| Validation of IC conducted emission and immunity models including aging and thermal stress QM Khan, M Koohestani, JL Levant, M Ramdani, R Perdriau IEEE Transactions on Electromagnetic Compatibility 65 (3), 780-793, 2023 | 8 | 2023 |
| Experimental Characterization of Multitone EM Immunity of Integrated Oscillators Under Thermal Stress QM Khan, L Devaraj, R Perdriau, AR Ruddle, T Claeys, M Ramdani, ... IEEE Access 10, 83898-83915, 2022 | 7 | 2022 |
| A Comparative Performance Analysis of 6T & 9T SRAM Integrated Circuits: SOI vs. Bulk QM Khan, R Perdriau, M Ramdani, M Koohestani IEEE Letters on Electromagnetic Compatibility Practice and Applications, 2022 | 5 | 2022 |
| A comparison among DPI immunities of multi-stage CSVCOs and ring oscillators QM Khan, A Ramezani, M Koohestani, M Ramdani, R Perdriau 2021 13th International Workshop on the Electromagnetic Compatibility of …, 2022 | 5 | 2022 |
| Application of Probabilistic Models for Multitone Electromagnetic Immunity Analysis L Devaraj, QM Khan, AR Ruddle, AP Duffy, R Perdriau, M Koohestani IEEE Transactions on Electromagnetic Compatibility 64 (6), 2067-2079, 2022 | 4 | 2022 |
| Synergistic effect of multitone EMI on the conducted immunity of integrated oscillators QM Khan, L Devaraj, M Koohestani, AR Ruddle, M Ramdani, R Perdriau IEEE Letters on Electromagnetic Compatibility Practice and Applications 4 (3 …, 2022 | 4 | 2022 |
| A comparative study of on-chip CMOS S&H voltage sensors for power integrity: SOI vs. bulk QM Khan, R Perdriau, M Ramdani, M Koohestani 2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 911-916, 2021 | 4 | 2021 |
| Obsolescence in EMC risk assessment: A case study on EFT immunity of microcontrollers QM Khan, M Koohestani, M Ramdani, R Perdriau 2020 International Symposium on Electromagnetic Compatibility-EMC EUROPE, 1-6, 2020 | 4 | 2020 |
| Analysis of Q-factor for AM-SLM Cavity based Resonators using Surface Roughness Models QM Khan, D Kuylenstierna IEEE Journal on Multiscale and Multiphysics Computational Techniques, 2024 | 3 | 2024 |
| Influence of temperature on the EFT immunity of multistage integrated oscillators QM Khan, M Koohestani, R Perdriau IEEE Transactions on Electromagnetic Compatibility 65 (1), 138-148, 2022 | 1 | 2022 |
| A new TRL/TRM PCB-based calibration method for on-board devices under test (DUTs) A Ramezani, QM Khan, H Pues 2021 13th International Workshop on the Electromagnetic Compatibility of …, 2022 | 1 | 2022 |
| Comparing Simulated Impact of Single Frequency and Multitone EMI for an Integrated Circuit L Devaraj, QM Khan, AR Ruddle, AP Duffy 2021 13th International Workshop on the Electromagnetic Compatibility of …, 2022 | 1 | 2022 |
| Electro-Thermal Modeling of AM-SLM Based Cavity Resonators QM Khan, D Kuylenstierna 2024 IEEE/MTT-S International Microwave Symposium-IMS 2024, 505-508, 2024 | | 2024 |
| Improvements proposed to noisy-OR derivatives for multi-causal analysis: A case study of simultaneous electromagnetic disturbances L Devaraj, QM Khan, AR Ruddle, AP Duffy, R Perdriau, M Koohestani International Journal of Approximate Reasoning 164, 109068, 2023 | | 2023 |
| Evaluation of Electromagnetic Hazards due to Environmental Stresses, Obsolescence and/or Ageing, Evaluation at the IC Level QM Khan INSA de Rennes, 2023 | | 2023 |
| Knowledge-Based Approach for System Level Electromagnetic Safety Analysis L Devaraj, A Ruddle, QM Khan, A Duffy 31st European Safety and Reliability Conference (ESREL 2021), 2021 | | 2021 |
| Design and Evaluation of Production Test and DfT Concepts for Ultra-High-Speed Analog to Digital Converters (Master Thesis) QM Khan Budapest University of Technology & Economics (BME), 2019 | | 2019 |
| Publications scientifiques des unités de recherche de l'Université de Rennes QM Khan, L Devaraj, M Koohestani, AR Ruddle, M Ramdani | | |
| 2022 Index IEEE Letters on Electromagnetic Compatibility Practice and Applications Vol. 4 F Albarracin, F Albarracin-Vargas, M Aoi, GN Appiah, Y Berthoud, A Boyer, ... | | |
Mohsen KoohestaniProfessor, HDR, École Supérieure d'Électronique de l'Ouest. IETR, Université de Rennes在 eseo.fr 的电子邮件经过验证
