Recent progress in electrochemical pH-sensing materials and configurations for biomedical applications MT Ghoneim, A Nguyen, N Dereje, J Huang, GC Moore, PJ Murzynowski, ... Chemical reviews 119 (8), 5248-5297, 2019 | 220 | 2019 |
Review on physically flexible nonvolatile memory for internet of everything electronics MT Ghoneim, MM Hussain Electronics 4 (3), 424-479, 2015 | 158 | 2015 |
Flexible Electronics: Thin PZT-Based Ferroelectric Capacitors on Flexible Silicon for Nonvolatile Memory Applications (Adv. Electron. Mater. 6/2015) MT Ghoneim, MA Zidan, MY Alnassar, AN Hanna, J Kosel, KN Salama, ... Advanced Electronic Materials 1 (6), 1500045, 2015 | 121 | 2015 |
Transformational silicon electronics JP Rojas, GA Torres Sevilla, MT Ghoneim, SB Inayat, SM Ahmed, ... ACS nano 8 (2), 1468-1474, 2014 | 112 | 2014 |
Flexible nanoscale high-performance FinFETs GA Torres Sevilla*, MT Ghoneim*, H Fahad*, JP Rojas, AM Hussain, ... ACS nano 8 (10), 9850-9856, 2014 | 91 | 2014 |
Flexible and biocompatible high-performance solid-state micro-battery for implantable orthodontic system AT Kutbee, RR Bahabry, KO Alamoudi, MT Ghoneim, MD Cordero, ... npj flexible electronics 1 (1), 7, 2017 | 76 | 2017 |
Study of harsh environment operation of flexible ferroelectric memory integrated with PZT and silicon fabric MT Ghoneim, MM Hussain Applied Physics Letters 107 (5), 2015 | 50 | 2015 |
Simplistic graphene transfer process and its impact on contact resistance MT Ghoneim, CE Smith, MM Hussain Applied Physics Letters 102 (18), 2013 | 45 | 2013 |
Corrugation architecture enabled ultraflexible wafer‐scale high‐efficiency monocrystalline silicon solar cell RR Bahabry, AT Kutbee, SM Khan, AC Sepulveda, I Wicaksono, M Nour, ... Advanced Energy Materials 8 (12), 1702221, 2018 | 43 | 2018 |
Nonplanar Nanoscale Fin Field Effect Transistors on Textile, Paper, Wood, Stone, and Vinyl via Soft Material-Enabled Double-Transfer Printing JP Rojas, GA Torres Sevilla, N Alfaraj, MT Ghoneim, AT Kutbee, ... ACS nano 9 (5), 5255-5263, 2015 | 39 | 2015 |
Mechanical anomaly impact on metal-oxide-semiconductor capacitors on flexible silicon fabric MT Ghoneim, A Kutbee, F Ghodsi Nasseri, G Bersuker, MM Hussain Applied Physics Letters 104 (23), 2014 | 39 | 2014 |
Flexible High-k/Metal Gate Metal/Insulator/Metal Capacitors on Silicon (100) Fabric JP Rojas*, MT Ghoneim*, CD Young, ... IEEE Transactions on Electron Devices 60 (10), 3305-3309, 2013 | 37 | 2013 |
Free-form Flexible Lithium-Ion Microbattery A Kutbee, M Ghoneim, S Ahmed, M Hussain IEEE Transactions on Nanotechnology 15 (3), 402 - 408, 2016 | 34 | 2016 |
Freeform compliant CMOS electronic systems for internet of everything applications SF Shaikh, MT Ghoneim, GAT Sevilla, JM Nassar, AM Hussain, ... IEEE Transactions on Electron Devices 64 (5), 1894-1905, 2017 | 33 | 2017 |
Functional integrity of flexible n-channel metal–oxide–semiconductor field-effect transistors on a reversibly bistable platform N Alfaraj, AM Hussain, GA Torres Sevilla, MT Ghoneim, JP Rojas, ... Applied Physics Letters 107 (17), 2015 | 33 | 2015 |
Expandable Polymer Enabled Wirelessly Destructible High‐Performance Solid State Electronics A Gumus, A Alam, AM Hussain, K Mishra, I Wicaksono, GA Torres Sevilla, ... Advanced Materials Technologies 2 (5), 1600264, 2017 | 27 | 2017 |
Towards neuromorphic electronics: Memristors on foldable silicon fabric MT Ghoneim, MA Zidan, KN Salama, MM Hussain Microelectronics Journal 45 (11), 1392-1395, 2014 | 27 | 2014 |
Highly manufacturable deep (sub-millimeter) etching enabled high aspect ratio complex geometry lego-like silicon electronics MT Ghoneim, MM Hussain Wiley, 2017 | 24 | 2017 |
Out-of-Plane Strain Effects on Physically Flexible FinFET CMOS MT Ghoneim, N Alfaraj, GA Torres-Sevilla, HM Fahad, MM Hussain IEEE Transactions on Electron Devices 63 (7), 2657 - 2664, 2016 | 24 | 2016 |
Electrical Analysis of High Dielectric Constant Insulator and Metal Gate Metal Oxide Semiconductor Capacitors on Flexible Bulk Mono-Crystalline Silicon MT Ghoneim, JP Rojas, CD Young, G Bersuker, MM Hussain IEEE Transactions on Reliability 64 (2), 579 - 585, 2014 | 23 | 2014 |