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Yang Zuo (左杨)
Yang Zuo (左杨)
在 cqupt.edu.cn 的电子邮件经过验证
标题
引用次数
引用次数
年份
High bond strength Cu joints fabricated by rapid and pressureless in situ reduction-sintering of Cu nanoparticles
Y Zuo, S Carter-Searjeant, M Green, L Mills, SH Mannan
Materials Letters 276, 128260, 2020
332020
Effect of different sizes of Cu nanoparticles on the shear strength of Cu-Cu joints
Y Zuo, J Shen, H Xu, R Gao
Materials Letters 199, 13-16, 2017
302017
Improvement of oxidation resistance and bonding strength of Cu nanoparticles solder joints of Cu–Cu bonding by phosphating the nanoparticle
Y Zuo, J Shen, Y Hu, R Gao
Journal of Materials Processing Technology 253, 27-33, 2018
292018
Influence of Cu micro/nano-particles mixture and surface roughness on the shear strength of Cu-Cu joints
Y Zuo, J Shen, J Xie, L Xiang
Journal of Materials Processing Technology 257, 250-256, 2018
282018
Quasi-in-situ observation of the grain growth and grain boundary movement in sintered Cu nanoparticle interconnects
Y Zuo, C Zhao, A Robador, M Wickham, SH Mannan
Acta Materialia 236, 118135, 2022
242022
Effects of phenolic resin addition on the electrical conductivity and mechanical strength of nano-copper paste formed Cu-Cu joints
R Gao, J Shen, F Xie, Y Zuo, D Wu
Journal of Electronic Materials 46, 6388-6394, 2017
212017
Low temperature Cu joining by in situ reduction-sintering of CuO nanoparticle for high power electronics
Y Zuo, S Carter-Searjeant, M Green, L Mills, SH Mannan
Advanced Powder Technology 31 (10), 4135-4144, 2020
172020
Unraveling the complex oxidation effect in sintered Cu nanoparticle interconnects during high temperature aging
Y Zuo, A Robador, M Wickham, SH Mannan
Corrosion Science 209, 110713, 2022
62022
Observation of void formation patterns in SnAg films undergoing electromigration and simulation using random walk methods
Z Jin, YA Shen, Y Zuo, YC Chan, SH Mannan, H Nishikawa
Scientific Reports 11 (1), 8668, 2021
22021
Low temperature Cu-Cu bonding by sintering Cu nanoparticles for power electronics
Y Zuo, SH Mannan, M Green
King's College London, 2022
2022
The voids growth path on Sn-Ag thin film under high current density
Z Jin, YA Shen, Y Zuo, SH Mannan, H Nishikawa
2021 International Conference on Electronics Packaging (ICEP), 115-116, 2021
2021
Semi In-Situ Observation on Void Formation in Electromigrated Sn-Ag Film and its Prediction by Random-Walk Simulation
Z Jin, YA Shen, Y Zuo, YC Chan, SH Mannan, H Nishikawa
Yang and Chan, YC and Mannan, SH and Nishikawa, Hiroshi, Semi In-Situ …, 2020
2020
Comparative study of how additives affect sintered silver microstructure in die-attach applications
M Lo, SA Paknejad, H Borrill, WK Kong, A Addo-Kwabena, M Saidoune, ...
Additional Conferences (Device Packaging, HiTEC, HiTEN, & CICMT) 2019 (HiTen …, 2019
2019
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