| Kinetics of adsorption on carbon from solutions WJ Moris, JC Weber J. Saint. Eng. Div. ASCE 89, 31-59, 1963 | 59 | 1963 |
| Understanding current instabilities in conductive atomic force microscopy L Jiang, J Weber, FM Puglisi, P Pavan, L Larcher, W Frammelsberger, ... Materials 12 (3), 459, 2019 | 27 | 2019 |
| On the limits of scanning thermal microscopy of ultrathin films C Metzke, W Frammelsberger, J Weber, F Kühnel, K Zhu, M Lanza, ... Materials 13 (3), 518, 2020 | 11 | 2020 |
| Solid Platinum Nanoprobes for Highly Reliable Conductive Atomic Force Microscopy J Weber, Y Yuan, F Kühnel, C Metzke, J Schätz, W Frammelsberger, ... ACS Applied Materials & Interfaces 15 (17), 21602-21608, 2023 | 9 | 2023 |
| Scanning thermal microscopy of ultrathin films: Numerical studies regarding cantilever displacement, thermal contact areas, heat fluxes, and heat distribution C Metzke, F Kühnel, J Weber, G Benstetter Nanomaterials 11 (2), 491, 2021 | 7 | 2021 |
| Self‐Assembly of Janus Graphene Oxide via Chemical Breakdown for Scalable High‐Performance Memristors F Hui, C Zhang, H Yu, T Han, J Weber, Y Shen, Y Xiao, X Li, Z Zhang, ... Advanced Functional Materials 34 (15), 2302073, 2024 | 4 | 2024 |
| Current-Limited Conductive Atomic Force Microscopy J Weber, Y Yuan, S Pazos, F Kühnel, C Metzke, J Schätz, ... ACS Applied Materials & Interfaces 15 (48), 56365-56374, 2023 | 4 | 2023 |
| Investigation of Heater Structures for Thermal Conductivity Measurements of SiO2 and Al2O3 Thin Films Using the 3-Omega Method F Kühnel, C Metzke, J Weber, J Schätz, GS Duesberg, G Benstetter Nanomaterials 12 (11), 1928, 2022 | 3 | 2022 |
| On the quality of commercial chemical vapour deposited hexagonal boron nitride Y Yuan, J Weber, J Li, B Tian, Y Ma, X Zhang, T Taniguchi, K Watanabe, ... Nature Communications 15 (1), 4518, 2024 | 2 | 2024 |
| Button shear testing for adhesion measurements of 2D materials J Schätz, N Nayi, J Weber, C Metzke, S Lukas, J Walter, T Schaffus, ... Nature Communications 15 (1), 2430, 2024 | 2 | 2024 |
| Improving the Reliability of Conductive Atomic Force Microscopy J Weber Universitat de Barcelona, 2024 | | 2024 |
