| A 0.186-pJ per bit latch-based true random number generator featuring mismatch compensation and random noise enhancement R Zhang, X Wang, K Liu, H Shinohara IEEE Journal of Solid-State Circuits 57 (8), 2498-2508, 2022 | 22 | 2022 |
| A 0.186-pJ per bit latch-based true random number generator with mismatch compensation and random noise enhancement R Zhang, X Wang, L Wang, X Chen, F Yang, K Liu, H Shinohara 2021 Symposium on VLSI Circuits, 1-2, 2021 | 14 | 2021 |
| 36.3 A modeling attack resilient strong PUF with feedback-SPN structure having< 0.73% bit error rate through in-cell hot-carrier injection burn-in K Liu, Z Fu, G Li, H Pu, Z Guan, X Wang, X Chen, H Shinohara 2021 IEEE International Solid-State Circuits Conference (ISSCC) 64, 502-504, 2021 | 11 | 2021 |
| An inverter-based true random number generator with 4-bit von-Neumann post-processing circuit X Wang, H Liu, R Zhang, K Liu, H Shinohara 2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020 | 11 | 2020 |
| Energy-efficient post-processing technique having high extraction efficiency for true random number generators R Zhang, X Wang, H Shinohara IEICE Transactions on Electronics 104 (7), 300-308, 2021 | 7 | 2021 |
| A 0.116 pJ/bit latch-based true random number generator featuring static inverter selection and noise enhancement X Wang, R Zhang, K Liu, H Shinohara IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023 | 6 | 2023 |
| A 0.116 pJ/bit latch-based true random number generator with static inverter selection and noise enhancement X Wang, R Zhang, Y Wang, K Liu, X Wang, H Shinohara 2022 International Symposium on VLSI Design, Automation and Test (VLSI-DAT), 1-4, 2022 | 5 | 2022 |
| Practical Markov Chain and Von Neumann based Post-processing Circuits for True Random Number Generators R Zhang, H Zhang, X Wang, Y Ziyang, K Liu, H Shinohara 2023 IEEE 66th International Midwest Symposium on Circuits and Systems …, 2023 | 3 | 2023 |
| Predictive modeling for neolithic settlements in the Lingnan Region, South China H Wu, X Wang, X Wang, L Zhang, S Dong Journal of Archaeological Science: Reports 49, 103992, 2023 | 2 | 2023 |
| De-Correlation and De-Bias Post-Processing Circuits for True Random Number Generator R Zhang, H Zhang, X Wang, Y Ziyang, K Liu, S Nishizawa, K Niitsu, ... IEEE Transactions on Circuits and Systems I: Regular Papers, 2024 | | 2024 |
| A Latch-Based Stochastic Number Generator for Stochastic Computing of Extended Naïve Bayesian Network R Zhang, Y Xiao, J Liu, X Wang, S Xu, K Liu, S Nishizawa, K Niitsu, ... 2024 International VLSI Symposium on Technology, Systems and Applications …, 2024 | | 2024 |
| A Single-Inverter-Based True Random Number Generator with On-Chip Clock-Tuning-Based Entropy Calibration Circuit X Wang, R Zhang, H Shinohara IEICE Transactions on Fundamentals of Electronics, Communications and …, 2024 | | 2024 |
| Latch Based Static and Dynamic Random Number Generators for Information Security H Shinohara, K Liu, R Zhang, X Wang IEICE Technical Report; IEICE Tech. Rep. 121 (139), 64-67, 2021 | | 2021 |
