induced X rays: extending the limits of nondestructive analysis MRJ Palosaari, M Käyhkö, KM Kinnunen, M Laitinen, J Julin, J Malm, ... Physical Review Applied 6 (2), 024002, 2016 | 23 | 2016 |
| Thermo-physical properties of coatings in the Ti (B, N) system grown by chemical vapor deposition C Kainz, N Schalk, M Tkadletz, C Saringer, M Winkler, A Stark, N Schell, ... Surface and Coatings Technology 384, 125318, 2020 | 22 | 2020 |
| Mechanical and optical properties of as-grown and thermally annealed titanium dioxide from titanium tetrachloride and water by atomic layer deposition OME Ylivaara, A Langner, X Liu, D Schneider, J Julin, K Arstila, ... Thin Solid Films 732, 138758, 2021 | 21 | 2021 |
| Nanotribological, nanomechanical and interfacial characterization of atomic layer deposited TiO2 on a silicon substrate J Lyytinen, X Liu, OME Ylivaara, S Sintonen, A Iyer, S Ali, J Julin, ... Wear 342, 270-278, 2015 | 18 | 2015 |
| Depth profiling of Al2O3+ TiO2 nanolaminates by means of a time-of-flight energy spectrometer M Laitinen, T Sajavaara, M Rossi, J Julin, RL Puurunen, T Suni, T Ishida, ... Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2011 | 18 | 2011 |
| Low‐Temperature Atomic Layer Deposition of High‐k SbOx for Thin Film Transistors J Yang, A Bahrami, X Ding, P Zhao, S He, S Lehmann, M Laitinen, J Julin, ... Advanced Electronic Materials 8 (7), 2101334, 2022 | 15 | 2022 |
| Kinetics of Bulk Lifetime Degradation in Float‐Zone Silicon: Fast Activation and Annihilation of Grown‐In Defects and the Role of Hydrogen versus Light D Hiller, VP Markevich, JAT de Guzman, D König, S Prucnal, W Bock, ... physica status solidi (a) 217 (17), 2000436, 2020 | 15 | 2020 |
| Impact of Si on the high-temperature oxidation of AlCr (Si) N coatings N Jäger, M Meindlhumer, M Zitek, S Spor, H Hruby, F Nahif, J Julin, ... Journal of Materials Science & Technology 100, 91-100, 2022 | 14 | 2022 |
