Perspectives of mid-infrared optical coherence tomography for inspection and micrometrology of industrial ceramics R Su, M Kirillin, EW Chang, E Sergeeva, SH Yun, L Mattsson Optics express 22 (13), 15804-15819, 2014 | 123 | 2014 |
On tilt and curvature dependent errors and the calibration of coherence scanning interferometry R Su, Y Wang, J Coupland, R Leach Optics Express 25 (4), 3297-3310, 2017 | 102 | 2017 |
Optimization of surface measurement for metal additive manufacturing using coherence scanning interferometry C Gomez, R Su, A Thompson, J DiSciacca, S Lawes, RK Leach Optical Engineering 56 (11), 111714, 2017 | 94 | 2017 |
Metrological characteristics for the calibration of surface topography measuring instruments: a review R Leach, H Haitjema, R Su, A Thompson Measurement Science and Technology 32 (3), 032001, 2020 | 69 | 2020 |
Mid-infrared Fourier-domain optical coherence tomography with a pyroelectric linear array I Zorin, R Su, A Prylepa, J Kilgus, M Brandstetter, B Heise Optics express 26 (25), 33428-33439, 2018 | 55 | 2018 |
Scattering and three-dimensional imaging in surface topography measuring interference microscopy R Su, J Coupland, C Sheppard, R Leach JOSA A 38 (2), A27-A42, 2021 | 50 | 2021 |
Lens aberration compensation in interference microscopy R Su, M Thomas, M Liu, J Drs, Y Bellouard, C Pruss, J Coupland, R Leach Optics and Lasers in Engineering 128, 106015, 2020 | 50 | 2020 |
Noise reduction in coherence scanning interferometry for surface topography measurement C Gomez, R Su, P De Groot, R Leach Nanomanufacturing and Metrology 3, 68-76, 2020 | 47 | 2020 |
On-machine surface defect detection using light scattering and deep learning M Liu, CF Cheung, N Senin, S Wang, R Su, R Leach JOSA A 37 (9), B53-B59, 2020 | 45 | 2020 |
Physics-based virtual coherence scanning interferometer for surface measurement R Su, R Leach Light: Advanced Manufacturing 2 (1), 1-16, 2021 | 44 | 2021 |
Effects of defocus on the transfer function of coherence scanning interferometry R Su, M Thomas, R Leach, J Coupland Optics Letters 43 (1), 82-85, 2018 | 43 | 2018 |
Modeling of interference microscopy beyond the linear regime M Thomas, R Su, N Nikolaev, J Coupland, RK Leach Optical Engineering 59 (3), 034110, 2020 | 41 | 2020 |
Crystallographic texture can be rapidly determined by electrochemical surface analytics A Speidel, R Su, J Mitchell-Smith, P Dryburgh, I Bisterov, D Pieris, W Li, ... Acta Materialia 159, 89-101, 2018 | 38 | 2018 |
High-precision lateral distortion measurement and correction in coherence scanning interferometry using an arbitrary surface P Ekberg, R Su, R Leach Optics express 25 (16), 18703-18712, 2017 | 38 | 2017 |
Optical coherence tomography for quality assessment of embedded microchannels in alumina ceramic R Su, M Kirillin, P Ekberg, A Roos, E Sergeeva, L Mattsson Optics express 20 (4), 4603-4618, 2012 | 37 | 2012 |
Optical measurement of surface topographies with transparent coatings X Feng, N Senin, R Su, S Ramasamy, R Leach Optics and Lasers in Engineering 121, 261-270, 2019 | 34 | 2019 |
Residual flatness and scale calibration for a point autofocus surface topography measuring instrument G Maculotti, X Feng, R Su, M Galetto, RK Leach Measurement Science and Technology 30, 075005, 2019 | 34 | 2019 |
Contributions of holography to the advancement of interferometric measurements of surface topography PJ De Groot, LL Deck, R Su, W Osten Light Adv. Manuf 3 (1), 2022 | 25 | 2022 |
Does interferometry work? A critical look at the foundations of interferometric surface topography measurement P de Groot, XC de Lega, R Su, R Leach Applied Optical Metrology III 11102, 111020G, 2019 | 25 | 2019 |
Fast and cost-effective in-process defect inspection for printed electronics based on coherent optical processing X Feng, R Su, T Happonen, J Liu, R Leach Optics express 26 (11), 13927-13937, 2018 | 25 | 2018 |