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Xuefei Li
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Broadband black-phosphorus photodetectors with high responsivity
M Huang, M Wang, C Chen, Z Ma, X Li, J Han, Y Wu
Adv. Mater 28 (18), 3481-3485, 2016
4532016
Multifunctional high-performance van der Waals heterostructures
M Huang, S Li, Z Zhang, X Xiong, X Li, Y Wu
Nature nanotechnology 12 (12), 1148-1154, 2017
3332017
Nanometre-thin indium tin oxide for advanced high-performance electronics
S Li, M Tian, Q Gao, M Wang, T Li, Q Hu, X Li, Y Wu
Nature materials 18 (10), 1091-1097, 2019
2742019
Scalable high performance radio frequency electronics based on large domain bilayer MoS2
XLYW Qingguo Gao, Zhenfeng Zhang, Xiaole Xu, Jian Song
Nature Communications 9, 4778, 2018
1242018
Reconfigurable logic‐in‐memory and multilingual artificial synapses based on 2D heterostructures
X Xiong, J Kang, Q Hu, C Gu, T Gao, X Li, Y Wu
Advanced Functional Materials 30 (11), 1909645, 2020
1112020
Performance Potential and Limit of MoS2 Transistors
X Li, L Yang, M Si, S Li, M Huang, P Ye, Y Wu
Advanced Materials 27 (9), 1547-1552, 2015
1102015
High-speed black phosphorus field-effect transistors approaching ballistic limit
X Li, Z Yu, X Xiong, T Li, T Gao, R Wang, R Huang, Y Wu
Science advances 5 (6), eaau3194, 2019
932019
A transverse tunnelling field-effect transistor made from a van der Waals heterostructure
X Xiong, M Huang, B Hu, X Li, F Liu, S Li, M Tian, T Li, J Song, Y Wu
Nature Electronics 3 (2), 106-112, 2020
852020
Effects of nitrogen and hydrogen codoping on the electrical performance and reliability of InGaZnO thin-film transistors
A Abliz, Q Gao, D Wan, X Liu, L Xu, C Liu, C Jiang, X Li, H Chen, T Guo, ...
ACS Applied Materials & Interfaces 9 (12), 10798-10804, 2017
662017
Effect of Dielectric Interface on the Performance of MoS2 Transistors
X Li, X Xiong, T Li, S Li, Z Zhang, Y Wu
ACS applied materials & interfaces 9 (51), 44602-44608, 2017
502017
Channel Engineering of Normally-OFF AlGaN/GaN MOS-HEMTs by Atomic Layer Etching and High- Dielectric
Q Hu, S Li, T Li, X Wang, X Li, Y Wu
IEEE Electron Device Letters 39 (9), 1377-1380, 2018
472018
High-performance transistors based on monolayer CVD MoS2 grown on molten glass
Z Zhang, X Xu, J Song, Q Gao, S Li, Q Hu, X Li, Y Wu
Applied Physics Letters 113 (20), 2018
432018
High-performance flexible ZnO thin-film transistors by atomic layer deposition
M Wang, X Li, X Xiong, J Song, C Gu, D Zhan, Q Hu, S Li, Y Wu
IEEE Electron Device Letters 40 (3), 419-422, 2019
392019
High performance black phosphorus electronic and photonic devices with HfLaO dielectric
X Xiong, X Li, M Huang, T Li, T Gao, Y Wu
IEEE Electron Device Letters 39 (1), 127-130, 2017
362017
Effects of forming gas anneal on ultrathin InGaAs nanowire metal-oxide-semiconductor field-effect transistors
M Si, JJ Gu, X Wang, J Shao, X Li, MJ Manfra, RG Gordon, PD Ye
Applied Physics Letters 102 (9), 2013
342013
High field transport of high performance black phosphorus transistors
T Li, Z Zhang, X Li, M Huang, S Li, S Li, Y Wu
Applied Physics Letters 110 (16), 2017
332017
10-nm Channel Length Indium-Tin-Oxide transistors with Ion = 1860 μA/μm, Gm = 1050 μS/μm at Vds = 1 V with BEOL Compatibility
S Li, C Gu, X Li, R Huang, Y Wu
2020 IEEE International Electron Devices Meeting (IEDM), 40.5. 1-40.5. 4, 2020
322020
Mechanisms of current fluctuation in ambipolar black phosphorus field-effect transistors
X Li, Y Du, M Si, L Yang, S Li, T Li, X Xiong, P Ye, Y Wu
Nanoscale 8 (6), 3572-3578, 2016
312016
Optimized transport properties in lithium doped black phosphorus transistors
T Gao, X Li, X Xiong, M Huang, T Li, Y Wu
IEEE Electron Device Letters 39 (5), 769-772, 2018
292018
Improved Interface Properties and Dielectric Breakdown in Recessed AlGaN/GaN MOS-HEMTs Using HfSiO as Gate Dielectric
S Li, Q Hu, X Wang, T Li, X Li, Y Wu
IEEE Electron Device Letters 40 (2), 295-298, 2018
272018
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