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Csaba Vass
Csaba Vass
ELI-ALPS
在 eli-alps.hu 的电子邮件经过验证
标题
引用次数
引用次数
年份
Targets for high repetition rate laser facilities: needs, challenges and perspectives
I Prencipe, J Fuchs, S Pascarelli, DW Schumacher, RB Stephens, ...
High Power Laser Science and Engineering 5, e17, 2017
1402017
Wet etching of fused silica: a multiplex study
C Vass, T Smausz, B Hopp
Journal of Physics D: Applied Physics 37, 2449, 2004
822004
Laser induced backside dry etching of transparent materials
B Hopp, C Vass, T Smausz
Applied surface science 253 (19), 7922-7925, 2007
662007
Comparative Study of Different Indirect Laser-Based Methods Developed for Microprocessing of Transparent Materials
B Hopp, T Smausz, T Csizmadia, C Vass, T Csako, G ábor SZABÓ
Journal of Laser Micro Nanoengineering 5 (1), 80-85, 2010
61*2010
Experiments and numerical calculations for the interpretation of the backside wet etching of fused silica
C Vass, B Hopp, T Smausz, F Ignácz
Thin Solid Films 453, 121-126, 2004
602004
Time-resolved study of absorbing film assisted laser induced forward transfer of Trichoderma longibrachiatum conidia
B Hopp, T Smausz, N Barna, C Vass, Z Antal, L Kredics, D Chrisey
Journal of Physics D: Applied Physics 38, 833, 2005
572005
Production of submicrometre fused silica gratings using laser-induced backside dry etching technique
B Hopp, C Vass, T Smausz, Z Bor
Journal of Physics D: Applied Physics 39, 4843, 2006
502006
Fabrication of 150 nm period grating in fused silica by two-beam interferometric laser induced backside wet etching method
C Vass, K Osvay, B Hopp
Optics Express 14 (18), 8354-8359, 2006
482006
Laser-induced backside dry and wet etching of transparent materials using solid and molten tin as absorbers
B Hopp, T Smausz, C Vass, G Szabó, R Böhme, D Hirsch, K Zimmer
Applied Physics A: Materials Science & Processing 94 (4), 899-904, 2009
412009
High Power Laser Sci
I Prencipe, J Fuchs, S Pascarelli, DW Schumacher, RB Stephens, ...
Eng 5, e17, 2017
402017
104 nm period grating fabrication in fused silica by immersion two-beam interferometric laser induced backside wet etching technique
C Vass, K Osvay, B Hopp, Z Bor
Applied Physics A: Materials Science & Processing 87 (4), 611-613, 2007
382007
Comparative study on pulsed laser deposition and matrix assisted pulsed laser evaporation of urease thin films
T Smausz, G Megyeri, R Kékesi, C Vass, E György, F Sima, IN Mihailescu, ...
Thin Solid Films 517 (15), 4299-4302, 2009
362009
Comparing study of subpicosecond and nanosecond wet etching of fused silica
C Vass, D Sebők, B Hopp
Applied surface science 252 (13), 4768-4772, 2006
352006
Fabrication of 550 nm gratings in fused silica by laser induced backside wet etching technique
C Vass, K Osvay, M Csete, B Hopp
Applied surface science 253 (19), 8059-8063, 2007
302007
Submicrometer grating fabrication in fused silica by interferometric laser-induced backside wet etching technique
C Vass, K Osvay, T Véső, B Hopp, Z Bor
Applied Physics A: Materials Science & Processing 93 (1), 69-73, 2008
282008
Influence on the laser induced backside dry etching of thickness and material of the absorber, laser spot size and multipulse irradiation
T Smausz, T Csizmadia, N Kresz, C Vass, Z Márton, B Hopp
Applied Surface Science 254 (4), 1091-1095, 2007
272007
Time-resolved measurements during backside dry etching of fused silica
K Zimmer, R Böhme, C Vass, B Hopp
Applied surface science 255 (24), 9617-9621, 2009
242009
Production of nanostructures on bulk metal samples by laser ablation for fabrication of low-reflective surfaces
B Hopp, T Smausz, T Csizmadia, C Vass, C Tápai, B Kiss, M Ehrhardt, ...
Applied Physics A 113, 291-296, 2013
192013
Atomic force microscopical and surface plasmon resonance spectroscopical investigation of sub-micrometer metal gratings generated by UV laser-based two-beam interference in Au …
M Csete, A Kohazi-Kis, C Vass, Á Sipos, G Szekeres, M Deli, K Osvay, ...
Applied surface science 253 (19), 7662-7671, 2007
192007
Sub-wavelength ripples in fused silica after irradiation of the solid/liquid interface with ultrashort laser pulses
R Böhme, C Vass, B Hopp, K Zimmer
Nanotechnology 19 (49), 495301, 2008
182008
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