| A new method for studying He damage in materials demonstrated on nanotwinned Cu nanopillars ZJ Wang, F Allen, ZW Shan, P Hosemann Microscopy and Microanalysis 21 (S3), 115-116, 2015 | 2 | 2015 |
| A review of defect engineering, ion implantation, and nanofabrication using the helium ion microscope FI Allen Beilstein Journal of Nanotechnology 12, 633-664, 2021 | 40 | 2021 |
| Activation of ultra low dose, low energy Phosphorus implants in Silicon A Persaud, SJ Park, FI Allen, JA Liddle, J Bokor, T Schenkel APS Meeting Abstracts 1, 39012, 2004 | | 2004 |
| Anomalously high electronic thermal conductivity and Lorenz ratio in Bi2Te3 nanoribbons far from the bipolar condition HS Choe, J Li, W Zheng, J Lee, J Suh, FI Allen, H Liu, HJ Choi, ... Applied Physics Letters 114 (15), 152101, 2019 | 7 | 2019 |
| Application of the SmartEFTEM-SI method to characterize beam-sensitive materials M Watanabe, FI Allen, AM Minor European Microscopy Congress, 2012 | | 2012 |
| Architecture-Guided Fluid Flow Directs Renal Biomineralization SP Ho, L Chen, FI Allen, RS Hsi, AR Shimotake, SV Wiener, M Kang, ... Scientific Reports 8, 14157, 2018 | 12 | 2018 |
| Branched high aspect ratio nanostructures fabricated by focused helium ion beam induced deposition of an insulator FI Allen Micromachines 12 (3), 232, 2021 | 10 | 2021 |
| Campanile Near-Field Probes Fabricated by Nanoimprint Lithography on the Facet of an Optical Fiber G Calafiore, A Koshelev, TP Darlington, NJ Borys, M Melli, A Polyakov, ... Scientific Reports 7, 1651, 2017 | 38 | 2017 |
| Characterization of He plasma-induced damage of tungsten surfaces using He ion microscopy ion channeling and in-situ spectroscopic ellipsometry. R Kolasinski, JA Whaley, A Engel, A Shone, DA Buchenauer, F Allen Sandia National Lab.(SNL-CA), Livermore, CA (United States), 2018 | | 2018 |
| Charge exchange of highly charged argon ions as a function of projectile energy FI Allen, C Biedermann, R Radtke, G Fussmann Journal of Physics: Conference Series 58 (1), 188, 2007 | 11 | 2007 |
| Charge exchange of highly charged argon ions inside EBIT and with an external gas target C Biedermann, F Allen, R Radtke, G Fußmann 10th International Symposium on the Physics and Applications of Electron …, 2007 | | 2007 |
| Charge exchange of highly charged ions from the Berlin EBIT with a gas target F Allen, C Biedermann, R Radtke, G Fussmann Verhandlungen der Deutschen Physikalischen Gesellschaft 41 (7), 2006 | | 2006 |
| Chemical mapping of a block copolymer electrolyte by low-loss EFTEM spectrum-imaging and principal component analysis FI Allen, M Watanabe, Z Lee, NP Balsara, AM Minor Ultramicroscopy 111 (3), 239-244, 2011 | 43 | 2011 |
| Chemical Mapping of Block Copolymer Electrolytes by EFTEM Spectrum Imaging FI Allen, M Watanabe, NP Balsara, AM Minor Microscopy and Microanalysis 16 (S2), 1762-1763, 2010 | | 2010 |
| Deciphering the influence of high-flux helium plasma exposure on tungsten nanostructure growth using real-time, in situ spectroscopic ellipsometry RD Kolasinski, CS Wong, A Engel, JA Whaley, FI Allen, DA Buchenauer Journal of Applied Physics 131 (6), 063303, 2022 | 4 | 2022 |
| Deciphering the three-dimensional morphology of free-standing block copolymer thin films by transmission electron microscopy FI Allen, P Ercius, MA Modestino, RA Segalman, NP Balsara, AM Minor Micron 44, 442-450, 2013 | 11 | 2013 |
| Defect engineering of silicon with ion pulses from laser acceleration W Redjem, AJ Amsellem, FI Allen, G Benndorf, J Bin, S Bulanov, E Esarey, ... Communications Materials 4 (1), 22, 2023 | 11 | 2023 |
| Detailed Investigation of Silicon Nitride Phase Plates Prepared by Focused Ion Beam Milling A Müller, DB Durham, KC Bustillo, FI Allen, AM Minor, C Ophus Microscopy and Microanalysis 25 (S2), 900-901, 2019 | 1 | 2019 |
| Development of a New Acquisition Scheme for Energy-Filtering Transmission Electron Microscopy Spectrum-Imaging toward Quantification M Watanabe, F Allen Microscopy and Microanalysis 17, 790-791, 2011 | | 2011 |
| Development of Quantitative In Situ TEM Nanomechanical Testing for Polymers N Velez, F Allen, MA Jones, G Meyers, AM Minor Microscopy and Microanalysis 23 (S1), 742-743, 2017 | 1 | 2017 |
