关注
Fangzhou Wang
标题
引用次数
引用次数
年份
Automatic Test Pattern Generation for timing verification and delay testing of RSFQ circuits
F Wang, S Gupta
2019 IEEE 37th VLSI Test Symposium (VTS), 1-6, 2019
142019
An effective and efficient automatic test pattern generation (ATPG) paradigm for certifying performance of RSFQ circuits
F Wang, SK Gupta
IEEE Transactions on Applied Superconductivity 30 (5), 1-11, 2020
122020
Timing Verification for Rapid Single-Flux-Quantum (RSFQ) Logic: New Paradigm and Models
F Wang, S Gupta
2019 IEEE International Superconductive Electronics Conference (ISEC), 1-3, 2019
112019
A Statistical Static Timing Analysis Tool for Superconducting Single-Flux-Quantum Circuits
B Zhang, F Wang, S Gupta, M Pedram
2019 IEEE International Superconductive Electronics Conference (ISEC), 1-5, 2019
82019
Methods for testing path delay and static faults in RSFQ circuits
M Li, F Wang, S Gupta
2022 IEEE 40th VLSI Test Symposium (VTS), 1-7, 2022
72022
Data-driven fault model development for superconducting logic
M Li, F Wang, S Gupta
2020 IEEE International Test Conference (ITC), 1-5, 2020
72020
Static timing analysis (sta) with timing bleed: Certifying much higher performance for rapid single flux quantum (rsfq) logic
F Wang, B Zhang, M Pedram, S Gupta
Journal of Physics: Conference Series 1559 (1), 012003, 2020
52020
Optimal redundancy designs for cnfet-based circuits
D Cheng, F Wang, F Gao, SK Gupta
2014 IEEE 23rd Asian Test Symposium, 25-32, 2014
52014
Multi-cell characterization: Developing robust cells and abstraction for Rapid Single Flux Quantum (RSFQ) Logic
F Wang, S Gupta
2019 IEEE International Test Conference (ITC), 1-10, 2019
42019
Automated Analog Mixed Signal IP Generatorfor CMOS Technologies
M Hassanpourghadi, Q Zhang, P Sharma, J Nam, S Su, S Chowdhury, ...
University of Southern California Los Angeles United States, 2019
32019
A heuristic logical effort approach for gate sizing for CNTFET-based circuits
FW Da Cheng, F Gao, SK Gupta
32014
Verification and Testing of Rapid Single-Flux-Quantum (RSFQ) Circuit for Certifying Logical Correctness and Performance
F Wang
University of Southern California, 2020
2020
Computer Engineering Technical Report Number CENG-2016-03
F Wang, SK Gupta
2016
系统目前无法执行此操作,请稍后再试。
文章 1–13