| Effect of frequency on total ionizing dose response of ring oscillator circuits at the 7-nm bulk FinFET node A Feeley, Y Xiong, N Guruswamy, BL Bhuva IEEE Transactions on Nuclear Science 69 (3), 327-332, 2022 | 14 | 2022 |
| Supply voltage dependence of ring oscillator frequencies for total ionizing dose exposures for 7-nm bulk FinFET technology Y Xiong, AT Feeley, PF Wang, X Li, EX Zhang, LW Massengill, BL Bhuva IEEE Transactions on Nuclear Science 68 (8), 1579-1584, 2021 | 10 | 2021 |
| Soft error characterization of D-FFs at the 5-nm bulk FinFET technology for the terrestrial environment Y Xiong, A Feeley, NJ Pieper, DR Ball, B Narasimham, J Brockman, ... 2022 IEEE International Reliability Physics Symposium (IRPS), 7C. 3-1-7C. 3-7, 2022 | 9 | 2022 |
| Study of multicell upsets in SRAM at a 5-nm bulk FinFET node NJ Pieper, Y Xiong, A Feeley, J Pasternak, N Dodds, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 70 (4), 401-409, 2023 | 7 | 2023 |
| Single-Event Upset Cross-Section Trends for D-FFs at the 5-and 7-nm Bulk FinFET Technology Nodes Y Xiong, NJ Pieper, AT Feeley, B Narasimham, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 70 (4), 381-386, 2022 | 7 | 2022 |
| Frequency, LET, and supply voltage dependence of logic soft errors at the 7-nm node Y Xiong, A Feeley, LW Massengill, BL Bhuva, SJ Wen, R Fung 2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021 | 6 | 2021 |
| Effects of temperature and supply voltage on soft errors for 7-nm bulk FinFET technology A Feeley, Y Xiong, BL Bhuva, B Narasimham, SJ Wen, R Fung 2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021 | 5 | 2021 |
| Effects of collected charge and drain area on SE response of SRAMs at the 5-nm FinFET node NJ Pieper, Y Xiong, DR Ball, J Pasternak, BL Bhuva 2023 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2023 | 3 | 2023 |
| Efficacy of spatial and temporal RHBD techniques at advanced bulk FinFET technology nodes Y Xiong, NJ Pieper, B Narasimham, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 70 (8), 1814-1820, 2023 | 3 | 2023 |
| Single-Event Latchup Vulnerability at the 7-nm FinFET Node NJ Pieper, Y Xiong, A Feeley, DR Ball, BL Bhuva 2022 IEEE International Reliability Physics Symposium (IRPS), 5C. 2-1-5C. 2-6, 2022 | 3 | 2022 |
| Response of 5-nm Bulk FinFET SRAMs to Extreme Ionizing and Non-ionizing Doses Y Xiong, NJ Pieper, NA Dodds, G Vizkelethy, RN Nowlin, BL Bhuva IEEE Transactions on Nuclear Science, 2023 | 2 | 2023 |
| Single-Event Upsets for Single-Port and Two-Port SRAM Cells at the 5-nm FinFET Technology NJ Pieper, Y Xiong, J Pasternak, NA Dodds, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 70 (8), 1673-1679, 2023 | 2 | 2023 |
| SE Performance of D-FF Designs With Different VT Options at Near-Threshold Supply Voltages in 7-nm Bulk FinFET Technology A Feeley, Y Xiong, NJ Pieper, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 69 (7), 1582-1586, 2022 | 2 | 2022 |
| Modeling logic error single-event cross sections at the 7-nm bulk FinFET technology node Y Xiong, AT Feeley, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science 69 (3), 422-428, 2021 | 2 | 2021 |
| Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node Y Xiong, NJ Pieper, JB Kronenberg, DR Ball, M Casey, BL Bhuva 2024 IEEE International Reliability Physics Symposium (IRPS), P46. RE-1-P46 …, 2024 | 1 | 2024 |
| Evaluation of Threshold Frequencies for Logic Single-Event Upsets at Bulk FinFET Technology Nodes Y Xiong, NJ Pieper, JB Kronenberg, Y Chiang, R Fung, SJ Wen, ... IEEE Transactions on Nuclear Science, 2024 | 1 | 2024 |
| Effects of TID on SRAM Data Retention Stability at the 5-nm Node NJ Pieper, Y Xiong, J Pasternak, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science, 2023 | 1 | 2023 |
| SRAM Electrical Variability and SEE Sensitivity at 5-nm Bulk FinFET Technology Y Qian, NJ Pieper, Y Xiong, J Pasternak, DR Ball, BL Bhuva IEEE Transactions on Nuclear Science, 2023 | 1 | 2023 |
| Soft Error Rate Predictions for Terrestrial Neutrons at the 3-nm Bulk FinFET Technology Y Xiong, Y Chiang, NJ Pieper, DR Ball, BL Bhuva 2023 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2023 | 1 | 2023 |
| Evaluation of the Single-Event-Upset Vulnerability for Low-Energy Protons at the 7-and 5-nm Bulk FinFET Nodes Y Xiong, NJ Pieper, MW McCurdy, DR Ball, BD Sierwaski, BL Bhuva IEEE Transactions on Nuclear Science 70 (8), 1687-1693, 2023 | 1 | 2023 |
