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Ayse Sünbül
Ayse Sünbül
Fraunhofer IPMS - CNT
在 ipms.fraunhofer.de 的电子邮件经过验证
标题
引用次数
引用次数
年份
Fluorite‐Structured Ferroelectric and Antiferroelectric Materials: A Gateway of Miniaturized Electronic Devices
F Ali, T Ali, D Lehninger, A Sünbül, A Viegas, R Sachdeva, A Abbas, ...
Advanced Functional Materials 32 (27), 2201737, 2022
322022
Optimizing ferroelectric and interface layers in HZO-based FTJs for neuromorphic applications
A Sünbül, T Ali, K Mertens, R Revello, D Lehninger, F Müller, M Lederer, ...
IEEE Transactions on Electron Devices 69 (2), 808-815, 2021
232021
Ferroelectric fets with separated capacitor in the back-end-of-line: Role of the capacitance ratio
D Lehninger, R Hoffmann, A Sünbül, H Mähne, T Kämpfe, K Bernert, ...
IEEE Electron Device Letters 43 (11), 1866-1869, 2022
182022
Ferroelectric [HfO2/ZrO2] Superlattices with Enhanced Polarization, Tailored Coercive Field, and Improved High Temperature Reliability
D Lehninger, A Prabhu, A Sünbül, T Ali, F Schöne, T Kämpfe, ...
Advanced Physics Research 2 (9), 2200108, 2023
162023
Study of nanosecond laser annealing on silicon doped hafnium oxide film crystallization and capacitor reliability
T Ali, R Olivo, S Kerdiles, D Lehninger, M Lederer, D Sourav, AS Royet, ...
2022 IEEE International Memory Workshop (IMW), 1-4, 2022
162022
Impact of Ferroelectric Layer Thickness on Reliability of Back‐End‐of‐Line‐Compatible Hafnium Zirconium Oxide Films
A Sünbül, D Lehninger, R Hoffmann, R Olivo, A Prabhu, F Schöne, ...
Advanced Engineering Materials 25 (4), 2201124, 2023
92023
Hafnium oxide-based Ferroelectric Memories: Are we ready for Application?
K Seidel, D Lehninger, F Müller, Y Raffel, A Sünbül, R Revello, RHS De, ...
2023 IEEE International Memory Workshop (IMW), 1-4, 2023
82023
A study on imprint behavior of ferroelectric hafnium oxide caused by high‐temperature annealing
A Sünbül, D Lehninger, M Lederer, H Mähne, R Hoffmann, K Bernert, ...
physica status solidi (a), 2023
72023
Impact of the ferroelectric and interface layer optimization in an MFIS HZO based ferroelectric tunnel junction for neuromorphic based synaptic storage
T Ali, A Sünbül, K Mertens, R Revello, M Lederer, D Lehninger, F Müller, ...
2021 Silicon Nanoelectronics Workshop (SNW), 1-2, 2021
72021
Roadmap of ferroelectric memories: From discovery to 3D integration
S De, M Lederer, Y Raffel, F Müller, D Lehninger, A Sunbul, T Ali, ...
Authorea Preprints, 2023
32023
Endurance study of silicon-doped hafnium oxide (HSO) and zirconium-doped hafnium oxide (HZO)-based FeFET memory
P Duhan, T Ali, P Khedgarkar, K Kühnel, M Czernohorsky, M Rudolph, ...
IEEE Transactions on Electron Devices, 2023
32023
Ferroelectric HfO2/ZrO2 Superlattices with Improved Leakage at Bias and Temperature Stress
D Lehninger, A Sünbül, R Olivo, T Kämpfe, K Seidel, M Lederer
2023 IEEE International Memory Workshop (IMW), 1-4, 2023
32023
Impact of temperature on reliability of mfis hzo-based ferroelectric tunnel junctions
A Sünbül, T Ali, R Hoffmann, R Revello, Y Raffel, P Duhan, D Lehninger, ...
2022 IEEE International Reliability Physics Symposium (IRPS), P11-1-P11-5, 2022
32022
Toward Energy‐Efficient Ferroelectric Field‐Effect Transistors and Ferroelectric Random Access Memories: Tailoring the Coercive Field of Ferroelectric HfO2 Films
D Lehninger, A Sünbül, K Seidel, M Lederer
physica status solidi (a), 2300712, 2024
12024
A Ferroelectric BEoL Module: Adding Non-Volatile Memories and Varactors to Existing Technology Nodes
K Seidel, D Lehninger, S Abdulazhanov, A Sünbül, R Hoffmann, ...
2023 IEEE International Interconnect Technology Conference (IITC) and IEEE …, 2023
12023
Towards wake-up free ferroelectrics and scaling: Al-doped HZO and its crystallographic texture
A Sünbül, D Lehninger, A Pourjafar, S Yang, F Müller, R Olivo, T Kämpfe, ...
Memories-Materials, Devices, Circuits and Systems 8, 100110, 2024
2024
Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions
M Lederer, F Müller, R Hoffmann, R Olivo, Y Raffel, S Yang, S De, ...
2024 IEEE International Memory Workshop (IMW), 1-4, 2024
2024
Integration of ferroelectric devices for advanced in-memory computing concepts
K Seidel, D Lehninger, A Sünbül, R Hoffmann, R Revello, N Yadav, ...
Japanese Journal of Applied Physics 63 (5), 050802, 2024
2024
Structural element with improved ferroelectric polarisation switching and reliability and method for producing said structral element
D Lehninger, A Sünbül, M Lederer, K Seidel
US Patent App. 18/492,819, 2024
2024
Improved Endurance Reliability of Ferroelectric Hafnium Oxide-Based BEoL Integrated MFM Capacitors
A Sünbül, D Lehninger, R Hoffmann, H Mähne, K Bernert, S Thiem, ...
2024 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2024
2024
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