| Ellipsometry at the Nanoscale M Losurdo, K Hingerl Springer, 2013 | 211 | 2013 |
| Anisotropy, phonon modes, and free charge carrier parameters in monoclinic -gallium oxide single crystals M Schubert, R Korlacki, S Knight, T Hofmann, S Schöche, V Darakchieva, ... Physical Review B 93 (12), 125209, 2016 | 200 | 2016 |
| Ellipsometry of functional organic surfaces and films K Hinrichs, KJ Eichhorn Springer, 2018 | 150 | 2018 |
| Protein adsorption on and swelling of polyelectrolyte brushes: A simultaneous ellipsometry-quartz crystal microbalance study E Bittrich, KB Rodenhausen, KJ Eichhorn, T Hofmann, M Schubert, ... Biointerphases 5, 159, 2010 | 113 | 2010 |
| Transient Absorption Measurements on Anisotropic Monolayer ReS2 Q Cui, J He, MZ Bellus, M Mirzokarimov, T Hofmann, HY Chiu, M Antonik, ... Small 11 (41), 5565-5571, 2015 | 112 | 2015 |
| Variable-wavelength frequency-domain terahertz ellipsometry T Hofmann, CM Herzinger, A Boosalis, TE Tiwald, JA Woollam, ... Review of Scientific Instruments 81, 023101, 2010 | 111 | 2010 |
| Generalized far-infrared magneto-optic ellipsometry for semiconductor layer structures: determination of free-carrier effective-mass, mobility, and concentration parameters in … M Schubert, T Hofmann, CM Herzinger JOSA A 20 (2), 347-356, 2003 | 110 | 2003 |
| Optical, structural, and magnetic properties of cobalt nanostructure thin films D Schmidt, AC Kjerstad, T Hofmann, R Skomski, E Schubert, M Schubert Journal of Applied Physics 105 (11), 113508-113508-7, 2009 | 93 | 2009 |
| Monoclinic optical constants, birefringence, and dichroism of slanted titanium nanocolumns determined by generalized ellipsometry D Schmidt, B Booso, T Hofmann, E Schubert, A Sarangan, M Schubert Applied Physics Letters 94, 011914, 2009 | 93 | 2009 |
| Generalized ellipsometry for monoclinic absorbing materials: determination of optical constants of Cr columnar thin films D Schmidt, B Booso, T Hofmann, E Schubert, A Sarangan, M Schubert Optics letters 34 (7), 992-994, 2009 | 85 | 2009 |
| Terahertz magneto-optic generalized ellipsometry using synchrotron and blackbody radiation T Hofmann, U Schade, CM Herzinger, P Esquinazi, M Schubert Review of scientific instruments 77, 063902, 2006 | 74 | 2006 |
| Invited Article: An integrated mid-infrared, far-infrared, and terahertz optical Hall effect instrument P Kühne, CM Herzinger, M Schubert, JA Woollam, T Hofmann Review of Scientific Instruments 85 (7), 2014 | 65 | 2014 |
| Polaron and phonon properties in proton intercalated amorphous tungsten oxide thin films MF Saenger, T Höing, BW Robertson, RB Billa, T Hofmann, E Schubert, ... Physical Review B—Condensed Matter and Materials Physics 78 (24), 245205, 2008 | 65 | 2008 |
| Terahertz ellipsometry and terahertz optical-Hall effect T Hofmann, CM Herzinger, JL Tedesco, DK Gaskill, JA Woollam, ... Thin Solid Films 519 (9), 2593-2600, 2011 | 64 | 2011 |
| Resistive hysteresis and interface charge coupling in BaTiO-ZnO heterostructures VM Voora, T Hofmann, M Brandt, M Lorenz, M Grundmann, N Ashkenov, ... Applied Physics Letters 94, 142904, 2009 | 63 | 2009 |
| Infrared dielectric response of nanoscribe IP-dip and IP-L monomers after polymerization from 250 cm−1 to 6000 cm−1 DB Fullager, GD Boreman, T Hofmann Optical Materials Express 7 (3), 888-894, 2017 | 60 | 2017 |
| Temperature dependent effective mass in AlGaN/GaN high electron mobility transistor structures T Hofmann, P Kühne, S Schöche, T Chen Jr, U Forsberg, E Janzén, ... Applied Physics Letters 101 (19), 2012 | 60 | 2012 |
| Optical Hall effect—model description: tutorial M Schubert, P Kühne, V Darakchieva, T Hofmann JOSA A 33 (8), 1553-1568, 2016 | 57 | 2016 |
| Combined optical and acoustical method for determination of thickness and porosity of transparent organic layers below the ultra-thin film limit KB Rodenhausen, T Kasputis, AK Pannier, JY Gerasimov, RY Lai, ... Review of Scientific Instruments 82, 103111, 2011 | 53 | 2011 |
| Interface polarization coupling in piezoelectric-semiconductor ferroelectric heterostructures VM Voora, T Hofmann, M Brandt, M Lorenz, M Grundmann, N Ashkenov, ... Physical Review B—Condensed Matter and Materials Physics 81 (19), 195307, 2010 | 52 | 2010 |
Mathias SchubertUniversity of Nebraska-Lincoln在 engr.unl.edu 的电子邮件经过验证
