| Dynamic switch migration in distributed software-defined networks to achieve controller load balance Y Xu, M Cello, IC Wang, A Walid, G Wilfong, CHP Wen, M Marchese, ... IEEE Journal on Selected Areas in Communications 37 (3), 515-529, 2019 | 116 | 2019 |
| EQVMP: Energy-efficient and QoS-aware virtual machine placement for software defined datacenter networks SH Wang, PPW Huang, CHP Wen, LC Wang The International Conference on Information Networking 2014 (ICOIN2014), 220-225, 2014 | 100 | 2014 |
| Simulation-Based Functional Test Generation for Embedded Processors CHP Wen, LC Wang, KT Cheng Tenth Annual IEEE International High-Level Design Validation and Test …, 2005 | 65 | 2005 |
| CASSER: A closed-form analysis framework for statistical soft error rate ACC Chang, RHM Huang, CHP Wen IEEE Transactions on Very Large Scale Integration (VLSI) Systems 21 (10 …, 2012 | 40 | 2012 |
| On a software-based self-test methodology and its application CHP Wen, LC Wang, KT Cheng, K Yang, WT Liu, JJ Chen 23rd IEEE VLSI Test Symposium (VTS'05), 107-113, 2005 | 39 | 2005 |
| FallCare+: An IoT surveillance system for fall detection CCH Hsu, MYC Wang, HCH Shen, RHC Chiang, CHP Wen 2017 International conference on applied system innovation (ICASI), 921-922, 2017 | 38 | 2017 |
| Accurate statistical soft error rate (SSER) analysis using a quasi-Monte Carlo framework with quality cell models YH Kuo, HK Peng, CHP Wen 2010 11th International Symposium on Quality Electronic Design (ISQED), 831-838, 2010 | 38 | 2010 |
| On soft error rate analysis of scaled CMOS designs: a statistical perspective HK Peng, CHP Wen, J Bhadra Proceedings of the 2009 International Conference on Computer-Aided Design …, 2009 | 38 | 2009 |
| Layout-based soft error rate estimation framework considering multiple transient faults—From device to circuit level HM Huang, CHP Wen IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 33 | 2015 |
| An online thermal-constrained task scheduler for 3D multi-core processors CH Liao, CHP Wen, K Chakrabarty 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 351-356, 2015 | 25 | 2015 |
| Fast-yet-accurate statistical soft-error-rate analysis considering full-spectrum charge collection HM Huang, CHP Wen IEEE Design & Test 30 (2), 77-86, 2013 | 24 | 2013 |
| DAD-FF: Hardening designs by delay-adjustable D-flip-flop for soft-error-rate reduction DYW Lin, CHP Wen IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (4 …, 2020 | 22 | 2020 |
| Flow-and-VM migration for optimizing throughput and energy in SDN-based cloud datacenter WC Lin, CH Liao, KT Kuo, CHP Wen 2013 IEEE 5th International Conference on Cloud Computing Technology and …, 2013 | 22 | 2013 |
| Aging-aware statistical soft-error-rate analysis for nano-scaled CMOS designs CYH Lin, RHM Huang, CHP Wen, ACC Chang 2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT), 1-4, 2013 | 21 | 2013 |
| Deploying QoS-assured service function chains with stochastic prediction models on VNF latency TH Lei, YT Hsu, IC Wang, CHP Wen 2017 IEEE Conference on Network Function Virtualization and Software Defined …, 2017 | 19 | 2017 |
| Advanced soft-error-rate (ser) estimation with striking-time and multi-cycle effects RHM Huang, CHP Wen Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014 | 17 | 2014 |
| Simulation-based target test generation techniques for improving the robustness of a software-based-self-test methodology CHP Wen, LC Wang, KT Cheng, WT Liu, JJ Chen IEEE International Conference on Test, 2005., 10 pp.-945, 2005 | 17 | 2005 |
| Roadrunner+: An autonomous intersection management cooperating with connected autonomous vehicles and pedestrians with spillback considered MIC Wang, CHP Wen, HJ Chao ACM Transactions on Cyber-Physical Systems (TCPS) 6 (1), 1-29, 2021 | 14 | 2021 |
| In-network congestion-aware load balancing at transport layer A Aghdai, MIC Wang, Y Xu, CHP Wen, HJ Chao 2019 IEEE Conference on Network Function Virtualization and Software Defined …, 2019 | 14 | 2019 |
| TASSER: A temperature-aware statistical soft-error-rate analysis framework for combinational circuits SSY Hsueh, RHM Huang, CHP Wen Fifteenth International Symposium on Quality Electronic Design, 529-534, 2014 | 14 | 2014 |
Li-C. WangUniversity of California, Santa Barbara在 ece.ucsb.edu 的电子邮件经过验证
